NO893042L - Billedbehandlingssystem for besiktigelse av en gjenstand under utproevning. - Google Patents

Billedbehandlingssystem for besiktigelse av en gjenstand under utproevning.

Info

Publication number: NO893042L
Authority: NO; Norway
Prior art keywords: viewing; image processing; processing system; objects during; during trial
Prior art date: 1988-07-29

Application number

NO89893042A

Other languages

English (en)

Norwegian (no)

Other versions

NO893042D0 (no

Inventor

Brian M Hopkins

Original Assignee

Westinghouse Electric Systems

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1988-07-29

Filing date

1989-07-26

Publication date

1990-01-30

1989-07-26 Application filed by Westinghouse Electric Systems filed Critical Westinghouse Electric Systems

1989-07-26 Publication of NO893042D0 publication Critical patent/NO893042D0/no

1990-01-30 Publication of NO893042L publication Critical patent/NO893042L/no

Links

Classifications

- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10016—Video; Image sequence
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30148—Semiconductor; IC; Wafer

Landscapes

Engineering & Computer Science (AREA)
Quality & Reliability (AREA)
Computer Vision & Pattern Recognition (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Theoretical Computer Science (AREA)
Image Analysis (AREA)
Image Processing (AREA)
Length Measuring Devices By Optical Means (AREA)
Closed-Circuit Television Systems (AREA)
Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

NO89893042A 1988-07-29 1989-07-26 Billedbehandlingssystem for besiktigelse av en gjenstand under utproevning. NO893042L (no)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
IE882350A IE882350L (en)	1988-07-29	1988-07-29	Image processing system for inspecting articles

Publications (2)

Publication Number	Publication Date
NO893042D0 NO893042D0 (no)	1989-07-26
NO893042L true NO893042L (no)	1990-01-30

Family

ID=11034295

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
NO89893042A NO893042L (no)	1988-07-29	1989-07-26	Billedbehandlingssystem for besiktigelse av en gjenstand under utproevning.

Country Status (8)

Country	Link
US (1)	US4989082A (fr)
EP (1)	EP0352958A2 (fr)
JP (1)	JPH02140884A (fr)
KR (1)	KR900002088A (fr)
DK (1)	DK374789A (fr)
IE (1)	IE882350L (fr)
IL (1)	IL91104A0 (fr)
NO (1)	NO893042L (fr)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2517637B2 (ja) *	1988-02-15	1996-07-24	キヤノン株式会社	マ―ク位置検出方法及びそれが適用される装置
JP2651199B2 (ja) *	1988-06-06	1997-09-10	富士通株式会社	マスク又はレチクル用パターン自動検証装置
US5194746A (en) *	1988-12-18	1993-03-16	Coen Guenther	Method and device for examining components with data digitized into a large number of gray levels
JPH03209737A (ja) *	1990-01-11	1991-09-12	Tokyo Electron Ltd	プローブ装置
GB2249690B (en) *	1990-11-07	1994-07-06	Gec Ferranti Defence Syst	Security system
US5145432A (en) *	1991-11-27	1992-09-08	Zenith Electronics Corporation	Optical interprogation system for use in constructing flat tension shadow mask CRTS
US5237622A (en) *	1991-12-04	1993-08-17	Micron Technology, Inc.	Semiconductor pick-and-place machine automatic calibration apparatus
US5495535A (en) *	1992-01-31	1996-02-27	Orbotech Ltd	Method of inspecting articles
JP2001525074A (ja) *	1996-06-03	2001-12-04	ライカミクロスコピーズュステーメアーゲー	可動対象物の位置検出
US6304680B1 (en)	1997-10-27	2001-10-16	Assembly Guidance Systems, Inc.	High resolution, high accuracy process monitoring system
US6047084A (en) *	1997-11-18	2000-04-04	Motorola, Inc.	Method for determining accuracy of a circuit assembly process and machine employing the same
US6741743B2 (en) *	1998-07-31	2004-05-25	Prc. Inc.	Imaged document optical correlation and conversion system
IL131282A (en) *	1999-08-05	2009-02-11	Orbotech Ltd	Apparatus and methods for inspection of objects
US7095885B1 (en) *	2000-03-01	2006-08-22	Micron Technology, Inc.	Method for measuring registration of overlapping material layers of an integrated circuit
US7239399B2 (en) *	2001-11-13	2007-07-03	Cyberoptics Corporation	Pick and place machine with component placement inspection
US7555831B2 (en) *	2001-11-13	2009-07-07	Cyberoptics Corporation	Method of validating component feeder exchanges
US7813559B2 (en) *	2001-11-13	2010-10-12	Cyberoptics Corporation	Image analysis for pick and place machines with in situ component placement inspection
US7559134B2 (en) *	2003-11-04	2009-07-14	Cyberoptics Corporation	Pick and place machine with improved component placement inspection
US7706595B2 (en) *	2003-11-07	2010-04-27	Cyberoptics Corporation	Pick and place machine with workpiece motion inspection
US20050125993A1 (en) *	2003-11-07	2005-06-16	Madsen David D.	Pick and place machine with improved setup and operation procedure
US20060016066A1 (en) *	2004-07-21	2006-01-26	Cyberoptics Corporation	Pick and place machine with improved inspection
US20060075631A1 (en) *	2004-10-05	2006-04-13	Case Steven K	Pick and place machine with improved component pick up inspection
EP1655713A1 (fr) *	2004-10-29	2006-05-10	Barco N.V.	Capture asynchrone de video pour insertion dans une image de plus haute résolution
US20070003126A1 (en) *	2005-05-19	2007-01-04	Case Steven K	Method and apparatus for evaluating a component pick action in an electronics assembly machine
DE112006002473T5 (de) *	2005-09-14	2008-08-14	Cyberoptics Corp., Golden Valley	Bestückungsmaschine mit verbesserter Bauteil-Aufnahmebild-Identifizierungsverarbeitung
DE112006003019T5 (de) *	2005-10-31	2008-10-23	Cyberoptics Corp., Golden Valley	Elektronikmontagevorrichtung mit eingebauter Lötpastenprüfung
US20070276867A1 (en) *	2006-05-23	2007-11-29	David Fishbaine	Embedded inspection image archival for electronics assembly machines
TW201134317A (en) *	2010-03-29	2011-10-01	Hon Hai Prec Ind Co Ltd	Pins assignment for circuit board
JP5246255B2 (ja) *	2010-12-27	2013-07-24	日本電気株式会社	情報処理装置、ｂｉｏｓのセットアップ設定値の復旧方法、プログラム

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS58116574U (ja) *	1982-02-03	1983-08-09	株式会社コ−ジ−本舗	容器
JPS60263807A (ja) *	1984-06-12	1985-12-27	Dainippon Screen Mfg Co Ltd	プリント配線板のパタ−ン欠陥検査装置
JPS61290311A (ja) *	1985-06-19	1986-12-20	Hitachi Ltd	はんだ付部の検査装置及びその方法

1988
- 1988-07-29 IE IE882350A patent/IE882350L/xx unknown
1989
- 1989-07-19 EP EP89307316A patent/EP0352958A2/fr not_active Withdrawn
- 1989-07-25 JP JP1193800A patent/JPH02140884A/ja active Pending
- 1989-07-25 IL IL91104A patent/IL91104A0/xx unknown
- 1989-07-26 US US07/385,749 patent/US4989082A/en not_active Expired - Fee Related
- 1989-07-26 NO NO89893042A patent/NO893042L/no unknown
- 1989-07-28 DK DK374789A patent/DK374789A/da not_active Application Discontinuation
- 1989-07-28 KR KR1019890010708A patent/KR900002088A/ko not_active Withdrawn

Also Published As

Publication number	Publication date
NO893042D0 (no)	1989-07-26
JPH02140884A (ja)	1990-05-30
EP0352958A2 (fr)	1990-01-31
IL91104A0 (en)	1990-03-19
US4989082A (en)	1991-01-29
IE882350L (en)	1990-01-29
DK374789A (da)	1990-01-30
DK374789D0 (da)	1989-07-28
KR900002088A (ko)	1990-02-28

Publication	Publication Date	Title
NO893042D0 (no)	1989-07-26	Billedbehandlingssystem for besiktigelse av en gjenstand under utproevning.
EP0485293A3 (en)	1993-05-05	Image processing system
EP0598408A3 (fr)	1994-10-12	Appareil de traitement d'images.
EP0591974A3 (fr)	1995-03-22	Appareil de traitement d'images.
EP0665477A3 (fr)	1995-09-27	Appareil de lecture ou de traitement d'un image.
DE69014977D1 (de)	1995-01-26	Videoverarbeitungssystem.
EP0592120A3 (fr)	1995-08-09	Système de traitement d'images.
EP0605185A3 (en)	1994-08-24	Image processing apparatus.
EP0447269A3 (en)	1993-05-26	An image data processing system
EP0444629A3 (en)	1993-06-09	Image processing system
DE68924190D1 (de)	1995-10-19	Bildverarbeitungsmethode.
GB2257595B (en)	1995-08-09	An image processing system
GB2261803B (en)	1995-10-11	An image processing system
EP0587328A3 (fr)	1994-10-12	Système de traitement d'images.
EP0450552A3 (en)	1992-07-15	Image processing system
EP0459796A3 (en)	1993-04-21	Image processing system
EP0487330A3 (en)	1993-04-28	Image processing system
GB9026232D0 (en)	1991-01-16	Image processing system
DE69023017D1 (de)	1995-11-23	Farbbildverarbeitungssystem.
EP0587329A3 (fr)	1994-11-30	Système de traitement d'images.
GB2222052B (en)	1992-12-16	Image processing apparatus
EP0369821A3 (en)	1990-10-03	Image processing system
EP0593157A3 (fr)	1994-12-07	Dispositif de traitement d'image.
DE69003081D1 (de)	1993-10-07	Bildverarbeitungsverfahren und -system.
GB2226468B (en)	1993-08-11	Image processing system