JPS6460899A - Random access memory - Google Patents

Random access memory

Info

Publication number
JPS6460899A
JPS6460899A JP62218884A JP21888487A JPS6460899A JP S6460899 A JPS6460899 A JP S6460899A JP 62218884 A JP62218884 A JP 62218884A JP 21888487 A JP21888487 A JP 21888487A JP S6460899 A JPS6460899 A JP S6460899A
Authority
JP
Japan
Prior art keywords
error
address
correction
hardware error
coincidence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62218884A
Other languages
Japanese (ja)
Inventor
Kazutami Arimoto
Shigeru Mori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP62218884A priority Critical patent/JPS6460899A/en
Publication of JPS6460899A publication Critical patent/JPS6460899A/en
Pending legal-status Critical Current

Links

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)

Abstract

PURPOSE:To realize selection where only a product in which no hardware error exists is designated as a qualified product, by holding a defective bit address on which error correction is applied by an on-chip ECC (error checking and correction) function, and outputting a signal to instruct the detection of the hardware error when two or more held address coincide with each other. CONSTITUTION:The address of a memory cell 1 on which the correction of data is applied by the on-chip ECC function of an error detecting and correcting means 8 corresponding to an access operation is held by an address holding means 10 sequentially, and those two or more addresses are compared at a coincidence detecting means 13. And when coincidence is obtained between them, namely, when correction is applied on the data in the same memory cell successively, the defective bit of the address is set as the hardware error, and a coincidence detecting signal as a hardware error detecting signal is generated from the coincidence detecting means 13. In such a way, it is possible to confirm the generation of the hardware error from the outside of a device, and to select the product in which no hardware error is generated.
JP62218884A 1987-08-31 1987-08-31 Random access memory Pending JPS6460899A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62218884A JPS6460899A (en) 1987-08-31 1987-08-31 Random access memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62218884A JPS6460899A (en) 1987-08-31 1987-08-31 Random access memory

Publications (1)

Publication Number Publication Date
JPS6460899A true JPS6460899A (en) 1989-03-07

Family

ID=16726818

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62218884A Pending JPS6460899A (en) 1987-08-31 1987-08-31 Random access memory

Country Status (1)

Country Link
JP (1) JPS6460899A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007052884A (en) * 2005-08-19 2007-03-01 Nec Corp Semiconductor storage device
US7851100B2 (en) 2004-10-08 2010-12-14 Panasonic Corporation MEA-gasket assembly and polymer electrolyte fuel cell using same
JP2022146497A (en) * 2021-03-22 2022-10-05 株式会社東芝 Redundant storage device and method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7851100B2 (en) 2004-10-08 2010-12-14 Panasonic Corporation MEA-gasket assembly and polymer electrolyte fuel cell using same
JP2007052884A (en) * 2005-08-19 2007-03-01 Nec Corp Semiconductor storage device
JP2022146497A (en) * 2021-03-22 2022-10-05 株式会社東芝 Redundant storage device and method

Similar Documents

Publication Publication Date Title
JPS5637896A (en) Error correction system
EP0185924A3 (en) Buffer system with detection of read or write circuits' failures
EP0195445A3 (en) Semiconductor memory device with an error correction function
ES2036223T3 (en) MEMORIES AND THE VERIFICATION OF THE SAME.
US4884270A (en) Easily cascadable and testable cache memory
US5369650A (en) Error detection and correction apparatus in a BY-4 RAM Device
TR23714A (en) MEASURES SUITABLE FOR THIS WASHING AND / OR RINSE OF TEXTILE MATERIALS
FR2613094A1 (en) MEMORY REMAPPING IN A MICROCOMPUTER SYSTEM
JPS5698781A (en) Semiconductor memory device
EP0100825A3 (en) True single error correction and multiple error detection system
JPS5792498A (en) Error detecting circuit of read-only memory system
JPH01194035A (en) Address parity checking system for information processor
JPS62146500A (en) Read-only memory
JPS6454557A (en) Address parity checking circuit
JPS5798197A (en) Multiplexing memory device
GB2125590B (en) Data storage with error detection
JPS5448448A (en) Inspection system of memory error
JPS58196694A (en) Storage device
SU1262576A1 (en) Storage with self-check
JPH0561777A (en) Memory control circuit
JPS5654696A (en) Memory device
JPS5727342A (en) Error checking system for error detecting correcting circuit
JPS56148798A (en) Error detection system
JPS5736500A (en) Memory check system
JPS57109198A (en) Error processing system