KR19980077969A - 반도체 제조용 설비의 웨이퍼 식별기호 체크시스템 - Google Patents
반도체 제조용 설비의 웨이퍼 식별기호 체크시스템 Download PDFInfo
- Publication number
- KR19980077969A KR19980077969A KR1019970015317A KR19970015317A KR19980077969A KR 19980077969 A KR19980077969 A KR 19980077969A KR 1019970015317 A KR1019970015317 A KR 1019970015317A KR 19970015317 A KR19970015317 A KR 19970015317A KR 19980077969 A KR19980077969 A KR 19980077969A
- Authority
- KR
- South Korea
- Prior art keywords
- wafer
- identification symbol
- cassette
- flat zone
- facility
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
- H10P72/0618—Apparatus for monitoring, sorting, marking, testing or measuring using identification means, e.g. labels on substrates or labels on containers
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
Claims (1)
- 웨이퍼를 탑재한 카세트와, 상기 웨이퍼에 소정의 공정을 진행하는 설비에 있어서, 소정의 제어신호에 의해 상기 웨이퍼의 플랫존이 상기 카세트의 전면을 향하도록 배열한 후 상기 웨이퍼를 상기 카세트의 전면으로 소정크기만큼 적출하는 플랫존 배열부와, 상기 플랫존 배열부를 이동가능하도록 지지하는 지지부와, 상기 플랫존 배열부 및 상기 지지부를 제어하는 제어부를 포함하는 것을 특징으로 하는 반도체 제조용 설비의 웨이퍼 식별기호 체크시스템.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019970015317A KR19980077969A (ko) | 1997-04-24 | 1997-04-24 | 반도체 제조용 설비의 웨이퍼 식별기호 체크시스템 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019970015317A KR19980077969A (ko) | 1997-04-24 | 1997-04-24 | 반도체 제조용 설비의 웨이퍼 식별기호 체크시스템 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR19980077969A true KR19980077969A (ko) | 1998-11-16 |
Family
ID=65989556
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019970015317A Withdrawn KR19980077969A (ko) | 1997-04-24 | 1997-04-24 | 반도체 제조용 설비의 웨이퍼 식별기호 체크시스템 |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR19980077969A (ko) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102718239B1 (ko) | 2024-07-16 | 2024-10-17 | 주식회사 오픈에스지 | 비전센서를 이용한 반도체 소자용 식별 관리 시스템 |
| KR102758145B1 (ko) | 2024-06-27 | 2025-01-22 | 주식회사 오픈에스지 | 반도체 웨이퍼의 메뉴얼 스토커 |
| KR102758146B1 (ko) | 2024-07-09 | 2025-01-22 | 주식회사 오픈에스지 | 반도체 소자용 스토커 |
-
1997
- 1997-04-24 KR KR1019970015317A patent/KR19980077969A/ko not_active Withdrawn
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102758145B1 (ko) | 2024-06-27 | 2025-01-22 | 주식회사 오픈에스지 | 반도체 웨이퍼의 메뉴얼 스토커 |
| KR102758146B1 (ko) | 2024-07-09 | 2025-01-22 | 주식회사 오픈에스지 | 반도체 소자용 스토커 |
| KR102718239B1 (ko) | 2024-07-16 | 2024-10-17 | 주식회사 오픈에스지 | 비전센서를 이용한 반도체 소자용 식별 관리 시스템 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| PC1203 | Withdrawal of no request for examination |
St.27 status event code: N-1-6-B10-B12-nap-PC1203 |
|
| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid | ||
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
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| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
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| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |