MY198993A - Photosensitive resin composition and method for forming circuit pattern - Google Patents
Photosensitive resin composition and method for forming circuit patternInfo
- Publication number
- MY198993A MY198993A MYUI2016002039A MYUI2016002039A MY198993A MY 198993 A MY198993 A MY 198993A MY UI2016002039 A MYUI2016002039 A MY UI2016002039A MY UI2016002039 A MYUI2016002039 A MY UI2016002039A MY 198993 A MY198993 A MY 198993A
- Authority
- MY
- Malaysia
- Prior art keywords
- photosensitive resin
- resin composition
- mass
- circuit pattern
- substrate
- Prior art date
Links
Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F2/00—Processes of polymerisation
- C08F2/46—Polymerisation initiated by wave energy or particle radiation
- C08F2/48—Polymerisation initiated by wave energy or particle radiation by ultraviolet or visible light
- C08F2/50—Polymerisation initiated by wave energy or particle radiation by ultraviolet or visible light with sensitising agents
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F222/00—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a carboxyl radical and containing at least one other carboxyl radical in the molecule; Salts, anhydrides, esters, amides, imides, or nitriles thereof
- C08F222/10—Esters
- C08F222/1006—Esters of polyhydric alcohols or polyhydric phenols
- C08F222/106—Esters of polycondensation macromers
- C08F222/1063—Esters of polycondensation macromers of alcohol terminated polyethers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/028—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
- G03F7/029—Inorganic compounds; Onium compounds; Organic compounds having hetero atoms other than oxygen, nitrogen or sulfur
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/028—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
- G03F7/031—Organic compounds not covered by group G03F7/029
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/032—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
- G03F7/033—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polymers obtained by reactions only involving carbon-to-carbon unsaturated bonds, e.g. vinyl polymers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2051—Exposure without an original mask, e.g. using a programmed deflection of a point source, by scanning, by drawing with a light beam, using an addressed light or corpuscular source
- G03F7/2053—Exposure without an original mask, e.g. using a programmed deflection of a point source, by scanning, by drawing with a light beam, using an addressed light or corpuscular source using a laser
- G03F7/2055—Exposure without an original mask, e.g. using a programmed deflection of a point source, by scanning, by drawing with a light beam, using an addressed light or corpuscular source using a laser for the production of printing plates; Exposure of liquid photohardening compositions
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/02—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
- H05K3/06—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed chemically or electrolytically, e.g. by photo-etch process
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/28—Applying non-metallic protective coatings
- H05K3/285—Permanent coating compositions
- H05K3/287—Photosensitive compositions
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Medicinal Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Inorganic Chemistry (AREA)
- Optics & Photonics (AREA)
- Materials For Photolithography (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Manufacturing Of Printed Circuit Boards (AREA)
- Manufacturing Of Printed Wiring (AREA)
- Polymerisation Methods In General (AREA)
Abstract
Provided is a photosensitive resin composition, containing (A) 40-80% by mass of an alkali-soluble polymer, (B) 0.1-20% by mass of a photopolymerization initiator, and (C) 5-50% by mass of a compound with an ethylene double bond, the photosensitive resin composition being characterized in that: a photosensitive resin layer which is 25 m in thickness and is made of the photosensitive resin composition is formed on a substrate surface, the photosensitive resin layer is exposed and developed under conditions in which the position of the focal point during exposure is offset from the substrate surface by 200 m toward the interior of the substrate in the direction of the thickness of the substrate, and a resist pattern obtained thereby has a resist foot width in the range 0.01-3.5 m; and the photosensitive resin composition is used in direct imaging exposure. (Figure 1)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014105267 | 2014-05-21 | ||
| PCT/JP2015/064644 WO2015178462A1 (en) | 2014-05-21 | 2015-05-21 | Photosensitive resin composition and method for forming circuit pattern |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| MY198993A true MY198993A (en) | 2023-10-06 |
Family
ID=54554122
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| MYUI2016002039A MY198993A (en) | 2014-05-21 | 2015-05-21 | Photosensitive resin composition and method for forming circuit pattern |
Country Status (6)
| Country | Link |
|---|---|
| JP (2) | JPWO2015178462A1 (en) |
| KR (4) | KR20210102494A (en) |
| CN (2) | CN111694218B (en) |
| MY (1) | MY198993A (en) |
| TW (3) | TWI660241B (en) |
| WO (1) | WO2015178462A1 (en) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111694218B (en) * | 2014-05-21 | 2023-09-08 | 旭化成株式会社 | Photosensitive resin composition and circuit pattern forming method |
| JPWO2016163540A1 (en) * | 2015-04-08 | 2017-11-02 | 旭化成株式会社 | Photosensitive resin composition |
| JP6809873B2 (en) * | 2015-12-28 | 2021-01-06 | 旭化成株式会社 | Laminate |
| JP6755109B2 (en) * | 2016-03-29 | 2020-09-16 | 旭化成株式会社 | Photosensitive resin composition, photosensitive resin laminate, resist pattern forming method and conductor pattern manufacturing method |
| KR20190035864A (en) * | 2016-12-07 | 2019-04-03 | 아사히 가세이 가부시키가이샤 | Photosensitive resin composition and photosensitive resin laminate |
| TWI700183B (en) * | 2017-12-20 | 2020-08-01 | 日商旭化成股份有限公司 | Photosensitive resin laminate |
| CN108663867A (en) * | 2018-04-11 | 2018-10-16 | 华南师范大学 | A kind of laser protective film of dyestuff doping |
| CN112534351B (en) * | 2018-08-09 | 2025-03-18 | 旭化成株式会社 | Photosensitive resin composition and method for forming resist pattern |
| CN114026496A (en) * | 2019-07-10 | 2022-02-08 | 昭和电工材料株式会社 | Photosensitive resin composition, photosensitive resin film, method for producing cured product, laminate, and electronic device |
| US12353130B2 (en) | 2019-11-11 | 2025-07-08 | Asahi Kasei Kabushiki Kaisha | Photosensitive resin composition and photosensitive resin multilayer body |
| JP7376723B2 (en) * | 2019-12-31 | 2023-11-08 | コーロン インダストリーズ インク | Photosensitive resin composition and dry film photoresist, photosensitive element, circuit board, and display device using the same |
| KR102242551B1 (en) * | 2019-12-31 | 2021-04-20 | 코오롱인더스트리 주식회사 | Photosensitive resin composition, and dry film photoresist, photosensitive element, circuit board, display device using the same |
| JP2020190735A (en) * | 2020-07-14 | 2020-11-26 | 旭化成株式会社 | Photosensitive resin composition, photosensitive resin laminate, resist pattern forming method and conductor pattern manufacturing method |
| TW202309655A (en) * | 2021-07-28 | 2023-03-01 | 日商日產化學股份有限公司 | Positive Photosensitive Resin Composition |
| WO2023054619A1 (en) * | 2021-09-30 | 2023-04-06 | 太陽インキ製造株式会社 | Photosensitive resin composition, cured product, printed circuit board, and method for producing printed circuit board |
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| JP6113976B2 (en) * | 2012-08-29 | 2017-04-12 | 旭化成株式会社 | Photosensitive resin composition |
| KR101302736B1 (en) * | 2012-10-09 | 2013-09-03 | 기린정밀공업 (주) | Led moving head having enhanced safety performance |
| KR102162752B1 (en) * | 2013-07-23 | 2020-10-07 | 히타치가세이가부시끼가이샤 | Photosensitive resin composition for projection exposure, photosensitive element, method for forming resist pattern, process for producing printed wiring board and process for producing lead frame |
| JP2015143809A (en) * | 2013-12-25 | 2015-08-06 | 日立化成株式会社 | Photosensitive resin composition, photosensitive element, resist pattern forming method and printed wiring board manufacturing method |
| CN111694218B (en) * | 2014-05-21 | 2023-09-08 | 旭化成株式会社 | Photosensitive resin composition and circuit pattern forming method |
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2015
- 2015-05-21 CN CN202010587896.3A patent/CN111694218B/en active Active
- 2015-05-21 TW TW107108334A patent/TWI660241B/en active
- 2015-05-21 WO PCT/JP2015/064644 patent/WO2015178462A1/en not_active Ceased
- 2015-05-21 KR KR1020217025400A patent/KR20210102494A/en not_active Ceased
- 2015-05-21 MY MYUI2016002039A patent/MY198993A/en unknown
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| TW201602729A (en) | 2016-01-16 |
| KR102694619B1 (en) | 2024-08-12 |
| KR20210102494A (en) | 2021-08-19 |
| CN111694218B (en) | 2023-09-08 |
| KR20160131084A (en) | 2016-11-15 |
| KR20220148301A (en) | 2022-11-04 |
| JPWO2015178462A1 (en) | 2017-04-20 |
| JP2017223993A (en) | 2017-12-21 |
| CN106462068B (en) | 2020-07-24 |
| TW201708959A (en) | 2017-03-01 |
| TWI660241B (en) | 2019-05-21 |
| CN111694218A (en) | 2020-09-22 |
| CN106462068A (en) | 2017-02-22 |
| JP6470805B2 (en) | 2019-02-13 |
| KR20190092622A (en) | 2019-08-07 |
| TWI623814B (en) | 2018-05-11 |
| TWI570513B (en) | 2017-02-11 |
| WO2015178462A1 (en) | 2015-11-26 |
| TW201820036A (en) | 2018-06-01 |
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