JPS647467A - Induction coupling plasma mass spectrometer - Google Patents
Induction coupling plasma mass spectrometerInfo
- Publication number
- JPS647467A JPS647467A JP62162179A JP16217987A JPS647467A JP S647467 A JPS647467 A JP S647467A JP 62162179 A JP62162179 A JP 62162179A JP 16217987 A JP16217987 A JP 16217987A JP S647467 A JPS647467 A JP S647467A
- Authority
- JP
- Japan
- Prior art keywords
- cone
- induction coupling
- skimmer
- coupling plasma
- icp
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000008878 coupling Effects 0.000 title abstract 3
- 238000010168 coupling process Methods 0.000 title abstract 3
- 238000005859 coupling reaction Methods 0.000 title abstract 3
- 230000006698 induction Effects 0.000 title abstract 3
- 238000005070 sampling Methods 0.000 abstract 2
- 238000004458 analytical method Methods 0.000 abstract 1
- 238000001514 detection method Methods 0.000 abstract 1
- 238000004949 mass spectrometry Methods 0.000 abstract 1
Landscapes
- Electron Tubes For Measurement (AREA)
Abstract
PURPOSE:To reduce scattering of determination results in mass spectrometry wherein induction coupling plasma (ICP) is used as an ion source by connecting skimmer and/or sampling cone to a fixed voltage power source through resistor. CONSTITUTION:In an ion taking-in part S connecting a portion between a sam pling cone 1 opposing to plasma P flame and a skimmer 2 arranged at the rear side of the cone 1 to an exhaust system, the skimmer 2 and/or the cone 1 are connected to a constant voltage power source E. It is thus possible to restrain fluctuation in detection ion magnitude in a mass analyzer caused due to unstable potential of induction coupling plasma(ICP), and to improve analysis sensitiveness and accuracy of the ICP mass analyzer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62162179A JPH07123036B2 (en) | 1987-06-29 | 1987-06-29 | Inductively coupled plasma mass spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62162179A JPH07123036B2 (en) | 1987-06-29 | 1987-06-29 | Inductively coupled plasma mass spectrometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS647467A true JPS647467A (en) | 1989-01-11 |
| JPH07123036B2 JPH07123036B2 (en) | 1995-12-25 |
Family
ID=15749514
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62162179A Expired - Lifetime JPH07123036B2 (en) | 1987-06-29 | 1987-06-29 | Inductively coupled plasma mass spectrometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH07123036B2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006029999A3 (en) * | 2004-09-17 | 2007-08-02 | Ges Zur Foerderung Angewandter Optik Optoelektronik Quantenelektronik & Spektroskopie Ev | Flight time mass spectrometer |
| JP2024068163A (en) * | 2022-11-04 | 2024-05-17 | サーモ フィッシャー サイエンティフィック (ブレーメン) ゲーエムベーハー | Mass spectrometer signal enhancement |
| JP2025100499A (en) * | 2023-12-22 | 2025-07-03 | サーモ フィッシャー サイエンティフィック (ブレーメン) ゲーエムベーハー | Spacer for orifice element |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6264043A (en) * | 1985-08-09 | 1987-03-20 | Yokogawa Electric Corp | Inductively coupled plasma mass spectrometer |
-
1987
- 1987-06-29 JP JP62162179A patent/JPH07123036B2/en not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6264043A (en) * | 1985-08-09 | 1987-03-20 | Yokogawa Electric Corp | Inductively coupled plasma mass spectrometer |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006029999A3 (en) * | 2004-09-17 | 2007-08-02 | Ges Zur Foerderung Angewandter Optik Optoelektronik Quantenelektronik & Spektroskopie Ev | Flight time mass spectrometer |
| AU2005284150B2 (en) * | 2004-09-17 | 2011-05-12 | Analytik Jena Ag | Flight time mass spectrometer |
| JP2024068163A (en) * | 2022-11-04 | 2024-05-17 | サーモ フィッシャー サイエンティフィック (ブレーメン) ゲーエムベーハー | Mass spectrometer signal enhancement |
| JP2025100499A (en) * | 2023-12-22 | 2025-07-03 | サーモ フィッシャー サイエンティフィック (ブレーメン) ゲーエムベーハー | Spacer for orifice element |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH07123036B2 (en) | 1995-12-25 |
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