JPS648675U - - Google Patents
Info
- Publication number
- JPS648675U JPS648675U JP10186487U JP10186487U JPS648675U JP S648675 U JPS648675 U JP S648675U JP 10186487 U JP10186487 U JP 10186487U JP 10186487 U JP10186487 U JP 10186487U JP S648675 U JPS648675 U JP S648675U
- Authority
- JP
- Japan
- Prior art keywords
- tester
- test head
- head section
- control signal
- serial
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Description
第１図はこの考案に係るＩＣ試験装置の一実施
例を示すブロツク図、第２図は第１図におけるピ
ンエレクトロニクスの一例を示すブロツク図、第
３図は第１図におけるテスタ本体とテストヘツド
部側の各制御部間で授受される制御データのフオ
ーマツトの一例を示す図、第４図はテスタ本体の
制御部における制御データのパラレル／シリアル
変換処理の一例を示すフローチヤート、第５図は
テストヘツド部の制御部における制御データのシ
リアル／パラレル変換処理の一例を示すフローチ
ヤート、第６図は従来のＩＣ試験装置の一例を示
すブロツク図である。
１……本考案に係るテスタ本体、２……パラレ
ル−シリアルインタフエース、３，１３……ダイ
レクトメモリアクセスコントローラ、４，１４…
…データメモリ、５，１５……中央演算処理ユニ
ツト、１０……本考案に係るテストヘツド部、１
２……シリアル／パラレルインタフエース、２０
…ピンエレクトロニクス、２９……ＩＣソケツト
、３４……テスタ本体の制御部、３５……ロジツ
ク部、３６……テストヘツド部の制御部、２１〜
２３……リレー、２４……測定信号ドライバ、２
５，２６……コンパレータ、３２……測定信号ラ
イン、３３……シリアルデータ伝送ライン。
FIG. 1 is a block diagram showing an example of an IC testing device according to this invention, FIG. 2 is a block diagram showing an example of the pin electronics in FIG. 1, and FIG. 3 is a block diagram showing an example of the pin electronics in FIG. 1. FIG. 4 is a flowchart showing an example of the parallel/serial conversion process of control data in the control section of the tester main body, and FIG. FIG. 6 is a flowchart showing an example of serial/parallel conversion processing of control data in the control section of the IC tester. FIG. 6 is a block diagram showing an example of a conventional IC testing apparatus. 1... Tester body according to the present invention, 2... Parallel-serial interface, 3, 13... Direct memory access controller, 4, 14...
...Data memory, 5, 15...Central processing unit, 10...Test head section according to the present invention, 1
2...Serial/parallel interface, 20
...Pin electronics, 29...IC socket, 34...Control section of tester body, 35...Logic section, 36...Control section of test head section, 21-
23... Relay, 24... Measurement signal driver, 2
5, 26... Comparator, 32... Measurement signal line, 33... Serial data transmission line.
Claims (1)
テスタ本体と前記テストヘツド部間で測定信号を
授受し、前記テスタ本体から前記テストヘツド部
に対して前記測定用の入出力信号を制御するため
の制御信号を供給するＩＣ試験装置において、 前記テスタ本体の側において、前記テストヘツ
ド部に対して供給する前記制御信号をパラレルデ
ータからシリアルデータに変換するパラレル／シ
リアル変換手段と、 前記テストヘツド部の側において、前記テスタ
本体から与えられた前記シリアルデータをパラレ
ルデータに変換するシリアル／パラレル変換手段
と を具え、パラレルデータに変換された前記制御信
号によつて前記測定信号を制御するようにしたこ
とを特徴とするＩＣ試験装置。 (2) 前記制御信号は、被測定ＩＣのピンに対応
するテスタピンの１ピン毎に複数の制御用の信号
から成る実用新案登録請求の範囲第１項記載のＩ
Ｃ試験装置。[Claims for Utility Model Registration] (1) A tester including a tester main body and a test head section, transmitting and receiving measurement signals between the tester main body and the test head section, and transmitting and receiving measurement signals from the tester main body to the test head section. In an IC testing device that supplies a control signal for controlling a signal, on the side of the tester body, parallel/serial conversion means converts the control signal supplied to the test head section from parallel data to serial data; A serial/parallel conversion means is provided on the side of the test head unit, and the measurement signal is controlled by the control signal converted into parallel data. An IC testing device characterized by: (2) The control signal is comprised of a plurality of control signals for each tester pin corresponding to the pin of the IC to be measured.
C test equipment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10186487U JPS648675U (en) | 1987-07-03 | 1987-07-03 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10186487U JPS648675U (en) | 1987-07-03 | 1987-07-03 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS648675U true JPS648675U (en) | 1989-01-18 |
Family
ID=31331245
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10186487U Pending JPS648675U (en) | 1987-07-03 | 1987-07-03 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS648675U (en) |
-
1987
- 1987-07-03 JP JP10186487U patent/JPS648675U/ja active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| MY119234A (en) | Semiconductor parallel tester | |
| US4656586A (en) | Automatic vehicle testing apparatus | |
| JPS648675U (en) | ||
| DE10150371A1 (en) | External test auxiliary device and test method of a semiconductor device | |
| CN115190059B (en) | Automatic LIN bus diagnosis start test method and system | |
| JPS6289034U (en) | ||
| CN223332646U (en) | A subway bicycle traction debugging device | |
| JPH052869Y2 (en) | ||
| JPS59146398A (en) | Multi-purpose measuring apparatus | |
| JPS6065542A (en) | Method and device for inspecting semiconductor integrated circuit | |
| JPH02675U (en) | ||
| ATE82204T1 (en) | ELECTRICAL BRAKE CONTROL FOR MOTOR VEHICLE TRAIN. | |
| JPS6378453U (en) | ||
| JP2571241B2 (en) | Single unit inspection method | |
| JPS61169777A (en) | Ic tester | |
| JPH0449882U (en) | ||
| JPS61282940A (en) | Control program inspection system using event table | |
| JPS6354080U (en) | ||
| JPS62174283U (en) | ||
| JPS6136577U (en) | automatic test equipment | |
| Kutzner et al. | Tool Monitoring on Small Diameter Drills by Sensors for Sound Transmitted Through Body | |
| JPS6430459U (en) | ||
| JPS63152571U (en) | ||
| JPS59183642U (en) | Pressure transmitter inspection equipment | |
| JPH01152216U (en) |