LT3105539T - Liuminescencijos matavimai trumpalaikės gardelės nustatytu laiku - Google Patents

Liuminescencijos matavimai trumpalaikės gardelės nustatytu laiku

Info

Publication number
LT3105539T
LT3105539T LTEPPCT/IB2015/050884T LT15050884T LT3105539T LT 3105539 T LT3105539 T LT 3105539T LT 15050884 T LT15050884 T LT 15050884T LT 3105539 T LT3105539 T LT 3105539T
Authority
LT
Lithuania
Prior art keywords
time resolved
luminescence measurements
resolved luminescence
transient grating
grating time
Prior art date
Application number
LTEPPCT/IB2015/050884T
Other languages
English (en)
Inventor
Justin M. HODGKISS
Kai Chen
Original Assignee
Victoria Link Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Victoria Link Ltd filed Critical Victoria Link Ltd
Publication of LT3105539T publication Critical patent/LT3105539T/lt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/636—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0232—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using shutters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2889—Rapid scan spectrometers; Time resolved spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • G01J3/4406—Fluorescence spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • G01J2003/4424—Fluorescence correction for Raman spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/069—Supply of sources
    • G01N2201/0696—Pulsed

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
LTEPPCT/IB2015/050884T 2014-02-10 2015-02-05 Liuminescencijos matavimai trumpalaikės gardelės nustatytu laiku LT3105539T (lt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201461938059P 2014-02-10 2014-02-10
PCT/IB2015/050884 WO2015118481A1 (en) 2014-02-10 2015-02-05 Transient grating time resolved luminescence measurements

Publications (1)

Publication Number Publication Date
LT3105539T true LT3105539T (lt) 2022-05-10

Family

ID=53777382

Family Applications (1)

Application Number Title Priority Date Filing Date
LTEPPCT/IB2015/050884T LT3105539T (lt) 2014-02-10 2015-02-05 Liuminescencijos matavimai trumpalaikės gardelės nustatytu laiku

Country Status (4)

Country Link
US (1) US9752927B2 (lt)
EP (1) EP3105539B1 (lt)
LT (1) LT3105539T (lt)
WO (1) WO2015118481A1 (lt)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016133473A (ja) * 2015-01-22 2016-07-25 株式会社トプコン 光学分析装置
CN106248225A (zh) * 2016-07-14 2016-12-21 中国科学院上海光学精密机械研究所 基于瞬态光栅效应的自参考光谱干涉飞秒激光脉冲测量装置
CN106918395B (zh) * 2017-03-28 2019-01-22 中国工程物理研究院激光聚变研究中心 一种诊断超短脉冲聚焦场时空分布特性的方法
WO2021099095A1 (en) 2019-11-20 2021-05-27 Unilever Ip Holdings B.V. Composition
CN112362088A (zh) * 2020-12-11 2021-02-12 中国石油大学(华东) 一种多光栅数据的同步采集方法及系统
US20240213392A1 (en) * 2021-04-28 2024-06-27 Bar-Ilan University On-chip spectrometer with tunable photodetection layer

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3396241B2 (ja) * 1992-12-04 2003-04-14 科学技術振興事業団 過渡回折格子分光法
US6008899A (en) * 1997-06-18 1999-12-28 Sandia Corporation Apparatus and method for optical pulse measurement
US7760356B2 (en) 2004-08-30 2010-07-20 Shimadzu Corporation Optical measuring device and method, and nanoparticle measuring method and device
US7230715B2 (en) * 2004-12-07 2007-06-12 Matsushita Electric Industrial Co., Ltd. Ultrafast laser pulse shape measurement method and system

Also Published As

Publication number Publication date
US9752927B2 (en) 2017-09-05
EP3105539A1 (en) 2016-12-21
WO2015118481A1 (en) 2015-08-13
US20160356644A1 (en) 2016-12-08
EP3105539A4 (en) 2017-10-04
EP3105539B1 (en) 2022-03-02

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