JPS6474716A - Substrate support of device for forming thin film - Google Patents

Substrate support of device for forming thin film

Info

Publication number
JPS6474716A
JPS6474716A JP23102387A JP23102387A JPS6474716A JP S6474716 A JPS6474716 A JP S6474716A JP 23102387 A JP23102387 A JP 23102387A JP 23102387 A JP23102387 A JP 23102387A JP S6474716 A JPS6474716 A JP S6474716A
Authority
JP
Japan
Prior art keywords
substrate
thermal conductivity
substrate support
infrared rays
thin film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP23102387A
Other languages
Japanese (ja)
Inventor
Shigehiko Kaji
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP23102387A priority Critical patent/JPS6474716A/en
Publication of JPS6474716A publication Critical patent/JPS6474716A/en
Pending legal-status Critical Current

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  • Electrodes Of Semiconductors (AREA)

Abstract

PURPOSE:To improve heating efficiency of a substrate by constituting a substrate support of an inorganic substance having higher thermal conductivity than quartz glass together with high transmittivity of infrared rays. CONSTITUTION:A subject substrate support is constituted of an inorganic substance having more than 5W/m.k of thermal conductivity besides transmitting infrared rays all of wavelength 7-30mum or of a partial wavelength region. For instance, thermal conductivity of alumina is 36-46W/m.k higher than thermal conductivity of quartz glass besides transmitting infrared rays of 7-8.5mum, which is a part of wavelength absorbed by a silicon substrate. This alumina is used as the substrate support 5 of a thin film formation device. Thereby, heating efficiency of the substrate 4 can be heightened. For instance, when a tungsten film is formed on the silicon substrate 4 using this support 5, high piling-up speed can be obtained because of being able to heat the substrate 4 up to high temperature.
JP23102387A 1987-09-17 1987-09-17 Substrate support of device for forming thin film Pending JPS6474716A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23102387A JPS6474716A (en) 1987-09-17 1987-09-17 Substrate support of device for forming thin film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23102387A JPS6474716A (en) 1987-09-17 1987-09-17 Substrate support of device for forming thin film

Publications (1)

Publication Number Publication Date
JPS6474716A true JPS6474716A (en) 1989-03-20

Family

ID=16917052

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23102387A Pending JPS6474716A (en) 1987-09-17 1987-09-17 Substrate support of device for forming thin film

Country Status (1)

Country Link
JP (1) JPS6474716A (en)

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