KR960020008A - 아날로그/디지털 변환기 - Google Patents

아날로그/디지털 변환기 Download PDF

Info

Publication number
KR960020008A
KR960020008A KR1019950043633A KR19950043633A KR960020008A KR 960020008 A KR960020008 A KR 960020008A KR 1019950043633 A KR1019950043633 A KR 1019950043633A KR 19950043633 A KR19950043633 A KR 19950043633A KR 960020008 A KR960020008 A KR 960020008A
Authority
KR
South Korea
Prior art keywords
signal
digital signal
analog
converter
digital
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
KR1019950043633A
Other languages
English (en)
Other versions
KR100457033B1 (ko
Inventor
미쯔야 오히에
Original Assignee
가나미야지 준
오끼뎅끼 고오교오 가부시끼가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 가나미야지 준, 오끼뎅끼 고오교오 가부시끼가이샤 filed Critical 가나미야지 준
Publication of KR960020008A publication Critical patent/KR960020008A/ko
Application granted granted Critical
Publication of KR100457033B1 publication Critical patent/KR100457033B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/108—Converters having special provisions for facilitating access for testing purposes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analogue/Digital Conversion (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

A/D 변환기의 테스트를 확실히 행한다. 아날로그 입력신호 A가 A/D변환부 1로 A/D 변환되어 데이터버스 2에 디지털신호 S1으로써 출력된다.
선택신호 sel이 “H”일 때는, 디지털신호 S1이 실렉터 4로 선택되어, A/D 리절트레지스터 3에 입력된다.
A/D 변환부 1에 의해 A/D 변환이 완료하고, 디지털신호 S1이 A/D 리절트 레지스터 3의 입력단자에 전해진 시점에서, 기록신호 w에 의해 디지털신호 S1에 래치된다.
디지털신호 S1을 판독할 때는, 판독신호 r을 “H”로 하는것에 의해, 출력단자 OUT에서 출력신호 out가 출력된다.
한편 선택신호 sel이 “L”일 때에는, 실렉터 4에 의해 외부에서의 디지털신호 S5가 선택되어, 기록신호 w에 의해 A/D 리절트레지스터 3에 격납된다.

Description

아날로그/디지털 변환기
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 제1의 실시예를 나타는 ADC의 구성블록도,
제6도는 본 발명의 제2의 실시예를 나타내는 ADC의 구성블록도이다.

Claims (1)

  1. 아날로그 신호를 양자화해서 소정의 비트수의 디지털신호로 변환하는 아날로그/디지털 변환부와, 상기 아날로그/디지털 변환부에서 출력된 디지털 신호를 간직하는 보지수단을, 구비한 아날로그/디지털변환기에 있어서, 상기 아날로그/디지털 변환부에서 출력된 디지털신호 또는 외부에서 입력된 상기 소정의 비트수와 동일 비트수의 임의의 디지털신호의 어느 한편을 선택해서 상기 보지수단에 입력하는 선택수단을 설치한 것을 특징으로 하는 아날로그/디지털 변환기.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019950043633A 1994-11-25 1995-11-24 아날로그/디지탈변환기 Expired - Fee Related KR100457033B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP94-291468 1994-11-25
JP6291468A JPH08154055A (ja) 1994-11-25 1994-11-25 アナログ／デジタル変換器

Publications (2)

Publication Number Publication Date
KR960020008A true KR960020008A (ko) 1996-06-17
KR100457033B1 KR100457033B1 (ko) 2005-01-27

Family

ID=17769266

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950043633A Expired - Fee Related KR100457033B1 (ko) 1994-11-25 1995-11-24 아날로그/디지탈변환기

Country Status (5)

Country Link
US (1) US5815105A (ko)
EP (1) EP0714170B1 (ko)
JP (1) JPH08154055A (ko)
KR (1) KR100457033B1 (ko)
DE (1) DE69523537T2 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100531382B1 (ko) * 2003-10-25 2005-11-29 엘지전자 주식회사 Ａｄｃ 샘플링 위상 결정 장치 및 방법

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19643872A1 (de) * 1996-10-31 1998-05-07 Alsthom Cge Alcatel Optische Netzabschlußeinheit eines hybriden Glasfaser-Koaxialkabel-Zugangsnetzes
JP4354906B2 (ja) 2002-05-08 2009-10-28 コンティネンタル・テーベス・アクチエンゲゼルシヤフト・ウント・コンパニー・オッフェネ・ハンデルスゲゼルシヤフト エラーのない信号アナログ・デジタル変換のための電子回路
DE102005016800A1 (de) * 2005-04-12 2006-10-19 Robert Bosch Gmbh Wandleranordnung und Testverfahren für einen Wandler
DE102006003566B4 (de) * 2006-01-25 2020-10-01 Infineon Technologies Ag Signal-Wandel-Vorrichtung, insbesondere Analog-Digital-Wandel-Vorrichtung, und Verfahren zum Betreiben einer Signal-Wandel-Vorrichtung
WO2018129452A1 (en) * 2017-01-06 2018-07-12 Microchip Technology Incorporated Verification, validation, and applications support for analog-to-digital converter systems

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5422557A (en) * 1977-07-22 1979-02-20 Hitachi Ltd Constant current circuit
US4922492A (en) * 1988-05-13 1990-05-01 National Semiconductor Corp. Architecture and device for testable mixed analog and digital VLSI circuits
EP0350932B1 (en) * 1988-07-13 1996-04-10 Nec Corporation One-chip data processor with built-in A/D converter
US5047770A (en) * 1990-05-03 1991-09-10 General Electric Company Apparatus for testing data conversion/transfer functions in a vibratory energy imaging system
DE69125674T2 (de) * 1990-09-04 1997-10-23 Motorola Inc Automatische analog digital Convertierung mit auswählbaren Formatresultaten
JP2553753B2 (ja) * 1990-10-17 1996-11-13 三菱電機株式会社 Ａｄ変換装置
JPH04212524A (ja) * 1990-12-06 1992-08-04 Matsushita Electric Ind Co Ltd 半導体集積回路
KR930004772Y1 (ko) * 1991-05-13 1993-07-23 금성일렉트론 주식회사 아날로그/디지탈 변환기의 테스트장치
US5175547A (en) * 1992-01-31 1992-12-29 Motorola, Inc. Method and apparatus for testing an analog to digital converter
US5185607A (en) * 1992-01-31 1993-02-09 Motorola, Inc. Method and apparatus for testing an analog to digital converter
JPH06164391A (ja) * 1992-11-25 1994-06-10 Mitsubishi Electric Corp アナログ／デジタル変換装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100531382B1 (ko) * 2003-10-25 2005-11-29 엘지전자 주식회사 Ａｄｃ 샘플링 위상 결정 장치 및 방법
US7034721B2 (en) 2003-10-25 2006-04-25 Lg Electronics Inc. Apparatus and method for adjusting sampling clock phase in analog-digital converter

Also Published As

Publication number Publication date
JPH08154055A (ja) 1996-06-11
US5815105A (en) 1998-09-29
DE69523537T2 (de) 2002-06-27
DE69523537D1 (de) 2001-12-06
KR100457033B1 (ko) 2005-01-27
EP0714170B1 (en) 2001-10-31
EP0714170A3 (en) 1998-12-02
EP0714170A2 (en) 1996-05-29

Similar Documents

Publication Publication Date Title
KR920004856A (ko) 이벤트 한정 검사 아키텍춰
KR920007358A (ko) 아나로그-디지탈 변환 시스템 및 아나로그 신호를 디지탈 신호로 변환시키는 방법
KR900011161A (ko) 연속비교형태 아날로그-디지탈 변환기
KR890006003A (ko) 데이타 입출력 회로
KR920007360A (ko) 아나로그-디지탈 변환 시스템 및 아나로그 신호를 디지탈 신호로 변환시키는 방법
KR960020008A (ko) 아날로그/디지털 변환기
KR920017373A (ko) 아날로그 디지탈 변환회로
KR830004728A (ko) 텔레비젼 수상기용 디지탈-아날로그 변환기
KR880010579A (ko) 병렬형 a/d 콘버터
KR910011482A (ko) 비디오 프린터 장치의 역 감마보정회로 및 보정 데이터 추출방법
KR100611917B1 (ko) 데이터 드라이버
KR960007104Y1 (ko) 디지탈/아날로그 변환기
KR860002713A (ko) 레벨 표시기
SU913364A1 (ru) Преобразователь кода грея в двоичный код 1
JPH0376428A (ja) Ａ／ｄコンバータ
KR880003239A (ko) 컴퓨터의 음성입력 변환장치
KR920000069A (ko) 병렬, 직렬 출력 변환기능을 내장하는 메모리 ic
KR970056796A (ko) 주사 변환 회로
KR920007356A (ko) 아나로그-디지탈 변환 시스템
KR910010884A (ko) 논리 문턱전압을 이용한 아날로그/디지탈 변환기
KR960038623A (ko) 엠씨유(mcu) 프로그램 데이타의 보호방법
KR890016540A (ko) D/a컨버터 조절회로
KR930018382A (ko) 직렬 데이타를 이용한 pwm 확장회로
KR970002570A (ko) 디지탈/아날로그 컨버터 인터페이스 장치
KR920006836A (ko) 마이컴의 키메트릭스장치

Legal Events

Date Code Title Description
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

A201 Request for examination
P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

E801 Decision on dismissal of amendment
PE0801 Dismissal of amendment

St.27 status event code: A-2-2-P10-P12-nap-PE0801

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R11-asn-PN2301

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R14-asn-PN2301

FPAY Annual fee payment

Payment date: 20091022

Year of fee payment: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

LAPS Lapse due to unpaid annual fee
PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20101104

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20101104