JPS64451A - Method and instrument for optical measurement with automatic analysis device - Google Patents

Method and instrument for optical measurement with automatic analysis device

Info

Publication number
JPS64451A
JPS64451A JP62323774A JP32377487A JPS64451A JP S64451 A JPS64451 A JP S64451A JP 62323774 A JP62323774 A JP 62323774A JP 32377487 A JP32377487 A JP 32377487A JP S64451 A JPS64451 A JP S64451A
Authority
JP
Japan
Prior art keywords
light
reaction tube
photodetector
grating
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62323774A
Other languages
English (en)
Other versions
JPH01451A (ja
Inventor
Koichi Wakatake
Hidehiko Fujioka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nittec KK
Original Assignee
Nittec KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nittec KK filed Critical Nittec KK
Priority to JP62323774A priority Critical patent/JPS64451A/ja
Priority to CN88100938A priority patent/CN1016281B/zh
Priority to PCT/JP1988/000161 priority patent/WO1988006286A1/ja
Priority to AU12977/88A priority patent/AU605840B2/en
Priority to EP19880901914 priority patent/EP0303707A4/en
Priority to KR1019880701102A priority patent/KR890700820A/ko
Priority to FI884609A priority patent/FI884609A0/fi
Priority to NO884537A priority patent/NO884537D0/no
Priority to DK581188A priority patent/DK581188D0/da
Publication of JPH01451A publication Critical patent/JPH01451A/ja
Publication of JPS64451A publication Critical patent/JPS64451A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/251—Colorimeters; Construction thereof
    • G01N21/253—Colorimeters; Construction thereof for batch operation, i.e. multisample apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/025—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N2021/3129—Determining multicomponents by multiwavelength light
    • G01N2021/3133—Determining multicomponents by multiwavelength light with selection of wavelengths before the sample
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0439—Rotary sample carriers, i.e. carousels
    • G01N2035/0444—Rotary sample carriers, i.e. carousels for cuvettes or reaction vessels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/04—Batch operation; multisample devices
    • G01N2201/0415—Carrusel, sequential

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP62323774A 1987-02-20 1987-12-23 Method and instrument for optical measurement with automatic analysis device Pending JPS64451A (en)

Priority Applications (9)

Application Number Priority Date Filing Date Title
JP62323774A JPS64451A (en) 1987-02-20 1987-12-23 Method and instrument for optical measurement with automatic analysis device
CN88100938A CN1016281B (zh) 1987-02-20 1988-02-15 在自动分析装置上进行的光学测定法及其装置
PCT/JP1988/000161 WO1988006286A1 (fr) 1987-02-20 1988-02-17 Procede de mesure optique et dispositif utilise a cet effet dans un analyseur automatique
AU12977/88A AU605840B2 (en) 1987-02-20 1988-02-17 Optical measurement method and apparatus therefor in automatic analyzer
EP19880901914 EP0303707A4 (en) 1987-02-20 1988-02-17 Optical measurement method and apparatus therefor in automatic analyzer.
KR1019880701102A KR890700820A (ko) 1987-02-20 1988-09-12 자동분석장치에 있어서의 광학측정방법 및 그 장치
FI884609A FI884609A0 (fi) 1987-02-20 1988-10-07 Foerfarande och anordning foer att utfoera en optisk maetning i en automatisk analysapparat.
NO884537A NO884537D0 (no) 1987-02-20 1988-10-12 Fremgangsmaate og anordning for optisk maaling i automatisk analyseapparat.
DK581188A DK581188D0 (da) 1987-02-20 1988-10-19 Fremgangsmaade og apparatur til optisk maaling i automatisk analyseapparatur

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP3587787 1987-02-20
JP62-35877 1987-02-20
JP62323774A JPS64451A (en) 1987-02-20 1987-12-23 Method and instrument for optical measurement with automatic analysis device

Publications (2)

Publication Number Publication Date
JPH01451A JPH01451A (ja) 1989-01-05
JPS64451A true JPS64451A (en) 1989-01-05

Family

ID=26374883

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62323774A Pending JPS64451A (en) 1987-02-20 1987-12-23 Method and instrument for optical measurement with automatic analysis device

Country Status (7)

Country Link
EP (1) EP0303707A4 (ja)
JP (1) JPS64451A (ja)
KR (1) KR890700820A (ja)
CN (1) CN1016281B (ja)
AU (1) AU605840B2 (ja)
FI (1) FI884609A0 (ja)
WO (1) WO1988006286A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006125953A (ja) * 2004-10-28 2006-05-18 Jeol Ltd 生化学自動分析装置
WO2014119435A1 (ja) * 2013-01-31 2014-08-07 株式会社 日立ハイテクノロジーズ 自動分析装置
JP2019527359A (ja) * 2016-07-21 2019-09-26 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレーテッドＳｉｅｍｅｎｓ Ｈｅａｌｔｈｃａｒｅ Ｄｉａｇｎｏｓｔｉｃｓ Ｉｎｃ． キュベット間の基準測定値を用いた電源ランプの強度ドリフト効果の除去

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01145552A (ja) * 1987-12-02 1989-06-07 Olympus Optical Co Ltd 自動分析装置
US5116122A (en) * 1991-03-14 1992-05-26 Shimadzu Corporation Spectrophotometer
US5345395A (en) * 1991-10-31 1994-09-06 Baxter Diagnostics Inc. Specimen processing and analyzing systems and methods using photometry
AUPN825796A0 (en) * 1996-02-26 1996-03-14 Ashdown, Martin The application of infrared (ir) spectrometry to the investigations of components of blood and other body fluids
JP4598682B2 (ja) * 2006-01-23 2010-12-15 株式会社日立ハイテクノロジーズ 自動分析装置
JP5134862B2 (ja) * 2007-05-16 2013-01-30 株式会社日立ハイテクノロジーズ 分析装置
JP5743558B2 (ja) 2011-01-12 2015-07-01 株式会社東芝 分析装置
JP6276087B2 (ja) * 2014-03-28 2018-02-07 シスメックス株式会社 検体分析装置及び検体分析方法
JP6312313B2 (ja) * 2014-04-17 2018-04-18 日本電子株式会社 自動分析装置及び自動分析方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5630650A (en) * 1979-08-22 1981-03-27 Hitachi Ltd Automatic chemical analyzer
JPS5772047A (en) * 1980-10-24 1982-05-06 Olympus Optical Co Ltd Component analyzing method
JPS60142234A (ja) * 1983-12-28 1985-07-27 Shimadzu Corp 自動分析装置
JPS6166950A (ja) * 1984-09-11 1986-04-05 Nippon Tectron Co Ltd 血液自動分析装置のデ−タ処理装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1648841A1 (de) * 1967-10-18 1971-07-22 Bodenseewerk Perkin Elmer Co Einstrahl-Photometer
US3609047A (en) * 1970-03-02 1971-09-28 Xerox Corp Single beam photometer system wherein the absorbance of a sample is determined relative to a reference
DE2408646A1 (de) * 1974-02-22 1975-08-28 Max Planck Gesellschaft Reaktionskinetisches messgeraet
FR2470962A1 (fr) * 1979-11-30 1981-06-12 Instruments Sa Dispositif de mesure optique d'un parametre relatif a des echantillons de substances sous forme liquide et procede de mesure correspondant
JPH0518090A (ja) * 1991-07-10 1993-01-26 Asahi Chem Ind Co Ltd 薄石複合パネル構造体
JP2957797B2 (ja) * 1992-03-18 1999-10-06 三洋電機株式会社 光記録媒体の多重記録方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5630650A (en) * 1979-08-22 1981-03-27 Hitachi Ltd Automatic chemical analyzer
JPS5772047A (en) * 1980-10-24 1982-05-06 Olympus Optical Co Ltd Component analyzing method
JPS60142234A (ja) * 1983-12-28 1985-07-27 Shimadzu Corp 自動分析装置
JPS6166950A (ja) * 1984-09-11 1986-04-05 Nippon Tectron Co Ltd 血液自動分析装置のデ−タ処理装置

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006125953A (ja) * 2004-10-28 2006-05-18 Jeol Ltd 生化学自動分析装置
WO2014119435A1 (ja) * 2013-01-31 2014-08-07 株式会社 日立ハイテクノロジーズ 自動分析装置
JP2014149155A (ja) * 2013-01-31 2014-08-21 Hitachi High-Technologies Corp 自動分析装置
US9575083B2 (en) 2013-01-31 2017-02-21 Hitachi High-Technologies Corporation Automatic analysis apparatus
JP2019527359A (ja) * 2016-07-21 2019-09-26 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレーテッドＳｉｅｍｅｎｓ Ｈｅａｌｔｈｃａｒｅ Ｄｉａｇｎｏｓｔｉｃｓ Ｉｎｃ． キュベット間の基準測定値を用いた電源ランプの強度ドリフト効果の除去
US11226346B2 (en) 2016-07-21 2022-01-18 Siemens Healthcare Diagnostics Inc. Eliminating source lamp intensity drift effect using reference measurement between cuvettes

Also Published As

Publication number Publication date
EP0303707A1 (en) 1989-02-22
FI884609A7 (fi) 1988-10-07
EP0303707A4 (en) 1990-05-14
CN1016281B (zh) 1992-04-15
KR890700820A (ko) 1989-04-27
CN88100938A (zh) 1988-09-14
AU605840B2 (en) 1991-01-24
WO1988006286A1 (fr) 1988-08-25
FI884609A0 (fi) 1988-10-07
AU1297788A (en) 1988-09-14

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