JPS646842A - Detecting device - Google Patents

Detecting device

Info

Publication number
JPS646842A
JPS646842A JP62162978A JP16297887A JPS646842A JP S646842 A JPS646842 A JP S646842A JP 62162978 A JP62162978 A JP 62162978A JP 16297887 A JP16297887 A JP 16297887A JP S646842 A JPS646842 A JP S646842A
Authority
JP
Japan
Prior art keywords
incident light
incident
light
optical path
photoconductive medium
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62162978A
Other languages
Japanese (ja)
Inventor
Hiroyuki Horiguchi
Yasuo Katano
Toshiyuki Furuta
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP62162978A priority Critical patent/JPS646842A/en
Publication of JPS646842A publication Critical patent/JPS646842A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To utilize incident light effectively, to make the photoconduction optical path in a photoconductive medium longer without increasing the occupation capacity of the photoconductive medium, and to reduce the size of a device by providing an incident light part with an optical path converting function. CONSTITUTION:The photoconductive medium 1 is a plane or curved surface plate body and at least part of the flank of the plate body is covered with a light reflecting layer 2. A sensing layer 3 varies in double refractive index by sensing a material to be measured which is present in gas or liquid. The light which is incident from the incident light part after being reflected by a reflecting layer 2 several times exits from a photodetection part, and the photoconduction path can be made long. At this time, a diffraction grating 16 is provided vertically on the surface of the incident light part to convert the optical path in the traveling direction of the incident light and light which is incident, but passes as it is without contacting the sensing layer 3 is reduced as much as possible.
JP62162978A 1987-06-30 1987-06-30 Detecting device Pending JPS646842A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62162978A JPS646842A (en) 1987-06-30 1987-06-30 Detecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62162978A JPS646842A (en) 1987-06-30 1987-06-30 Detecting device

Publications (1)

Publication Number Publication Date
JPS646842A true JPS646842A (en) 1989-01-11

Family

ID=15764894

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62162978A Pending JPS646842A (en) 1987-06-30 1987-06-30 Detecting device

Country Status (1)

Country Link
JP (1) JPS646842A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08285851A (en) * 1995-04-13 1996-11-01 Nec Corp Optical waveguide type fluorescent immunosensor and manufacturing method thereof
JP2003014647A (en) * 2001-07-04 2003-01-15 System Instruments Kk Fluorescence measurement method by waveguide method with probe substance
JP2008064463A (en) * 2006-09-04 2008-03-21 Nagoya Industrial Science Research Inst Structure analyzing method of soft material due to beam irradiation and soft material holding device used therein
JP2012163342A (en) * 2011-02-03 2012-08-30 National Institute Of Advanced Industrial & Technology Metal detector, detection plate, and metal detection method
WO2017006679A1 (en) * 2015-07-07 2017-01-12 古野電気株式会社 Measuring chip, measurement device, and measurement method
WO2026126740A1 (en) * 2024-12-10 2026-06-18 富士フイルム株式会社 Multilayer analysis element for liquid sample analysis

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61292044A (en) * 1985-04-12 1986-12-22 ジーイーシー　―　マルコニ　リミテッド Optical waveguide biosensor

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61292044A (en) * 1985-04-12 1986-12-22 ジーイーシー　―　マルコニ　リミテッド Optical waveguide biosensor

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08285851A (en) * 1995-04-13 1996-11-01 Nec Corp Optical waveguide type fluorescent immunosensor and manufacturing method thereof
JP2003014647A (en) * 2001-07-04 2003-01-15 System Instruments Kk Fluorescence measurement method by waveguide method with probe substance
JP2008064463A (en) * 2006-09-04 2008-03-21 Nagoya Industrial Science Research Inst Structure analyzing method of soft material due to beam irradiation and soft material holding device used therein
JP2012163342A (en) * 2011-02-03 2012-08-30 National Institute Of Advanced Industrial & Technology Metal detector, detection plate, and metal detection method
WO2017006679A1 (en) * 2015-07-07 2017-01-12 古野電気株式会社 Measuring chip, measurement device, and measurement method
JPWO2017006679A1 (en) * 2015-07-07 2018-04-19 古野電気株式会社 Measuring chip, measuring device, and measuring method
US10732104B2 (en) 2015-07-07 2020-08-04 Furuno Electric Co., Ltd. Measuring chip, measuring device and measuring method
WO2026126740A1 (en) * 2024-12-10 2026-06-18 富士フイルム株式会社 Multilayer analysis element for liquid sample analysis

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