JPS6453976U - - Google Patents

Info

Publication number
JPS6453976U
JPS6453976U JP14832987U JP14832987U JPS6453976U JP S6453976 U JPS6453976 U JP S6453976U JP 14832987 U JP14832987 U JP 14832987U JP 14832987 U JP14832987 U JP 14832987U JP S6453976 U JPS6453976 U JP S6453976U
Authority
JP
Japan
Prior art keywords
lead
sop
shoot rail
movable
rail
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14832987U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14832987U priority Critical patent/JPS6453976U/ja
Publication of JPS6453976U publication Critical patent/JPS6453976U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案に係るIC測定部のプレス装置
の一実施例を示し、模式的に描いた水平断面図で
ある。第2図はSOP形ICの斜視図である。第
3図及び第4図は従来例のIC測定部プレス装置
を示し、第3図は図の左右方向に分解して描いた
模式的な側面図、第4図は模式的な水平断面図で
ある。第5図は上記従来例のリード押えの斜視図
、第6図は上記従来例の不具合の説明図である。 1,1′…SOP形IC、1a…パツケージ、
1b…リード、2…シユートレール、3…ルーフ
、4…スプリング、5…可動シユートレール、6
…可動ルーフ、7…従来例のリード押え、8…I
Cソケツト、8a…コンタクタ、10…ガイドル
ーフ、11…プツシヤ板、11a…本考案に係る
リード押え。
FIG. 1 is a schematic horizontal cross-sectional view showing an embodiment of a press device for an IC measuring section according to the present invention. FIG. 2 is a perspective view of the SOP type IC. Figures 3 and 4 show a conventional IC measuring unit press device. Figure 3 is a schematic side view taken apart in the horizontal direction of the figure, and Figure 4 is a schematic horizontal sectional view. be. FIG. 5 is a perspective view of the lead presser of the conventional example, and FIG. 6 is an explanatory diagram of the problems of the conventional example. 1, 1'...SOP type IC, 1a...Package,
1b...Lead, 2...Shoot rail, 3...Roof, 4...Spring, 5...Movable shoot rail, 6
...Movable roof, 7...Conventional lead presser, 8...I
C socket, 8a... contactor, 10... guide roof, 11... pusher plate, 11a... lead presser according to the present invention.

Claims (1)

【実用新案登録請求の範囲】 1 ICハンドラに設けられているシユートレー
ルの一部分を分割すると共に、該分割部分のシユ
ートレールを移動可能に、弾性的に支承し、該弾
性的に支承された可動シユートレールに対向せし
めて停止させたSOP形ICのリードに当接する
リード押えを構成すると共に、該リード押えを駆
動する手段を設け、上記リード押えによつて前記
リードを押動してICソケツトのコンタクタに向
けて押圧、導通せしめるプレス装置において、 (a) 前記可動シユートレールに対向、離間せ
しめて、これと平行に配設したガイドルーフを設
け、 (b) 上記可動シユートレールとガイドルーフ
との間に、SOP形ICのパツケージを摺動可能
に挟んでこれを案内する構造とし、 (c) 上記可動シユートレールとガイドルーフ
とに案内されて摺動するSOP形ICを、上記可
動シユートレールに正対する位置に停止させるス
トツパ手段を設け、かつ、 (d) 上記SOP形ICが可動シユートレール
とガイドルーフとに案内されて摺動しているとき
、該SOP形ICのリードに対向・離間して保持
される1対のリード押えを構成し、 (e) 上記SOP形ICが前記のストツパによ
つて停止したとき、前記1対のリード押えを該S
OP形ICのリードに向けて押圧、押動して、該
リードをICソケツトのコンタクタに当接せしめ
、押圧、導通せしめる構造としたこと、 を特徴とする、ICハンドラ用IC測定部のプ
レス装置。 2 前記のリード押えは、セラミツク材料によつ
て構成したものであることを特徴とする実用新案
登録請求の範囲第1項に記載したIC測定部のプ
レス装置。
[Claims for Utility Model Registration] 1. Part of the shoot rail provided in the IC handler is divided, and the split portion of the shoot rail is movably and elastically supported, and the elastically supported movable shoot rail is A lead holder is provided which contacts the leads of the SOP type IC which are opposed and stopped, and a means for driving the lead holder is provided, and the lead is pushed by the lead holder and directed toward the contactor of the IC socket. (a) A guide roof is provided facing and spaced from and parallel to the movable shoot rail, and (b) an SOP type plate is provided between the movable shoot rail and the guide roof. (c) A stopper that stops the SOP type IC, which slides while being guided by the movable shoot rail and the guide roof, at a position directly facing the movable shoot rail. and (d) a pair of leads that are held opposite and separated from the leads of the SOP IC when the SOP IC is sliding guided by the movable shoot rail and the guide roof. (e) When the SOP type IC is stopped by the stopper, the pair of lead pressers are connected to the SOP type IC.
A press device for an IC measuring section for an IC handler, characterized by having a structure that presses and moves toward a lead of an OP type IC, brings the lead into contact with a contactor of an IC socket, and presses and conducts the lead. . 2. The press device for an IC measurement unit as set forth in claim 1, wherein the lead presser is made of ceramic material.
JP14832987U 1987-09-30 1987-09-30 Pending JPS6453976U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14832987U JPS6453976U (en) 1987-09-30 1987-09-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14832987U JPS6453976U (en) 1987-09-30 1987-09-30

Publications (1)

Publication Number Publication Date
JPS6453976U true JPS6453976U (en) 1989-04-03

Family

ID=31419549

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14832987U Pending JPS6453976U (en) 1987-09-30 1987-09-30

Country Status (1)

Country Link
JP (1) JPS6453976U (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52116178A (en) * 1976-03-26 1977-09-29 Kokusai Electric Co Ltd Device for detachably attaching ic element to measuring socket
JPS6034031A (en) * 1983-08-05 1985-02-21 Tokyo Seimitsu Co Ltd Device for measuring semiconductor element

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52116178A (en) * 1976-03-26 1977-09-29 Kokusai Electric Co Ltd Device for detachably attaching ic element to measuring socket
JPS6034031A (en) * 1983-08-05 1985-02-21 Tokyo Seimitsu Co Ltd Device for measuring semiconductor element

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