JPS6445841U - - Google Patents

Info

Publication number
JPS6445841U
JPS6445841U JP1987139388U JP13938887U JPS6445841U JP S6445841 U JPS6445841 U JP S6445841U JP 1987139388 U JP1987139388 U JP 1987139388U JP 13938887 U JP13938887 U JP 13938887U JP S6445841 U JPS6445841 U JP S6445841U
Authority
JP
Japan
Prior art keywords
mask pattern
pattern surface
photomask
hole penetrating
groove
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1987139388U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987139388U priority Critical patent/JPS6445841U/ja
Publication of JPS6445841U publication Critical patent/JPS6445841U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案に係るフオトマスクの平面図、
第2図は第1図をA―A線に沿つて切断した図、
第3図は本考案に係るフオトマスクを利用するコ
ンタクト露光時の半導体ウエーハの密着露光工程
を示す断面図、第4図は本考案に係るフオトマス
クの他の実施例を示す断面図、第5図は従来のフ
オトマスクの平面図、第6図a〜cは従来の工程
を示す断面図である。 1:マスクパターン面、3:溝、4:フオトマ
スク、8:貫通孔。
FIG. 1 is a plan view of a photomask according to the present invention;
Figure 2 is a diagram of Figure 1 cut along line A-A.
FIG. 3 is a cross-sectional view showing the contact exposure process of a semiconductor wafer during contact exposure using the photomask according to the present invention, FIG. 4 is a cross-sectional view showing another embodiment of the photomask according to the present invention, and FIG. A plan view of a conventional photomask, and FIGS. 6a to 6c are cross-sectional views showing the conventional process. 1: mask pattern surface, 3: groove, 4: photomask, 8: through hole.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] ほぼ板状に形成するフオトマスクのマスクパタ
ーン面から内部に向け形成する溝、このマスクパ
ターン面から相対向する他面にかけて貫通する孔
部ならびにこの溝底部から前記他面を貫通する孔
からなる郡から選定する一種以上を前記マスクパ
ターン面に単数以上設置することを特徴とするフ
オトマスク。
A group consisting of a groove formed inward from the mask pattern surface of a photomask formed in a substantially plate shape, a hole penetrating from the mask pattern surface to the other opposing surface, and a hole penetrating the other surface from the groove bottom. A photomask characterized in that one or more selected types are placed on the mask pattern surface.
JP1987139388U 1987-09-14 1987-09-14 Pending JPS6445841U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987139388U JPS6445841U (en) 1987-09-14 1987-09-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987139388U JPS6445841U (en) 1987-09-14 1987-09-14

Publications (1)

Publication Number Publication Date
JPS6445841U true JPS6445841U (en) 1989-03-20

Family

ID=31402599

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987139388U Pending JPS6445841U (en) 1987-09-14 1987-09-14

Country Status (1)

Country Link
JP (1) JPS6445841U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003110389A (en) * 2001-09-28 2003-04-11 Kinseki Ltd Photo mask

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003110389A (en) * 2001-09-28 2003-04-11 Kinseki Ltd Photo mask

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