JPS646711A - Detection of thickness irregularity across width of film or sheet - Google Patents
Detection of thickness irregularity across width of film or sheetInfo
- Publication number
- JPS646711A JPS646711A JP16198087A JP16198087A JPS646711A JP S646711 A JPS646711 A JP S646711A JP 16198087 A JP16198087 A JP 16198087A JP 16198087 A JP16198087 A JP 16198087A JP S646711 A JPS646711 A JP S646711A
- Authority
- JP
- Japan
- Prior art keywords
- width
- film
- tolerance
- detected
- mean
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 title 1
- 230000007547 defect Effects 0.000 abstract 2
- 230000005856 abnormality Effects 0.000 abstract 1
- 230000001186 cumulative effect Effects 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 230000000087 stabilizing effect Effects 0.000 abstract 1
- 238000004804 winding Methods 0.000 abstract 1
Landscapes
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
PURPOSE:To detect a position of thickness defect, by a method wherein a sensor is moved across the width of a roll film to measure the diameter of a roll with each fine movement thereof and moving position thereof is detected to compute a mean of accumulated widthwise thicknesses and a tolerance from both measured values. CONSTITUTION:A sensor 2 such as laser measuring device is moved across the width of a roll film 1 being wound or already wound up to measure a winding diameter thereof with each fine movement thereof. A measuring position is detected with an electric scale 3 such as encoder. Information obtained is inputted into a calculator 6 via controllers 4 and 5. A mean of accumulated thicknesses across the width of the film and a tolerance (or a reference allowable difference) are computed from both measured values to make a cumulative thickness profile and a thickness defect position exceeding the tolerance is detected. This enables quick handling of abnormality in quality, thereby stabilizing the quantity.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16198087A JPS646711A (en) | 1987-06-29 | 1987-06-29 | Detection of thickness irregularity across width of film or sheet |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16198087A JPS646711A (en) | 1987-06-29 | 1987-06-29 | Detection of thickness irregularity across width of film or sheet |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS646711A true JPS646711A (en) | 1989-01-11 |
Family
ID=15745737
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16198087A Pending JPS646711A (en) | 1987-06-29 | 1987-06-29 | Detection of thickness irregularity across width of film or sheet |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS646711A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7008691B2 (en) | 1999-09-28 | 2006-03-07 | L&P Property Management Company | Convoluted multi-layer pad and process |
| CN120740461A (en) * | 2025-08-15 | 2025-10-03 | 连云港市金田高新材料有限公司 | High-performance film material on-line thickness gauge |
-
1987
- 1987-06-29 JP JP16198087A patent/JPS646711A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7008691B2 (en) | 1999-09-28 | 2006-03-07 | L&P Property Management Company | Convoluted multi-layer pad and process |
| CN120740461A (en) * | 2025-08-15 | 2025-10-03 | 连云港市金田高新材料有限公司 | High-performance film material on-line thickness gauge |
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