NO20032013L - Impedansdeteksjonskrets, metode derav og elektrostatisk kapasitansdeteksjonskrets - Google Patents

Impedansdeteksjonskrets, metode derav og elektrostatisk kapasitansdeteksjonskrets

Info

Publication number
NO20032013L
NO20032013L NO20032013A NO20032013A NO20032013L NO 20032013 L NO20032013 L NO 20032013L NO 20032013 A NO20032013 A NO 20032013A NO 20032013 A NO20032013 A NO 20032013A NO 20032013 L NO20032013 L NO 20032013L
Authority
NO
Norway
Prior art keywords
detection circuit
input terminal
electrostatic capacitance
operational amplifier
impedance converter
Prior art date
Application number
NO20032013A
Other languages
English (en)
Other versions
NO20032013D0 (no
Inventor
Masami Yakabe
Naoki Ikeuchi
Original Assignee
Sumitomo Metal Ind
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Ind filed Critical Sumitomo Metal Ind
Publication of NO20032013D0 publication Critical patent/NO20032013D0/no
Publication of NO20032013L publication Critical patent/NO20032013L/no

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; ELECTRIC HEARING AIDS; PUBLIC ADDRESS SYSTEMS
    • H04R29/00—Monitoring arrangements; Testing arrangements
    • H04R29/004—Monitoring arrangements; Testing arrangements for microphones
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Otolaryngology (AREA)
  • Engineering & Computer Science (AREA)
  • Acoustics & Sound (AREA)
  • Signal Processing (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Circuit For Audible Band Transducer (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Networks Using Active Elements (AREA)
NO20032013A 2001-09-06 2003-05-05 Impedansdeteksjonskrets, metode derav og elektrostatisk kapasitansdeteksjonskrets NO20032013L (no)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001270877 2001-09-06
PCT/JP2002/009137 WO2003023420A1 (fr) 2001-09-06 2002-09-06 Circuit de mesure de l'impedance, son procede et circuit de mesure de la capacite

Publications (2)

Publication Number Publication Date
NO20032013D0 NO20032013D0 (no) 2003-05-05
NO20032013L true NO20032013L (no) 2003-06-19

Family

ID=19096476

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20032013A NO20032013L (no) 2001-09-06 2003-05-05 Impedansdeteksjonskrets, metode derav og elektrostatisk kapasitansdeteksjonskrets

Country Status (9)

Country Link
US (1) US7005865B2 (no)
EP (1) EP1426772B1 (no)
KR (1) KR100654471B1 (no)
CN (1) CN100454028C (no)
AT (1) ATE389185T1 (no)
DE (1) DE60225570T2 (no)
NO (1) NO20032013L (no)
TW (1) TWI221196B (no)
WO (1) WO2003023420A1 (no)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8247883B2 (en) * 2008-12-04 2012-08-21 Palo Alto Research Center Incorporated Printing shielded connections and circuits
JP5544717B2 (ja) * 2009-01-15 2014-07-09 富士通株式会社 半導体装置及び試験方法
US8362784B2 (en) * 2009-06-22 2013-01-29 Mitsubishi Electric Corporation Capacitor capacitance diagnosis device and electric power apparatus equipped with capacitor capacitance diagnosis device
NL2007186C2 (nl) * 2011-07-28 2013-01-29 Fluid Well Instr B V Voor hoogfrequente storingen ongevoelige capacitieve meetschakeling.
JP2013061177A (ja) * 2011-09-12 2013-04-04 Nidec-Read Corp インピーダンス測定装置
DE102011083052B4 (de) * 2011-09-20 2016-03-10 Hauni Maschinenbau Ag Kapazitive HF-Strangmessvorrichtung und Strangmaschine
US9645193B2 (en) * 2012-10-23 2017-05-09 Keithley Instruments, Llc Impedance source ranging apparatus and method
CN104685904B (zh) * 2013-01-08 2017-10-03 广东得胜电子有限公司 电容式麦克风及其阻抗变换器
CN103344172B (zh) * 2013-07-09 2015-08-12 中国工程物理研究院总体工程研究所 一种减少电磁脉冲干扰的电容测微仪采集处理装置和方法
CN105277786A (zh) * 2014-07-25 2016-01-27 南京瀚宇彩欣科技有限责任公司 传感器的最大阻抗检测方法及检测装置
CN104640053A (zh) 2015-01-19 2015-05-20 矽力杰半导体技术(杭州)有限公司 扬声器的直流阻抗检测方法、电路以及d类音频放大器
CN106341763B (zh) 2016-11-17 2019-07-30 矽力杰半导体技术(杭州)有限公司 扬声器驱动装置和扬声器驱动方法
CN106454679B (zh) 2016-11-17 2019-05-21 矽力杰半导体技术(杭州)有限公司 扬声器振膜状态估计方法及应用其的扬声器驱动电路
CN107422192B (zh) * 2017-08-02 2020-05-08 广州市锐丰音响科技股份有限公司 音频设备输入阻抗测量方法和装置、测量校验方法和装置
CN107274644A (zh) * 2017-08-11 2017-10-20 四川赛科安全技术有限公司 一种检测消防总线容性大小的方法
WO2019187515A1 (ja) * 2018-03-30 2019-10-03 パナソニックＩｐマネジメント株式会社 静電容量検出装置
CN108693408B (zh) * 2018-08-22 2020-07-07 广东电网有限责任公司 超级电容器内阻检测方法、装置和计算机可读存储介质
CN114812618B (zh) * 2021-12-24 2023-03-07 中国科学院长春光学精密机械与物理研究所 频点噪声抑制系统

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Publication number Priority date Publication date Assignee Title
DE3221800A1 (de) * 1982-06-05 1983-12-08 Martin Dipl Ing Kueper Messmethode zur bestimmung von lautsprecherdaten
US4918376A (en) * 1989-03-07 1990-04-17 Ade Corporation A.C. capacitive gauging system
DK170196B1 (da) * 1993-04-07 1995-06-06 Brueel & Kjaer As Fremgangsmåde og kobling til at reducere den harmoniske forvrængning af en kapacitiv transducer
JPH09280806A (ja) 1996-04-09 1997-10-31 Nissan Motor Co Ltd 静電容量式変位計
CN1255975A (zh) 1998-01-23 2000-06-07 住友金属工业株式会社 阻抗－电压转换器
WO1999040447A1 (en) * 1998-02-05 1999-08-12 Sumitomo Metal Industries, Ltd. Impedance-to-voltage converter and converting method
TW418323B (en) * 1998-02-19 2001-01-11 Sumitomo Metal Ind Capacitance detection system and method
JP4124867B2 (ja) * 1998-07-14 2008-07-23 松下電器産業株式会社 変換装置
JP3501401B2 (ja) * 2000-03-07 2004-03-02 住友金属工業株式会社 インピーダンス検出回路、インピーダンス検出装置、及びインピーダンス検出方法
JP3454426B2 (ja) * 2000-07-10 2003-10-06 住友金属工業株式会社 インピーダンス検出回路及びインピーダンス検出方法
JP3501398B2 (ja) 2000-07-10 2004-03-02 住友金属工業株式会社 インピーダンス検出回路及びインピーダンス検出方法
JP2002157671A (ja) * 2000-11-16 2002-05-31 Sumitomo Metal Ind Ltd センシングシステム
ITTO20010699A1 (it) * 2001-07-17 2003-01-17 St Microelectronics Srl Metodo e circuito di rilevamento di spostamenti tramite sensori micro-elettro-meccanici con compensazione di capacita' parassite e di movime

Also Published As

Publication number Publication date
KR20040040454A (ko) 2004-05-12
EP1426772A1 (en) 2004-06-09
CN1842712A (zh) 2006-10-04
US20050035771A1 (en) 2005-02-17
CN100454028C (zh) 2009-01-21
KR100654471B1 (ko) 2006-12-05
TWI221196B (en) 2004-09-21
EP1426772B1 (en) 2008-03-12
WO2003023420A1 (fr) 2003-03-20
DE60225570D1 (de) 2008-04-24
NO20032013D0 (no) 2003-05-05
EP1426772A4 (en) 2005-08-03
US7005865B2 (en) 2006-02-28
ATE389185T1 (de) 2008-03-15
DE60225570T2 (de) 2009-04-23

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