MY187481A - Photosensitive resin composition - Google Patents
Photosensitive resin compositionInfo
- Publication number
- MY187481A MY187481A MYUI2017703393A MYUI2017703393A MY187481A MY 187481 A MY187481 A MY 187481A MY UI2017703393 A MYUI2017703393 A MY UI2017703393A MY UI2017703393 A MYUI2017703393 A MY UI2017703393A MY 187481 A MY187481 A MY 187481A
- Authority
- MY
- Malaysia
- Prior art keywords
- photosensitive resin
- resin composition
- chemical solution
- alkali
- exposure
- Prior art date
Links
Classifications
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F2/00—Processes of polymerisation
- C08F2/44—Polymerisation in the presence of compounding ingredients, e.g. plasticisers, dyestuffs, fillers
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0073—Masks not provided for in groups H05K3/02 - H05K3/46, e.g. for photomechanical production of patterned surfaces
- H05K3/0076—Masks not provided for in groups H05K3/02 - H05K3/46, e.g. for photomechanical production of patterned surfaces characterised by the composition of the mask
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F2/00—Processes of polymerisation
- C08F2/46—Polymerisation initiated by wave energy or particle radiation
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F2/00—Processes of polymerisation
- C08F2/46—Polymerisation initiated by wave energy or particle radiation
- C08F2/48—Polymerisation initiated by wave energy or particle radiation by ultraviolet or visible light
- C08F2/50—Polymerisation initiated by wave energy or particle radiation by ultraviolet or visible light with sensitising agents
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F20/00—Homopolymers and copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride, ester, amide, imide or nitrile thereof
- C08F20/02—Monocarboxylic acids having less than ten carbon atoms, Derivatives thereof
- C08F20/10—Esters
- C08F20/26—Esters containing oxygen in addition to the carboxy oxygen
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F265/00—Macromolecular compounds obtained by polymerising monomers on to polymers of unsaturated monocarboxylic acids or derivatives thereof as defined in group C08F20/00
- C08F265/04—Macromolecular compounds obtained by polymerising monomers on to polymers of unsaturated monocarboxylic acids or derivatives thereof as defined in group C08F20/00 on to polymers of esters
- C08F265/06—Polymerisation of acrylate or methacrylate esters on to polymers thereof
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F290/00—Macromolecular compounds obtained by polymerising monomers on to polymers modified by introduction of aliphatic unsaturated end or side groups
- C08F290/02—Macromolecular compounds obtained by polymerising monomers on to polymers modified by introduction of aliphatic unsaturated end or side groups on to polymers modified by introduction of unsaturated end groups
- C08F290/06—Polymers provided for in subclass C08G
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/028—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
- G03F7/029—Inorganic compounds; Onium compounds; Organic compounds having hetero atoms other than oxygen, nitrogen or sulfur
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/028—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
- G03F7/031—Organic compounds not covered by group G03F7/029
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/032—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/032—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
- G03F7/033—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polymers obtained by reactions only involving carbon-to-carbon unsaturated bonds, e.g. vinyl polymers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/40—Treatment after imagewise removal, e.g. baking
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/42—Stripping or agents therefor
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/02—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
- H05K3/06—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed chemically or electrolytically, e.g. by photo-etch process
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/18—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using precipitation techniques to apply the conductive material
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/108—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern by semi-additive methods; masks therefor
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Polymers & Plastics (AREA)
- Health & Medical Sciences (AREA)
- Medicinal Chemistry (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Inorganic Chemistry (AREA)
- Materials For Photolithography (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Manufacturing Of Printed Circuit Boards (AREA)
- Polymerisation Methods In General (AREA)
- Manufacturing Of Printed Wiring (AREA)
- Graft Or Block Polymers (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
- Macromonomer-Based Addition Polymer (AREA)
Abstract
A photosensitive resin composition comprises an alkali-soluble polymer, a compound with an ethylenically unsaturated bond, and a photopolymerization initiator, wherein after a photosensitive resin layer comprising the photosensitive resin composition has been formed on a substrate surface, exposure and development have been carried out and the obtained resist pattern has been treated with a chemical solution for evaluation of chemical solution resistance, the minimum line width of the cured resist lines is no greater than 17 ?m.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015079381 | 2015-04-08 | ||
| JP2015166570 | 2015-08-26 | ||
| PCT/JP2016/061610 WO2016163540A1 (en) | 2015-04-08 | 2016-04-08 | Photosensitive resin composition |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| MY187481A true MY187481A (en) | 2021-09-23 |
Family
ID=57073148
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| MYUI2020000023A MY199471A (en) | 2015-04-08 | 2016-04-08 | Photosensitive resin composition |
| MYUI2017703393A MY187481A (en) | 2015-04-08 | 2016-04-08 | Photosensitive resin composition |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| MYUI2020000023A MY199471A (en) | 2015-04-08 | 2016-04-08 | Photosensitive resin composition |
Country Status (6)
| Country | Link |
|---|---|
| JP (3) | JPWO2016163540A1 (en) |
| KR (2) | KR101990230B1 (en) |
| CN (2) | CN107407880B (en) |
| MY (2) | MY199471A (en) |
| TW (3) | TWI667539B (en) |
| WO (1) | WO2016163540A1 (en) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI666518B (en) * | 2016-12-30 | 2019-07-21 | 奇美實業股份有限公司 | Photosensitive resin composition and uses thereof |
| JP6981864B2 (en) * | 2017-01-30 | 2021-12-17 | 旭化成株式会社 | A method for manufacturing a photosensitive resin composition, a photosensitive resin laminate, a substrate on which a resist pattern is formed, and a circuit board. |
| CN116300314A (en) * | 2017-03-01 | 2023-06-23 | 旭化成株式会社 | Photosensitive resin composition |
| KR102295744B1 (en) * | 2017-03-29 | 2021-08-30 | 아사히 가세이 가부시키가이샤 | photosensitive resin composition |
| CN109976092B (en) * | 2017-12-27 | 2022-04-01 | 太阳油墨(苏州)有限公司 | Curable resin composition, dry film, cured product, and printed wiring board |
| WO2019244898A1 (en) * | 2018-06-22 | 2019-12-26 | 旭化成株式会社 | Photosensitive resin composition and resist pattern formation method |
| CN118778362A (en) * | 2018-06-22 | 2024-10-15 | 旭化成株式会社 | Photosensitive resin composition and method for forming resist pattern |
| KR102639399B1 (en) * | 2018-07-11 | 2024-02-22 | 후지필름 가부시키가이샤 | Chemical solution and chemical solution container |
| KR102509152B1 (en) * | 2018-08-09 | 2023-03-10 | 아사히 가세이 가부시키가이샤 | Photosensitive resin composition and method for forming resist pattern |
| JP7300619B2 (en) * | 2019-01-11 | 2023-06-30 | 太陽ホールディングス株式会社 | Laminated structures, dry films, cured products thereof, and electronic components |
| US20220362110A1 (en) * | 2019-09-19 | 2022-11-17 | Kuraray Noritake Dental Inc. | Dental curable composition |
| CN114503030B (en) * | 2019-10-08 | 2025-03-11 | 东京应化工业株式会社 | Negative photosensitive resin composition, photosensitive resist film, pattern forming method, cured film, production method and roller |
| KR20250009559A (en) * | 2019-11-11 | 2025-01-17 | 아사히 가세이 가부시키가이샤 | Photosensitive resin composition and photosensitive resin multilayer body |
| WO2022030053A1 (en) * | 2020-08-07 | 2022-02-10 | 昭和電工マテリアルズ株式会社 | Photosensitive resin composition, photosensitive element, method for forming resist pattern, and method for producing printed wiring board |
| CN116847983A (en) * | 2021-02-26 | 2023-10-03 | 太阳控股株式会社 | Laminated structures and flexible printed circuit boards |
| JP7836291B2 (en) * | 2021-02-26 | 2026-03-26 | 富士フイルム株式会社 | Manufacturing method for laminates, manufacturing method for circuit wiring |
| JP2023046974A (en) * | 2021-09-24 | 2023-04-05 | Jsr株式会社 | Method for manufacturing wiring board and wiring board |
| CN119213874A (en) * | 2022-05-31 | 2024-12-27 | 株式会社力森诺科 | Pattern forming method and pattern forming structure |
| KR20240031514A (en) * | 2022-08-30 | 2024-03-08 | 삼성에스디아이 주식회사 | Photosensitive resin composition, photosensitive resin layer using the same and color filter |
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| JP3619852B2 (en) * | 1999-06-08 | 2005-02-16 | ニチゴー・モートン株式会社 | Photosensitive resin composition and dry film resist using the same |
| JP3916605B2 (en) * | 2001-11-12 | 2007-05-16 | 旭化成エレクトロニクス株式会社 | Photosensitive resin composition and use thereof |
| WO2006011548A1 (en) * | 2004-07-30 | 2006-02-02 | Hitachi Chemical Company, Ltd. | Photosensitive film, photosensitive film laminate and photosensitive film roll |
| JP4535851B2 (en) * | 2004-11-19 | 2010-09-01 | 旭化成イーマテリアルズ株式会社 | Photopolymerizable resin composition |
| JP4646759B2 (en) | 2005-09-20 | 2011-03-09 | 旭化成イーマテリアルズ株式会社 | Pattern forming material, pattern forming apparatus and pattern forming method |
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| JP6229256B2 (en) | 2011-10-31 | 2017-11-15 | 日立化成株式会社 | Photosensitive element, resist pattern forming method, and printed wiring board manufacturing method |
| KR20130047656A (en) * | 2011-10-31 | 2013-05-08 | 히타치가세이가부시끼가이샤 | Photosensitive resin composition, photosensitive element, method for forming resist pattern, and method for producing printed wiring board |
| JP5948539B2 (en) | 2012-01-27 | 2016-07-06 | 旭化成株式会社 | Photosensitive resin composition |
| JP2013195681A (en) * | 2012-03-19 | 2013-09-30 | Mitsubishi Chemicals Corp | Photosensitive resin composition, color filter, liquid crystal display device, and organic el display |
| JP5853806B2 (en) * | 2012-03-23 | 2016-02-09 | Jsr株式会社 | Radiation sensitive resin composition, cured film and method for forming cured film |
| JP6019791B2 (en) * | 2012-06-19 | 2016-11-02 | 日立化成株式会社 | Partition wall forming material, photosensitive element using the same, partition wall forming method, and image display device manufacturing method |
| JP5826135B2 (en) * | 2012-08-23 | 2015-12-02 | 富士フイルム株式会社 | Colored radiation-sensitive composition and color filter using the same |
| JP6063200B2 (en) | 2012-10-15 | 2017-01-18 | 旭化成株式会社 | Photosensitive resin composition |
| JP6135314B2 (en) * | 2012-12-26 | 2017-05-31 | Jsr株式会社 | Coloring composition, color filter and display element |
| JP6120560B2 (en) * | 2012-12-26 | 2017-04-26 | 第一工業製薬株式会社 | Color filter, black matrix, or curable resin composition for circuit formation |
| JP6257164B2 (en) | 2013-03-28 | 2018-01-10 | 旭化成株式会社 | Method for forming resist pattern |
| JP2015007766A (en) * | 2013-05-27 | 2015-01-15 | 富士フイルム株式会社 | Method for producing color filter, composition for forming underlayer, organic EL display device |
| KR102234812B1 (en) | 2013-07-23 | 2021-03-31 | 쇼와덴코머티리얼즈가부시끼가이샤 | Photosensitive resin composition for projection exposure, photosensitive element, method for forming resist pattern, process for producing printed wiring board and process for producing lead frame |
| KR20210102494A (en) * | 2014-05-21 | 2021-08-19 | 아사히 가세이 가부시키가이샤 | Photosensitive resin composition and method for forming circuit pattern |
-
2016
- 2016-04-08 CN CN201680019911.6A patent/CN107407880B/en active Active
- 2016-04-08 CN CN202210104954.1A patent/CN114437251B/en active Active
- 2016-04-08 KR KR1020177020557A patent/KR101990230B1/en active Active
- 2016-04-08 KR KR1020197012465A patent/KR102286107B1/en active Active
- 2016-04-08 MY MYUI2020000023A patent/MY199471A/en unknown
- 2016-04-08 TW TW106146049A patent/TWI667539B/en active
- 2016-04-08 TW TW105111187A patent/TWI620017B/en active
- 2016-04-08 MY MYUI2017703393A patent/MY187481A/en unknown
- 2016-04-08 WO PCT/JP2016/061610 patent/WO2016163540A1/en not_active Ceased
- 2016-04-08 TW TW108122448A patent/TWI706222B/en active
- 2016-04-08 JP JP2017511104A patent/JPWO2016163540A1/en active Pending
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2020
- 2020-03-31 JP JP2020064645A patent/JP7162030B2/en active Active
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| TWI706222B (en) | 2020-10-01 |
| JPWO2016163540A1 (en) | 2017-11-02 |
| CN107407880A (en) | 2017-11-28 |
| JP2021131556A (en) | 2021-09-09 |
| CN114437251B (en) | 2024-02-20 |
| KR20170101263A (en) | 2017-09-05 |
| JP2020126251A (en) | 2020-08-20 |
| JP7162030B2 (en) | 2022-10-27 |
| KR101990230B1 (en) | 2019-06-17 |
| TW201812454A (en) | 2018-04-01 |
| KR102286107B1 (en) | 2021-08-04 |
| CN114437251A (en) | 2022-05-06 |
| KR20190047146A (en) | 2019-05-07 |
| TWI667539B (en) | 2019-08-01 |
| TW201701070A (en) | 2017-01-01 |
| JP7242748B2 (en) | 2023-03-20 |
| WO2016163540A1 (en) | 2016-10-13 |
| MY199471A (en) | 2023-10-31 |
| TWI620017B (en) | 2018-04-01 |
| CN107407880B (en) | 2022-02-08 |
| TW201947323A (en) | 2019-12-16 |
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