MY199954A - System and method of inspecting translucent object - Google Patents

System and method of inspecting translucent object

Info

Publication number
MY199954A
MY199954A MYPI2021003515A MYPI2021003515A MY199954A MY 199954 A MY199954 A MY 199954A MY PI2021003515 A MYPI2021003515 A MY PI2021003515A MY PI2021003515 A MYPI2021003515 A MY PI2021003515A MY 199954 A MY199954 A MY 199954A
Authority
MY
Malaysia
Prior art keywords
translucent object
inspecting
relates
present
inspecting translucent
Prior art date
Application number
MYPI2021003515A
Inventor
Muhammad Nazir Bin Syed Kholed Syed
Saiful Bin Zakariah Muhammad
Bin Amran Muzzammil
Cowei Ooi
Kong Chin Chee
Original Assignee
Tt Vision Tech Sdn Bhd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tt Vision Tech Sdn Bhd filed Critical Tt Vision Tech Sdn Bhd
Priority to MYPI2021003515A priority Critical patent/MY199954A/en
Priority to CN202280044455.6A priority patent/CN117546008A/en
Priority to PCT/MY2022/050053 priority patent/WO2022271007A1/en
Publication of MY199954A publication Critical patent/MY199954A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9511—Optical elements other than lenses, e.g. mirrors
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30148—Semiconductor; IC; Wafer

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Quality & Reliability (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

The present invention relates to a system (101) of inspecting translucent object (107), comprising of at least one image capturing device, at least one lens (105); whereby said system (101) further comprises of at least one structured light (113) which is beneficial in inspecting at least one void or bubble inside said translucent object (107) accurately. The present invention also relates to the process of performing said inspection of translucent object (107) using said system (101). (The most illustrative figure is FIG. 4)
MYPI2021003515A 2021-06-22 2021-06-22 System and method of inspecting translucent object MY199954A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
MYPI2021003515A MY199954A (en) 2021-06-22 2021-06-22 System and method of inspecting translucent object
CN202280044455.6A CN117546008A (en) 2021-06-22 2022-06-20 System and method for inspecting translucent objects
PCT/MY2022/050053 WO2022271007A1 (en) 2021-06-22 2022-06-20 System and method of inspecting translucent object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
MYPI2021003515A MY199954A (en) 2021-06-22 2021-06-22 System and method of inspecting translucent object

Publications (1)

Publication Number Publication Date
MY199954A true MY199954A (en) 2023-11-30

Family

ID=84544653

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI2021003515A MY199954A (en) 2021-06-22 2021-06-22 System and method of inspecting translucent object

Country Status (3)

Country Link
CN (1) CN117546008A (en)
MY (1) MY199954A (en)
WO (1) WO2022271007A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20250363616A1 (en) * 2024-05-21 2025-11-27 Psemi Corporation Mispick detection at a tape and reel machine systems and methods

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06100555B2 (en) * 1990-12-19 1994-12-12 東洋ガラス株式会社 Defect inspection method and device for transparent object
US5845002A (en) * 1994-11-03 1998-12-01 Sunkist Growers, Inc. Method and apparatus for detecting surface features of translucent objects
FR2907554B1 (en) * 2006-10-24 2009-03-20 Tiama Sa OPTICAL INSPECTION STATION FOR DETECTING DEFECTS REFLECTING LIGHT
KR101423122B1 (en) * 2012-02-17 2014-07-25 주식회사 미르기술 Vision inspection method and vision inspection apparatus for light emitting diod comprising translucent fluorescent substance
EP2725348A1 (en) * 2012-10-29 2014-04-30 Scientific Visual SARL Optical quality control device

Also Published As

Publication number Publication date
WO2022271007A1 (en) 2022-12-29
CN117546008A (en) 2024-02-09

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