JPS6486521A - Dry etching - Google Patents

Dry etching

Info

Publication number
JPS6486521A
JPS6486521A JP62242660A JP24266087A JPS6486521A JP S6486521 A JPS6486521 A JP S6486521A JP 62242660 A JP62242660 A JP 62242660A JP 24266087 A JP24266087 A JP 24266087A JP S6486521 A JPS6486521 A JP S6486521A
Authority
JP
Japan
Prior art keywords
microwaves
resist
sidewall
kept
radicals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62242660A
Other languages
Japanese (ja)
Inventor
Tsunetoshi Arikado
Haruo Okano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP62242660A priority Critical patent/JPS6486521A/en
Priority to KR1019880011117A priority patent/KR920007449B1/en
Priority to EP88114049A priority patent/EP0305946B1/en
Priority to DE3855636T priority patent/DE3855636T2/en
Publication of JPS6486521A publication Critical patent/JPS6486521A/en
Priority to US07/996,864 priority patent/US5298112A/en
Pending legal-status Critical Current

Links

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  • Drying Of Semiconductors (AREA)

Abstract

PURPOSE:To remove an adhesive film on a sidewall of a resist and the resist through a dry method using no solution by successively making fluorine radicals, oxygen radicals and chlorine radicals act on the resist in their order, the adhesive film of which is formed onto the sidewall after etching. CONSTITUTION:The mixed gas of Freon and oxygen is introduced into a discharge tube 49, pressure is kept at 0. 2Torr, microwaves are applied from a microwave power 50, and microwave discharge is generated. Fluorine radicals generated are fed into a vacuum vessel 41. Ni-trogen trifluoride is introduced into the discharge tube 49, pressure is kept at 0.2Torr, and microwaves are applied while steam is induced from a gas introducing tube 46. Lastly, chlorine gas is induced into the discharge tube 49, pressure is kept at 0.2Torr, microwaves are applied, and chlorine radicals generated are introduced into the vacuum vessel 41. When a sample 45 is extracted and observed by SEM, an adhesive film on a sidewall is removed completely.
JP62242660A 1987-08-28 1987-09-29 Dry etching Pending JPS6486521A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP62242660A JPS6486521A (en) 1987-09-29 1987-09-29 Dry etching
KR1019880011117A KR920007449B1 (en) 1987-08-28 1988-08-29 Surface treatment method and there apparatus of semiconductor device manufacturing process
EP88114049A EP0305946B1 (en) 1987-08-28 1988-08-29 Method for removing organic and/or inorganic films by dry plasma ashing
DE3855636T DE3855636T2 (en) 1987-08-28 1988-08-29 Plasma stripping process for organic and inorganic layers
US07/996,864 US5298112A (en) 1987-08-28 1992-12-15 Method for removing composite attached to material by dry etching

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62242660A JPS6486521A (en) 1987-09-29 1987-09-29 Dry etching

Publications (1)

Publication Number Publication Date
JPS6486521A true JPS6486521A (en) 1989-03-31

Family

ID=17092345

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62242660A Pending JPS6486521A (en) 1987-08-28 1987-09-29 Dry etching

Country Status (1)

Country Link
JP (1) JPS6486521A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0240915A (en) * 1988-07-29 1990-02-09 Nippon Telegr & Teleph Corp <Ntt> Formation of patterned metal layer
WO2007058284A1 (en) * 2005-11-18 2007-05-24 Mitsubishi Gas Chemical Company, Inc. Wet etching method and wet etching apparatus
JP2017085161A (en) * 2012-05-23 2017-05-18 東京エレクトロン株式会社 Substrate processing apparatus and substrate processing method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0240915A (en) * 1988-07-29 1990-02-09 Nippon Telegr & Teleph Corp <Ntt> Formation of patterned metal layer
WO2007058284A1 (en) * 2005-11-18 2007-05-24 Mitsubishi Gas Chemical Company, Inc. Wet etching method and wet etching apparatus
JP5024048B2 (en) * 2005-11-18 2012-09-12 三菱瓦斯化学株式会社 Wet etching method and wet etching apparatus
JP2017085161A (en) * 2012-05-23 2017-05-18 東京エレクトロン株式会社 Substrate processing apparatus and substrate processing method

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