NO914574D0 - Fremgangsmaate for detektering av pin-hull i strengestoeptemetallemner - Google Patents

Fremgangsmaate for detektering av pin-hull i strengestoeptemetallemner

Info

Publication number
NO914574D0
NO914574D0 NO914574A NO914574A NO914574D0 NO 914574 D0 NO914574 D0 NO 914574D0 NO 914574 A NO914574 A NO 914574A NO 914574 A NO914574 A NO 914574A NO 914574 D0 NO914574 D0 NO 914574D0
Authority
NO
Norway
Prior art keywords
topics
procedure
pin hole
hole detection
string metal
Prior art date
Application number
NO914574A
Other languages
English (en)
Other versions
NO914574L (no
Inventor
Karl Otto Bjoernestoel
Jan Tore Malmo
Yngve Stroem
Eiolf Vikhagen
Original Assignee
Elkem Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elkem Technology filed Critical Elkem Technology
Priority to NO91914574A priority Critical patent/NO914574L/no
Publication of NO914574D0 publication Critical patent/NO914574D0/no
Priority to JP4297189A priority patent/JPH05232044A/ja
Priority to KR1019920021750A priority patent/KR930009681A/ko
Priority to US07/979,616 priority patent/US5363901A/en
Priority to CA002083449A priority patent/CA2083449A1/en
Priority to EP92310658A priority patent/EP0543677A1/en
Priority to TW081110323A priority patent/TW224435B/zh
Publication of NO914574L publication Critical patent/NO914574L/no

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/894Pinholes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/889Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a bare video image, i.e. without visual measurement aids

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Continuous Casting (AREA)
NO91914574A 1991-11-22 1991-11-22 Fremgangsmaate for detektering av pin-hull i strengestoeptemetallemne NO914574L (no)

Priority Applications (7)

Application Number Priority Date Filing Date Title
NO91914574A NO914574L (no) 1991-11-22 1991-11-22 Fremgangsmaate for detektering av pin-hull i strengestoeptemetallemne
JP4297189A JPH05232044A (ja) 1991-11-22 1992-11-06 連続鋳造金属ビレットのピンホールを検出する方法
KR1019920021750A KR930009681A (ko) 1991-11-22 1992-11-19 연속적으로 주조한 강편에 존재하는 핀호울을 탐지하기 위한 방법
US07/979,616 US5363901A (en) 1991-11-22 1992-11-19 Method for detecting pinholes in continuously cast billets
CA002083449A CA2083449A1 (en) 1991-11-22 1992-11-20 Method for detecting pinholes in continuously cast billets
EP92310658A EP0543677A1 (en) 1991-11-22 1992-11-23 Method for detecting pinholes in continuously cast billets
TW081110323A TW224435B (no) 1991-11-22 1992-12-23

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NO91914574A NO914574L (no) 1991-11-22 1991-11-22 Fremgangsmaate for detektering av pin-hull i strengestoeptemetallemne

Publications (2)

Publication Number Publication Date
NO914574D0 true NO914574D0 (no) 1991-11-22
NO914574L NO914574L (no) 1993-05-24

Family

ID=19894618

Family Applications (1)

Application Number Title Priority Date Filing Date
NO91914574A NO914574L (no) 1991-11-22 1991-11-22 Fremgangsmaate for detektering av pin-hull i strengestoeptemetallemne

Country Status (7)

Country Link
US (1) US5363901A (no)
EP (1) EP0543677A1 (no)
JP (1) JPH05232044A (no)
KR (1) KR930009681A (no)
CA (1) CA2083449A1 (no)
NO (1) NO914574L (no)
TW (1) TW224435B (no)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5920735A (en) * 1997-01-16 1999-07-06 Gelphman; Janet L. Method and apparatus to observe the geometry of relative motion
US7460703B2 (en) * 2002-12-03 2008-12-02 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
US7324681B2 (en) 2002-12-03 2008-01-29 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
US6950546B2 (en) 2002-12-03 2005-09-27 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
CN100554242C (zh) * 2004-09-21 2009-10-28 旭化成化学株式会社 醇类副产物的工业分离方法
KR100891842B1 (ko) * 2007-08-28 2009-04-07 주식회사 포스코 원형 선재 광학결함 검출장치 및 방법
JP6136892B2 (ja) * 2013-11-27 2017-05-31 トヨタ自動車株式会社 引上式連続鋳造装置及び引上式連続鋳造方法
DE102014011268A1 (de) * 2014-07-29 2016-02-04 Brückner Maschinenbau GmbH & Co. KG Optische Fehlstellendetektion

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2758712A (en) * 1952-08-18 1956-08-14 Linderman Engineering Company Detecting apparatus
BE621843A (no) * 1961-09-05
US3715476A (en) * 1969-01-16 1973-02-06 Nippon Steel Corp Method and apparatus for detecting pinholes on sheet articles
US3781117A (en) * 1972-03-31 1973-12-25 United States Steel Corp Apparatus for surface inspection of moving material
US3795452A (en) * 1973-02-28 1974-03-05 Us Air Force Instrument for automatically inspecting integrated circuit masks for pinholes and spots
US4028728A (en) * 1976-04-02 1977-06-07 Western Electric Company, Inc. Method of and video system for identifying different light-reflective surface areas on articles
IS1094B6 (is) * 1976-12-10 1982-09-24 Ashimori Kogyo Kabushiki Kaisha, (Ashimori Industry Co., Ltd.) Tæki til að búa til nýja gerð af korklínu
US4237959A (en) * 1978-03-23 1980-12-09 Futec Inc. Method of examining the surface of a continuously cast metal strip for detection of scarfs appearing thereon and apparatus for the same
US4223346A (en) * 1979-04-05 1980-09-16 Armco Inc. Automatic defect detecting inspection apparatus
JPS57132042A (en) * 1981-02-09 1982-08-16 Fuji Electric Co Ltd Inspecting method of defect on surface of article
DE3113120C1 (de) * 1981-03-27 1982-09-30 Mannesmann AG, 4000 Düsseldorf Vorrichtung zur Inspektion von Gussstraengen in einer Stranggiessanlage
JPS5892938A (ja) * 1981-11-30 1983-06-02 Matsushita Electric Ind Co Ltd 傷測定装置
DE3200007A1 (de) * 1982-01-02 1983-07-14 Klöckner-Werke AG, 4100 Duisburg Verfahren und vorrichtung zum pruefen von metallischen proben fuer die spektralanalytische untersuchung
CH656466A5 (de) * 1982-02-15 1986-06-30 Alusuisse Verfahren und vorrichtung zur oberflaechenkontrolle eines werkstoffes.
FR2528740A1 (fr) * 1982-06-18 1983-12-23 Clesid Sa Dispositif de controle de la coulee continue de l'acier
JPS60146134A (ja) * 1984-01-11 1985-08-01 Matsushita Electric Ind Co Ltd 表面疵検出用照明装置
CA1229392A (en) * 1984-02-28 1987-11-17 Hirosato Yamane Method and apparatus for detection of surface defects of hot metal body
JPH0676960B2 (ja) * 1984-12-12 1994-09-28 株式会社日立製作所 繰返し荷重を受ける機械構造物の余寿命評価方法およびその装置
JPS6330164A (ja) * 1986-07-22 1988-02-08 Kubota Ltd 連続鋳造における鋳造欠陥の検出方法
DE3810349A1 (de) * 1988-03-26 1989-10-05 Agfa Gevaert Ag Verfahren sowie anordnung zur darstellung von oberflaechenfehlern an aufzeichnungstraegern
IL91492A (en) * 1988-10-03 1994-07-31 Hughes Aircraft Co Optical inspection system for soldering joints and inspection method
EP0370527B1 (en) * 1988-11-24 1994-02-02 Omron Tateisi Electronics Co. Method of and apparatus for inspecting substrate
JPH0739025B2 (ja) * 1988-11-30 1995-05-01 川崎製鉄株式会社 急冷合金薄帯のオンライン検査方法
JP3072998B2 (ja) * 1990-04-18 2000-08-07 株式会社日立製作所 はんだ付け状態検査方法及びその装置

Also Published As

Publication number Publication date
TW224435B (no) 1994-06-01
JPH05232044A (ja) 1993-09-07
KR930009681A (ko) 1993-06-21
US5363901A (en) 1994-11-15
EP0543677A1 (en) 1993-05-26
CA2083449A1 (en) 1993-05-23
NO914574L (no) 1993-05-24

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