KR100483003B1 - 반도체 메모리 장치 - Google Patents
반도체 메모리 장치 Download PDFInfo
- Publication number
- KR100483003B1 KR100483003B1 KR10-2002-0044389A KR20020044389A KR100483003B1 KR 100483003 B1 KR100483003 B1 KR 100483003B1 KR 20020044389 A KR20020044389 A KR 20020044389A KR 100483003 B1 KR100483003 B1 KR 100483003B1
- Authority
- KR
- South Korea
- Prior art keywords
- bit line
- signal
- voltage
- self refresh
- refresh mode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4094—Bit-line management or control circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
- G11C11/40615—Internal triggering or timing of refresh, e.g. hidden refresh, self refresh, pseudo-SRAMs
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/4074—Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
Abstract
Description
| SREF | PCG | AND1 출력 | AND2 출력 |
| 1 | 1 | 0 | 1 |
| 1 | 0 | 0 | 0 |
| 0 | 1 | 1 | 0 |
| 0 | 0 | 0 | 0 |
Claims (4)
- 비트라인쌍의 전압을 균등화 시키는 비트라인 균등화부; 및정상 동작 모드에서는 제 1 전압을 사용하여 상기 비트라인 균등화부를 제어하는 비트라인 균등화 신호를 제어하고, 셀프 리프레쉬 모드에서는 상기 제 1 전압보다 낮은 제 2 전압을 사용하여 상기 비트라인 균등화신호를 제어하는 비트라인 균등화 신호 구동부;를 포함하는 반도체 메모리 장치.
- 제 1 항에 있어서, 상기 비트라인 균등화 신호 구동부는,셀프 리프레쉬 모드시에 하이레벨로 인에이블되는 셀프 리프레쉬 모드신호와 프리차지 및 균등화 시에 하이레벨로 인에이블되는 프리차지 신호를 이용하여 정상 동작 모드시에 상기 제 1전압을 비트라인 균등화 신호에 인가하는 제 1전압 제어부;상기 셀프 리프레쉬 모드신호와 상기 프리차지 신호를 이용하여 셀프 리프레쉬 모드시에, 상기 제 2 전압을 비트라인 균등화 신호에 인가하는 제 2전압 제어부;를 포함하는 것을 특징으로 하는 반도체 메모리 장치.
- 제 2 항에 있어서, 상기 제 1전압 제어부는,상기 셀프 리프레쉬 신호를 반전시키는 반전수단;상기 반전수단을 통해 반전된 셀프 리프레쉬 신호와 상기 프리차지 신호를 입력으로 하여 출력하는 논리조합수단; 및상기 논리조합수단으로부터 출력된 신호에 의해 제어되어, 상기 제 1전압을 비트라인 균등화 신호라인에 인가하는 스위칭부;를 포함하는 것을 특징으로 하는 반도체 메모리 장치.
- 제 2 항에 있어서, 상기 제 2전압 제어부는,상기 셀프 리프레쉬 모드신호와 상기 프리차지 신호를 입력으로하여 논리연산을 수행하는 논리조합수단; 및상기 논리조합수단으로부터 출력된 신호에 의해 제어되어, 상기 제 2전압을 상기 비트라인 균등화 신호라인에 인가하는 스위칭수단;을 포함하는 것을 특징으로 하는 반도체 메모리 장치.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2002-0044389A KR100483003B1 (ko) | 2002-07-27 | 2002-07-27 | 반도체 메모리 장치 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2002-0044389A KR100483003B1 (ko) | 2002-07-27 | 2002-07-27 | 반도체 메모리 장치 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20040011054A KR20040011054A (ko) | 2004-02-05 |
| KR100483003B1 true KR100483003B1 (ko) | 2005-04-15 |
Family
ID=37319382
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR10-2002-0044389A Expired - Fee Related KR100483003B1 (ko) | 2002-07-27 | 2002-07-27 | 반도체 메모리 장치 |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR100483003B1 (ko) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10726886B2 (en) | 2017-11-10 | 2020-07-28 | Samsung Electronics Co., Ltd. | Memory circuits precharging memory cell arrays and memory devices including the same |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100733408B1 (ko) * | 2005-09-29 | 2007-06-29 | 주식회사 하이닉스반도체 | 반도체 메모리 장치 및 그 구동 방법 |
| US7564728B2 (en) | 2005-09-29 | 2009-07-21 | Hynix Semiconductor, Inc. | Semiconductor memory device and its driving method |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0229989A (ja) * | 1988-07-19 | 1990-01-31 | Mitsubishi Electric Corp | ダイナミックランダムアクセスメモリ装置 |
| KR19990003405A (ko) * | 1997-06-25 | 1999-01-15 | 윤종용 | 파워-다운셀프리프레시 모드를 갖는 다이나믹 램 장치 |
| KR20020002681A (ko) * | 2000-06-30 | 2002-01-10 | 박종섭 | 비트라인 프리차지전압 제어회로 |
| KR20030057825A (ko) * | 2001-12-29 | 2003-07-07 | 주식회사 하이닉스반도체 | 비트 라인 프리차지 전압 발생 회로 |
-
2002
- 2002-07-27 KR KR10-2002-0044389A patent/KR100483003B1/ko not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0229989A (ja) * | 1988-07-19 | 1990-01-31 | Mitsubishi Electric Corp | ダイナミックランダムアクセスメモリ装置 |
| KR19990003405A (ko) * | 1997-06-25 | 1999-01-15 | 윤종용 | 파워-다운셀프리프레시 모드를 갖는 다이나믹 램 장치 |
| KR20020002681A (ko) * | 2000-06-30 | 2002-01-10 | 박종섭 | 비트라인 프리차지전압 제어회로 |
| KR20030057825A (ko) * | 2001-12-29 | 2003-07-07 | 주식회사 하이닉스반도체 | 비트 라인 프리차지 전압 발생 회로 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10726886B2 (en) | 2017-11-10 | 2020-07-28 | Samsung Electronics Co., Ltd. | Memory circuits precharging memory cell arrays and memory devices including the same |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20040011054A (ko) | 2004-02-05 |
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