KR100802443B1 - 투과촬영장치 - Google Patents
투과촬영장치 Download PDFInfo
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- KR100802443B1 KR100802443B1 KR1020067001133A KR20067001133A KR100802443B1 KR 100802443 B1 KR100802443 B1 KR 100802443B1 KR 1020067001133 A KR1020067001133 A KR 1020067001133A KR 20067001133 A KR20067001133 A KR 20067001133A KR 100802443 B1 KR100802443 B1 KR 100802443B1
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- South Korea
- Prior art keywords
- radiation detector
- target
- radiation
- source device
- detector
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
- G01T1/2942—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using autoradiographic methods
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
- G01T7/005—Details of radiation-measuring instruments calibration techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
- G01T7/08—Means for conveying samples received
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Description
Claims (4)
- 음극으로부터 방출된 음극선이 타겟에 충돌하여 타겟(2a)으로부터 방사선을 조사하는 선원장치(2), 및 방사선검출기를 마련하고, 타겟(2a) 및 방사선검출기의 사이에 시료를 부착하는 시료테이블(5)을 마련하고, 방사선검출기의 검출면의 중심부(P)가 이 중심부(P)와 타겟(2a)을 잇는 기준축에 직교하도록 상기 방사선검출기 및 상기 타겟(2a)을 배치한 투과촬영장치에 있어서,상기 방사선검출기가 한 쌍의 제 1, 제 2 방사선검출기(3, 4)로 이루어지고, 제 1 방사선검출기(3)를 제 1 방사선검출기(3)의 검출면의 중심부(P)와 상기 타겟(2a)을 잇는 제 1 기준축(L1)에 직교하도록 배치함과 동시에, 제 2 방사선검출기(4)를 제 2 방사선검출기(4)의 검출면의 중심부(P)와 상기 타겟(2a)을 잇는 제 2 기준축(L2)에 직교하도록 배치하고, 제 1 방사선검출기(3)는 상기 타겟(2a)에 대하여 구동기구(6)에 의해 원근이동 가능하고 상기 제 1 방사선검출기(3)와 타겟(2a) 사이의 배치간격은 상기 제 2 방사선검출기(4)와 타겟(2a) 사이의 배치간격보다도 크게 변경할 수 있고, 상기 타겟(2a)의 타겟면은 음극(2b)에 경사지게 대향되며, 상기 음극(2b)은 제 1 방사선검출기 및 제 2 방사선검출기(4) 중 제 2 방사선검출기(4) 측에 배치되도록 상기 선원장치(2)와 상기 제 1, 제 2 방사선검출기(3, 4)을 배치한 것을 특징으로 하는 투과촬영장치.
- 제1항에 있어서, 상기 선원장치(2)의 최고출력축(M)이, 상기 제 1, 제 2 기준축(L1, L2) 중 상기 제 1 방사선검출기(3)의 제 1 기준축(L1) 위에 또는 한 쌍의 상기 제 1, 제 2 기준축(L1, L2) 사이에 위치하도록, 상기 선원장치(2)와 상기 제 1, 제 2 방사선검출기(3, 4)를 배치한 것을 특징으로 하는 투과촬영장치.
- 제1항 또는 제2항에 있어서, 상기 제 2 방사선검출기가 플랫패널검출기(4) 인 것을 특징으로 하는 투과촬영장치.
- 제1항 또는 제2항에 있어서, 상기 제 1 방사선검출기가 II(Image Intesifier, 3)인 것을 특징으로 하는 투과촬영장치.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020067001133A KR100802443B1 (ko) | 2006-01-17 | 2003-07-22 | 투과촬영장치 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020067001133A KR100802443B1 (ko) | 2006-01-17 | 2003-07-22 | 투과촬영장치 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20060098424A KR20060098424A (ko) | 2006-09-18 |
| KR100802443B1 true KR100802443B1 (ko) | 2008-02-13 |
Family
ID=37629837
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020067001133A Expired - Fee Related KR100802443B1 (ko) | 2006-01-17 | 2003-07-22 | 투과촬영장치 |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR100802443B1 (ko) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100923624B1 (ko) * | 2008-01-21 | 2009-10-23 | 고려공업검사 주식회사 | Cmos 센서를 이용한 방사선 투과 영상장치 |
| CN109612938B (zh) * | 2019-01-10 | 2023-09-15 | 安徽明天氢能科技股份有限公司 | 一种单极板质量巡检工装 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001004559A (ja) * | 1999-06-16 | 2001-01-12 | Hamamatsu Photonics Kk | X線検査装置 |
| JP2001153819A (ja) * | 1999-11-26 | 2001-06-08 | Hitachi Kokusai Electric Inc | X線撮像装置 |
| JP2001203095A (ja) * | 2000-01-20 | 2001-07-27 | Shimadzu Corp | X線撮影装置 |
| JP2003057195A (ja) * | 2001-08-09 | 2003-02-26 | X-Ray Precision Inc | 3次元構造分析方法、及び3次元構造分析装置 |
| KR20070101203A (ko) * | 2004-12-27 | 2007-10-16 | 하마마츠 포토닉스 가부시키가이샤 | X선관 및 x선원 |
-
2003
- 2003-07-22 KR KR1020067001133A patent/KR100802443B1/ko not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001004559A (ja) * | 1999-06-16 | 2001-01-12 | Hamamatsu Photonics Kk | X線検査装置 |
| JP2001153819A (ja) * | 1999-11-26 | 2001-06-08 | Hitachi Kokusai Electric Inc | X線撮像装置 |
| JP2001203095A (ja) * | 2000-01-20 | 2001-07-27 | Shimadzu Corp | X線撮影装置 |
| JP2003057195A (ja) * | 2001-08-09 | 2003-02-26 | X-Ray Precision Inc | 3次元構造分析方法、及び3次元構造分析装置 |
| KR20070101203A (ko) * | 2004-12-27 | 2007-10-16 | 하마마츠 포토닉스 가부시키가이샤 | X선관 및 x선원 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20060098424A (ko) | 2006-09-18 |
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