JPS647569A - Manufacture of semiconductor nonvolatile memory - Google Patents
Manufacture of semiconductor nonvolatile memoryInfo
- Publication number
- JPS647569A JPS647569A JP16374187A JP16374187A JPS647569A JP S647569 A JPS647569 A JP S647569A JP 16374187 A JP16374187 A JP 16374187A JP 16374187 A JP16374187 A JP 16374187A JP S647569 A JPS647569 A JP S647569A
- Authority
- JP
- Japan
- Prior art keywords
- silicon layer
- polycrystalline silicon
- forming region
- photoresist film
- mask
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Non-Volatile Memory (AREA)
Abstract
PURPOSE:To dispense with a photoresist film for ion implantation so as to simplify a process by a method wherein a drain source region is formed through ion implantaion in such a state that a first polycrystalline silicon layer is left unremoved on a drain forming region. CONSTITUTION:A field insulating film 2 used for the element separation is selectively provided on the primary face of a P-type silicon substrate 1 so as to divide an element forming region, of which surface a gate insulating film 3 is formed on. Next, a polycrystalline silicon layer is deposited on the whole surface and subjected to etching for forming a mask 4 selectively on a floating gate electrode and a drain forming region. Then, a silicon oxide film 5 is formed on the surface of the mask 4, a polycrystalline silicon layer 6 is deposited on the whole surface, and a photoresist film 7 with a gate electrode forming pattern is selectively formed on the polycrystalline silicon layer 6 of the element forming region. Moreover, the polycrystalline silicon layer 6 is etched through the photoresist film 7 used as a mask for the formation of a control gate electrode 8, and a deep and a shallow drain regions 9 and 10 are formed by impalanting N-type impurity ions using the photoresist film 7 and the field insulating film 2 as masks.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16374187A JPH0783065B2 (en) | 1987-06-29 | 1987-06-29 | Method for manufacturing semiconductor non-volatile memory |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16374187A JPH0783065B2 (en) | 1987-06-29 | 1987-06-29 | Method for manufacturing semiconductor non-volatile memory |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS647569A true JPS647569A (en) | 1989-01-11 |
| JPH0783065B2 JPH0783065B2 (en) | 1995-09-06 |
Family
ID=15779796
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16374187A Expired - Fee Related JPH0783065B2 (en) | 1987-06-29 | 1987-06-29 | Method for manufacturing semiconductor non-volatile memory |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0783065B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0223672A (en) * | 1988-07-12 | 1990-01-25 | Mitsubishi Electric Corp | Semiconductor memory device |
-
1987
- 1987-06-29 JP JP16374187A patent/JPH0783065B2/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0223672A (en) * | 1988-07-12 | 1990-01-25 | Mitsubishi Electric Corp | Semiconductor memory device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0783065B2 (en) | 1995-09-06 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |