NO320484B1 - Halvlederinnretning med passiveringsfilm - Google Patents

Halvlederinnretning med passiveringsfilm Download PDF

Info

Publication number
NO320484B1
NO320484B1 NO19974001A NO974001A NO320484B1 NO 320484 B1 NO320484 B1 NO 320484B1 NO 19974001 A NO19974001 A NO 19974001A NO 974001 A NO974001 A NO 974001A NO 320484 B1 NO320484 B1 NO 320484B1
Authority
NO
Norway
Prior art keywords
layer
sion
passivation film
si3n4
semiconductor device
Prior art date
Application number
NO19974001A
Other languages
English (en)
Norwegian (no)
Other versions
NO974001D0 (no
NO974001L (no
Inventor
Hiroyuki Seto
Shogo Yoshida
Original Assignee
Murata Manufacturing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP23153696A external-priority patent/JP3259641B2/ja
Priority claimed from JP23153596A external-priority patent/JP3246348B2/ja
Application filed by Murata Manufacturing Co filed Critical Murata Manufacturing Co
Publication of NO974001D0 publication Critical patent/NO974001D0/no
Publication of NO974001L publication Critical patent/NO974001L/no
Publication of NO320484B1 publication Critical patent/NO320484B1/no

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00—Encapsulations, e.g. protective coatings
    • H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
    • H10W74/131—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed
    • H10W74/147—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed the encapsulations being multilayered
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00—Encapsulations, e.g. protective coatings
    • H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
    • H10W74/131—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed
    • H10W74/137—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed the encapsulations being directly on the semiconductor body
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00—Encapsulations, e.g. protective coatings
    • H10W74/40—Encapsulations, e.g. protective coatings characterised by their materials
    • H10W74/43—Encapsulations, e.g. protective coatings characterised by their materials comprising oxides, nitrides or carbides, e.g. ceramics or glasses

Landscapes

  • Formation Of Insulating Films (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
NO19974001A 1996-09-02 1997-09-01 Halvlederinnretning med passiveringsfilm NO320484B1 (no)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP23153696A JP3259641B2 (ja) 1996-09-02 1996-09-02 半導体装置の保護膜構造
JP23153596A JP3246348B2 (ja) 1996-09-02 1996-09-02 半導体装置の保護膜構造

Publications (3)

Publication Number Publication Date
NO974001D0 NO974001D0 (no) 1997-09-01
NO974001L NO974001L (no) 1998-03-03
NO320484B1 true NO320484B1 (no) 2005-12-12

Family

ID=26529938

Family Applications (1)

Application Number Title Priority Date Filing Date
NO19974001A NO320484B1 (no) 1996-09-02 1997-09-01 Halvlederinnretning med passiveringsfilm

Country Status (5)

Country Link
US (1) US6388310B1 (fr)
EP (1) EP0827199A3 (fr)
KR (1) KR100370916B1 (fr)
CA (1) CA2213034C (fr)
NO (1) NO320484B1 (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2783530B1 (fr) * 1998-09-21 2001-08-31 Commissariat Energie Atomique Procede de preparation, par nitruration, d'un substrat de silicium pour la formation d'une couche isolante mince
US6946717B2 (en) * 2001-01-30 2005-09-20 M/A-Com, Inc. High voltage semiconductor device
US7012328B2 (en) * 2004-05-14 2006-03-14 Intevac, Inc. Semiconductor die attachment for high vacuum tubes
US7607560B2 (en) 2004-05-14 2009-10-27 Intevac, Inc. Semiconductor die attachment for high vacuum tubes
JP2006043813A (ja) * 2004-08-04 2006-02-16 Denso Corp 保護膜付きマイクロシステム構造体及びその製造方法
JP4898497B2 (ja) * 2006-03-27 2012-03-14 キヤノン株式会社 有機発光装置およびその製造方法
US20070262379A1 (en) * 2006-05-15 2007-11-15 Chin-Chuan Lai Metal structure of glass substrate and formation thereof
US10297557B2 (en) * 2017-06-30 2019-05-21 Sanken Electric Co., Ltd. Semiconductor device and method for manufacturing the semiconductor device
JP6846687B2 (ja) * 2017-09-12 2021-03-24 パナソニックＩｐマネジメント株式会社 半導体装置およびその製造方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4097889A (en) * 1976-11-01 1978-06-27 Rca Corporation Combination glass/low temperature deposited Siw Nx Hy O.sub.z
DE2967538D1 (en) * 1978-06-14 1985-12-05 Fujitsu Ltd Process for producing a semiconductor device having an insulating layer of silicon dioxide covered by a film of silicon oxynitride
US4438157A (en) * 1980-12-05 1984-03-20 Ncr Corporation Process for forming MNOS dual dielectric structure
JPS63184340A (ja) * 1986-09-08 1988-07-29 Nec Corp 半導体装置
JPH01187933A (ja) * 1988-01-22 1989-07-27 Mitsubishi Electric Corp 半導体装置の製造方法
JPH01228135A (ja) 1988-03-09 1989-09-12 Nec Corp 半導体装置
US4959705A (en) * 1988-10-17 1990-09-25 Ford Microelectronics, Inc. Three metal personalization of application specific monolithic microwave integrated circuit
JPH03268430A (ja) 1990-03-19 1991-11-29 Kawasaki Steel Corp 半導体装置の保護膜構造
JP2814009B2 (ja) * 1990-06-05 1998-10-22 三菱電機株式会社 半導体装置の製造方法
JPH0645316A (ja) 1992-07-23 1994-02-18 Nec Corp 半導体装置およびその製造方法
JPH0845926A (ja) * 1994-07-26 1996-02-16 Sony Corp 半導体装置およびその製造方法
US5472913A (en) * 1994-08-05 1995-12-05 Texas Instruments Incorporated Method of fabricating porous dielectric material with a passivation layer for electronics applications
US5710067A (en) * 1995-06-07 1998-01-20 Advanced Micro Devices, Inc. Silicon oxime film
US5686329A (en) * 1995-12-29 1997-11-11 Taiwan Semiconductor Manufacturing Company, Ltd. Method for forming a metal oxide semiconductor field effect transistor (MOSFET) having improved hot carrier immunity
US5869396A (en) * 1996-07-15 1999-02-09 Chartered Semiconductor Manufacturing Ltd. Method for forming a polycide gate electrode
JP3268430B2 (ja) 1997-02-26 2002-03-25 ホシデン株式会社 ジャック

Also Published As

Publication number Publication date
CA2213034A1 (fr) 1998-03-02
CA2213034C (fr) 2002-12-17
US6388310B1 (en) 2002-05-14
EP0827199A3 (fr) 2005-10-19
KR19980024277A (ko) 1998-07-06
NO974001D0 (no) 1997-09-01
KR100370916B1 (ko) 2003-03-15
EP0827199A2 (fr) 1998-03-04
NO974001L (no) 1998-03-03

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