JPS6476334A - Test instrument for computer system - Google Patents

Test instrument for computer system

Info

Publication number
JPS6476334A
JPS6476334A JP62235533A JP23553387A JPS6476334A JP S6476334 A JPS6476334 A JP S6476334A JP 62235533 A JP62235533 A JP 62235533A JP 23553387 A JP23553387 A JP 23553387A JP S6476334 A JPS6476334 A JP S6476334A
Authority
JP
Japan
Prior art keywords
fault
occurrence
program
conditions
programs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62235533A
Other languages
Japanese (ja)
Inventor
Fumio Ichikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP62235533A priority Critical patent/JPS6476334A/en
Publication of JPS6476334A publication Critical patent/JPS6476334A/en
Pending legal-status Critical Current

Links

Landscapes

  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To shorten test time and to reduce the labors for the test of a computer system by preparing plural programs with which each input device performs the multiple working under the conditions where a fixed fault is easily produced, carrying out successively those programs in the prescribed order, and informing a fault if occurred and confirmed during execution of programs. CONSTITUTION:The conditions where a fixed fault is easily produced are obtained previously from the functions of input/output devices 10-1-10-n as well as the past experiential rules. A program 12 is produced so that the conditions for multiple working where the fixed fault is easily produced. The program 12 is stored in a program memory means 14. These programs 12 are selected by a program selection means 16 in the prescribed order and then carried out successively by a program executing means 18. Thus the devices 10-1-10-n have the multiple working under the conditions where the fixed fault is easily produced. Meanwhile the occurrence of faults are monitored by a fault occurrence monitor means 20 and the occurrence of fault is confirmed and reported by a fault occurrence of fault is confirmed and reported by a fault occurrence reporting means 22. As a result, the test time is shortened together with improvement the test efficiency.
JP62235533A 1987-09-18 1987-09-18 Test instrument for computer system Pending JPS6476334A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62235533A JPS6476334A (en) 1987-09-18 1987-09-18 Test instrument for computer system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62235533A JPS6476334A (en) 1987-09-18 1987-09-18 Test instrument for computer system

Publications (1)

Publication Number Publication Date
JPS6476334A true JPS6476334A (en) 1989-03-22

Family

ID=16987385

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62235533A Pending JPS6476334A (en) 1987-09-18 1987-09-18 Test instrument for computer system

Country Status (1)

Country Link
JP (1) JPS6476334A (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4932020A (en) * 1972-07-28 1974-03-23
JPS55166754A (en) * 1979-06-15 1980-12-26 Nec Corp Automatic inspection system of computer system
JPS5933524A (en) * 1982-08-20 1984-02-23 Fujitsu Ltd Overload control system

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4932020A (en) * 1972-07-28 1974-03-23
JPS55166754A (en) * 1979-06-15 1980-12-26 Nec Corp Automatic inspection system of computer system
JPS5933524A (en) * 1982-08-20 1984-02-23 Fujitsu Ltd Overload control system

Similar Documents

Publication Publication Date Title
JPS5713567A (en) Multiprocessor system
JPS559234A (en) Remote diagnosis method for electronic computer
JPS52132777A (en) Ic pin number display method
JPS56147205A (en) Software automatic testing system of programmable controller
JPS6426175A (en) Test data preparing system for logic integrated circuit
JPS5470745A (en) Fault deciding system for computer numerical control unit
JPS5583944A (en) Diagnosis system for logic device
JPS53145447A (en) Circuit mimic test equipment
JPS6435238A (en) Abnormality diagnosing apparatus for mechanical equipment
JPS5676698A (en) Test equipment for monitoring system
JPS6488213A (en) Real time testing apparatus
JPS5314533A (en) Automatic fault analyzer
JPS55150010A (en) Plant fault analyzing device
e Melo et al. Some Insights on the Event Tree Methodology Used for the Ongoing Angra-1 PRA
JPS649553A (en) Test system for channel processor
TROSHKIN Parameters of the distribution of EKG R-R intervals in the prediction of the work capacity of human operators
Severtsev et al. Petri nets in reliability growth models.
JPS5328497A (en) Tester for coin selector
JPS6231448A (en) Evaluation device and evaluation method for semiconductor devices with built-in MPU
Campbell LASAR to ATLAS post processing(Logic Automated Stimulus and Response Abbreviated Test Language for all Systems)
JPS5324747A (en) Measuring unit for number of instruction execution
PRYWES Automatic computer program generation for Automatic Testing Systems(ATS)[Final Report]
Ramamoorthy et al. On the automated generation of program test data(Abstract only)
JPS56168508A (en) Warning indicator
JPS5432937A (en) Diagnostic system of peripheral device