KR970053792A - 반도체 장치의 보호 소자 - Google Patents

반도체 장치의 보호 소자 Download PDF

Info

Publication number
KR970053792A
KR970053792A KR1019950068221A KR19950068221A KR970053792A KR 970053792 A KR970053792 A KR 970053792A KR 1019950068221 A KR1019950068221 A KR 1019950068221A KR 19950068221 A KR19950068221 A KR 19950068221A KR 970053792 A KR970053792 A KR 970053792A
Authority
KR
South Korea
Prior art keywords
region
semiconductor device
protection element
substrate
internal circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
KR1019950068221A
Other languages
English (en)
Other versions
KR0169359B1 (ko
Inventor
권규형
Original Assignee
김광호
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 김광호, 삼성전자 주식회사 filed Critical 김광호
Priority to KR1019950068221A priority Critical patent/KR0169359B1/ko
Priority to JP8284361A priority patent/JPH09191079A/ja
Publication of KR970053792A publication Critical patent/KR970053792A/ko
Application granted granted Critical
Publication of KR0169359B1 publication Critical patent/KR0169359B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/60Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
    • H10D89/601Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
    • H10D89/811Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using FETs as protective elements
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/32Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by intermediate layers between substrates and deposited layers
    • H10P14/3202Materials thereof
    • H10P14/3224Materials thereof being Group IIB-VIA semiconductors
    • H10P14/3226Oxides

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • Bipolar Integrated Circuits (AREA)

Abstract

본 발명은 반도체 장치의 보호 소자에 관한 것으로서, 더욱 상세하게는, 동작 전압을 낮춘 입출력 보호 소자에 관한 것이다. 본 발명에 따른 반도체 장치의 보호 소자는 고립된 베이스 영역을 가지는 접합 트랜지스터로서 이미터 영역은 보호하고자 하는 내부 회로의 입력단에 연결되고 컬렉터 영역은 내부 회로의 전원 전압에 연결된다. 이 때, 컬렉터 영역의 역할을 하는 기판을 외부와 연결하는 고농도 n+영역을 베이스 영역과 접하게 하여 음의 전압이 인가되는 경우 컬렉터-베이스 간 항복이 고농도 n+영역과 베이스 영역의 사이에서 일어나게 함으로써 동작 전압을 줄일 수 있다.

Description

반도체 장치의 보호 소자
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제5도는 본 발명의 실시예에 따른 반도체 장치의 보호 소자의 단면도이다.

Claims (6)

  1. 제1도전형의 반도체 기판, 상기 기판에 형성되어 있는 제2도전형의 제1영역, 상기 제1영역에 형성되어 있는 제1도전형의 제2영역, 그리고 상기 기판에 상기 기판보다 고농도로 형성되어 있으며 상기 제1영역과 닿아 있는 제1도전형의 제3영역을 포함하는 반도체 장치의 보호 소자.
  2. 제1항에서, 상기 제1도전형은 n형이고 상기 제2도전형은 p형인 입출력 보호 소자.
  3. 제1항에서, 상기 제2영역은 상기 기판보다 고농도인 반도체 장치의 보호 소자.
  4. 제1항에서, 상기 제2영역과 상기 제3영역의 사이에 형성되어 있는 산화막을 더 포함하는 반도체 장치의 보호 소자.
  5. 제1항에서, 상기 제1영역은 외부와 연결되지 않는 반도체 장치의 보호 소자.
  6. 제1항에서, 상기 제2영역은 보호하고자 하는 내부 회로의 입력단과 연결되고 상기 제3영역은 상기 내부 회로의 전원 전압이 인가되는 반도체 장치의 보호 소자.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019950068221A 1995-12-30 1995-12-30 반도체 장치의 보호 소자 Expired - Fee Related KR0169359B1 (ko)

Priority Applications (2)

Application Number Priority Date Filing Date Title
KR1019950068221A KR0169359B1 (ko) 1995-12-30 1995-12-30 반도체 장치의 보호 소자
JP8284361A JPH09191079A (ja) 1995-12-30 1996-10-25 半導体装置の保護素子

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950068221A KR0169359B1 (ko) 1995-12-30 1995-12-30 반도체 장치의 보호 소자

Publications (2)

Publication Number Publication Date
KR970053792A true KR970053792A (ko) 1997-07-31
KR0169359B1 KR0169359B1 (ko) 1999-01-15

Family

ID=19447979

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950068221A Expired - Fee Related KR0169359B1 (ko) 1995-12-30 1995-12-30 반도체 장치의 보호 소자

Country Status (2)

Country Link
JP (1) JPH09191079A (ko)
KR (1) KR0169359B1 (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8648419B2 (en) 2010-01-20 2014-02-11 Freescale Semiconductor, Inc. ESD protection device and method
US9543420B2 (en) 2013-07-19 2017-01-10 Nxp Usa, Inc. Protection device and related fabrication methods

Also Published As

Publication number Publication date
KR0169359B1 (ko) 1999-01-15
JPH09191079A (ja) 1997-07-22

Similar Documents

Publication Publication Date Title
JP3342918B2 (ja) 集積回路における静電的放電に対してパッドを保護するためのダイオード構造
KR970705836A (ko) 정전기 방전 보호회로(electrostatic discharge protection circult)
KR970053789A (ko) 반도체 장치의 보호 소자
MY106702A (en) Semiconductor device having protection circuit.
KR970053865A (ko) 반도체장치
KR870006670A (ko) 반도체 집적회로장치
KR880011937A (ko) 과전압 보호용 집적회로
KR880002270A (ko) 대규모 집적회로용 보호회로
KR100276495B1 (ko) 상보형 금속 산화물 반도체(cmos) 기술의 집적 전자 회로용 극성 반전 보호 장치
KR830009654A (ko) 집적회로장치의 보호회로
KR970053792A (ko) 반도체 장치의 보호 소자
US5936284A (en) Electrostatic discharge protection circuit and transistor
JPH04280670A (ja) スイッチ回路およびゲート電圧クランプ型半導体装置
KR940018964A (ko) 반도체 장치
KR970024166A (ko) DRAM 및 로직 회로의 DRAM 전원 및 SCR용 바이모덜 ESD 보호 회로 (Bimodal ESD Protection for DRAM Power Supplies and SCRs for DRAMs and Logic Circuits)
KR930009026B1 (ko) 정전보호회로
KR890008979A (ko) 모놀리식 과전압 보호용 어셈블리
EP0921619A3 (en) A power source circuit of a semiconductor integrated circuit
JPH0478162A (ja) 集積回路用保護装置
KR850000805A (ko) 받도체장치
JPS5587391A (en) Semiconductor memory circuit device
KR970072389A (ko) 정전기 방전 보호장치
JPS6352469A (ja) 半導体集積回路装置の静電破壊防止装置
KR950002453Y1 (ko) 반도체 패드 보호소자
KR970053970A (ko) 반도체 장치의 보호 소자

Legal Events

Date Code Title Description
A201 Request for examination
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R13-asn-PN2301

St.27 status event code: A-5-5-R10-R11-asn-PN2301

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R13-asn-PN2301

St.27 status event code: A-5-5-R10-R11-asn-PN2301

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

R17-X000 Change to representative recorded

St.27 status event code: A-5-5-R10-R17-oth-X000

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R13-asn-PN2301

St.27 status event code: A-5-5-R10-R11-asn-PN2301

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 7

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R13-asn-PN2301

St.27 status event code: A-5-5-R10-R11-asn-PN2301

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R13-asn-PN2301

St.27 status event code: A-5-5-R10-R11-asn-PN2301

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 8

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 9

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 10

FPAY Annual fee payment

Payment date: 20081001

Year of fee payment: 11

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 11

LAPS Lapse due to unpaid annual fee
PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20091011

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20091011

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000