JPS6488220A - Polarization measuring apparatus - Google Patents

Polarization measuring apparatus

Info

Publication number
JPS6488220A
JPS6488220A JP24611087A JP24611087A JPS6488220A JP S6488220 A JPS6488220 A JP S6488220A JP 24611087 A JP24611087 A JP 24611087A JP 24611087 A JP24611087 A JP 24611087A JP S6488220 A JPS6488220 A JP S6488220A
Authority
JP
Japan
Prior art keywords
polarizing
polarizing plate
angle
incident
converters
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24611087A
Other languages
Japanese (ja)
Inventor
Tsukasa Teramura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP24611087A priority Critical patent/JPS6488220A/en
Publication of JPS6488220A publication Critical patent/JPS6488220A/en
Pending legal-status Critical Current

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Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To achieve the simplification, miniaturization and wt. reduction of constitution and to automatically measure an angle with high accuracy, by calculating the angle of the polarized beam incident to each polarizing plate formed with respect to a vibration surface on the basis of the detection output of the intensity of light passing each polarizing surface of multi-split polarizing plates mutually different in a polarizing direction. CONSTITUTION:When polarized beam being an object to be measured is allowed to be incident to a three-split polarizing plate 10, the intensities of the beam passing through the first-third polarizing plates 11-13 are respectively detected by the first-third beam intensity detectors 21-23. The respective detection signals are processed by amplifiers 31-33 and A/D converters 41-43 to be inputted to an operational control part 50. Herein, predetermined simultaneous equations are solved to display the angle of the polarizing beam incident to the polarizing plate 10 formed with respect to a vibration surface on a display part 60. By this method, this apparatus can be simply constituted of the beam intensity detector group 20, the amplifiers 31-33, the A/D converters 41-43, the control part 50 and the display part 60 in a small size. Since the transmitted beam from the polarizing plate 10 is detected by the detector group 20 and operated by a microcomputer, the enhancement of measuring accuracy can be achieved.
JP24611087A 1987-09-30 1987-09-30 Polarization measuring apparatus Pending JPS6488220A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24611087A JPS6488220A (en) 1987-09-30 1987-09-30 Polarization measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24611087A JPS6488220A (en) 1987-09-30 1987-09-30 Polarization measuring apparatus

Publications (1)

Publication Number Publication Date
JPS6488220A true JPS6488220A (en) 1989-04-03

Family

ID=17143631

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24611087A Pending JPS6488220A (en) 1987-09-30 1987-09-30 Polarization measuring apparatus

Country Status (1)

Country Link
JP (1) JPS6488220A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08201176A (en) * 1994-12-28 1996-08-09 Internatl Business Mach Corp <Ibm> Micro-polarimeter,microsensor system and method for measuring characteristic of thin film
ES2292369A1 (en) * 2007-07-09 2008-03-01 Universidad Politecnica De Madrid Method and system for detecting light polarisation with passband response
CN115508058A (en) * 2022-11-22 2022-12-23 杭州微纳智感光电科技有限公司 Device and method for detecting optical axis angle of polarizing film for display screen

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08201176A (en) * 1994-12-28 1996-08-09 Internatl Business Mach Corp <Ibm> Micro-polarimeter,microsensor system and method for measuring characteristic of thin film
ES2292369A1 (en) * 2007-07-09 2008-03-01 Universidad Politecnica De Madrid Method and system for detecting light polarisation with passband response
WO2009007479A1 (en) * 2007-07-09 2009-01-15 Universidad Politécnica de Madrid Method and system for detecting light polarisation with passband response
CN115508058A (en) * 2022-11-22 2022-12-23 杭州微纳智感光电科技有限公司 Device and method for detecting optical axis angle of polarizing film for display screen
CN115508058B (en) * 2022-11-22 2023-03-31 杭州微纳智感光电科技有限公司 Device and method for detecting optical axis angle of polarizing film for display screen

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