NO961303L - Fremgangsmåte og anordning for å teste en integrert krets - Google Patents

Fremgangsmåte og anordning for å teste en integrert krets

Info

Publication number: NO961303L
Authority: NO; Norway
Prior art keywords: integrated circuit; test; testing; test device; circuit
Prior art date: 1993-10-01

Application number

NO961303A

Other languages

English (en)

Norwegian (no)

Other versions

NO961303D0 (no

Inventor

Olli Piirainen

Original Assignee

Nokia Telecommunications Oy

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1993-10-01

Filing date

1996-03-29

Publication date

1996-05-29

1996-03-29 Application filed by Nokia Telecommunications Oy filed Critical Nokia Telecommunications Oy

1996-03-29 Publication of NO961303D0 publication Critical patent/NO961303D0/no

1996-05-29 Publication of NO961303L publication Critical patent/NO961303L/no

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318555—Control logic

Landscapes

Engineering & Computer Science (AREA)
General Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Semiconductor Integrated Circuits (AREA)
Tests Of Electronic Circuits (AREA)
Design And Manufacture Of Integrated Circuits (AREA)
Particle Accelerators (AREA)
Video Image Reproduction Devices For Color Tv Systems (AREA)
Alarm Systems (AREA)
Test And Diagnosis Of Digital Computers (AREA)

NO961303A 1993-10-01 1996-03-29 Fremgangsmåte og anordning for å teste en integrert krets NO961303L (no)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
FI934327A FI100136B (fi)	1993-10-01	1993-10-01	Menetelmä integroidun piirin testaamiseksi sekä integroitu piiri
PCT/FI1994/000439 WO1995010048A1 (en)	1993-10-01	1994-09-30	A method and device for testing of an integrated circuit

Publications (2)

Publication Number	Publication Date
NO961303D0 NO961303D0 (no)	1996-03-29
NO961303L true NO961303L (no)	1996-05-29

Family

ID=8538699

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
NO961303A NO961303L (no)	1993-10-01	1996-03-29	Fremgangsmåte og anordning for å teste en integrert krets

Country Status (10)

Country	Link
US (1)	US5786703A (ja)
EP (1)	EP0721591B1 (ja)
JP (1)	JPH09503302A (ja)
CN (1)	CN1052308C (ja)
AT (1)	ATE282210T1 (ja)
AU (1)	AU681698B2 (ja)
DE (1)	DE69434129D1 (ja)
FI (1)	FI100136B (ja)
NO (1)	NO961303L (ja)
WO (1)	WO1995010048A1 (ja)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US6522985B1 (en) *	1989-07-31	2003-02-18	Texas Instruments Incorporated	Emulation devices, systems and methods utilizing state machines
US6229296B1 (en)	1996-02-27	2001-05-08	Micron Technology, Inc.	Circuit and method for measuring and forcing an internal voltage of an integrated circuit
US5977763A (en) *	1996-02-27	1999-11-02	Micron Technology, Inc.	Circuit and method for measuring and forcing an internal voltage of an integrated circuit
JPH11108998A (ja) *	1997-10-02	1999-04-23	Mitsubishi Electric Corp	集積回路のテスト装置
US5991910A (en) *	1997-10-29	1999-11-23	Microchip Technology Incorporated	Microcontroller having special mode enable detection circuitry and a method of operation therefore
US6946863B1 (en)	1998-02-27	2005-09-20	Micron Technology, Inc.	Circuit and method for measuring and forcing an internal voltage of an integrated circuit
KR20050084395A (ko) *	2002-12-20	2005-08-26	코닌클리즈케 필립스 일렉트로닉스 엔.브이.	테스트 액세스 포트 제어기 커플링 방법 및 집적회로
US7274203B2 (en) *	2005-10-25	2007-09-25	Freescale Semiconductor, Inc.	Design-for-test circuit for low pin count devices
CN101135718B (zh) *	2007-09-10	2010-06-02	中兴通讯股份有限公司	一种驱动器电路
US8839063B2 (en) *	2013-01-24	2014-09-16	Texas Instruments Incorporated	Circuits and methods for dynamic allocation of scan test resources
US9500700B1 (en) *	2013-11-15	2016-11-22	Xilinx, Inc.	Circuits for and methods of testing the operation of an input/output port
CN108957283B (zh) *	2017-05-19	2021-08-03	龙芯中科技术股份有限公司	辐照实验板、监控终端、asic芯片辐照实验系统
US11567121B2 (en) *	2020-03-31	2023-01-31	Texas Instruments Incorporated	Integrated circuit with embedded testing circuitry

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4479088A (en) *	1981-01-16	1984-10-23	Burroughs Corporation	Wafer including test lead connected to ground for testing networks thereon
DE3526485A1 (de) *	1985-07-24	1987-02-05	Heinz Krug	Schaltungsanordnung zum pruefen integrierter schaltungseinheiten
US4817093A (en) *	1987-06-18	1989-03-28	International Business Machines Corporation	Method of partitioning, testing and diagnosing a VLSI multichip package and associated structure
US5053700A (en) *	1989-02-14	1991-10-01	Amber Engineering, Inc.	Method for wafer scale testing of redundant integrated circuit dies
JP2561164B2 (ja) *	1990-02-26	1996-12-04	三菱電機株式会社	半導体集積回路
EP0514700B1 (en) *	1991-05-23	1998-07-29	MOTOROLA GmbH	An implementation of the IEEE 1149.1 boundary-scan architecture
JP2741119B2 (ja) *	1991-09-17	1998-04-15	三菱電機株式会社	バイパススキャンパスおよびそれを用いた集積回路装置
US5241266A (en) *	1992-04-10	1993-08-31	Micron Technology, Inc.	Built-in test circuit connection for wafer level burnin and testing of individual dies

1993
- 1993-10-01 FI FI934327A patent/FI100136B/fi active
1994
- 1994-09-30 AT AT94927686T patent/ATE282210T1/de not_active IP Right Cessation
- 1994-09-30 AU AU77008/94A patent/AU681698B2/en not_active Ceased
- 1994-09-30 DE DE69434129T patent/DE69434129D1/de not_active Expired - Lifetime
- 1994-09-30 JP JP7510625A patent/JPH09503302A/ja not_active Ceased
- 1994-09-30 WO PCT/FI1994/000439 patent/WO1995010048A1/en not_active Ceased
- 1994-09-30 EP EP94927686A patent/EP0721591B1/en not_active Expired - Lifetime
- 1994-09-30 CN CN94193616.3A patent/CN1052308C/zh not_active Expired - Fee Related
- 1994-09-30 US US08/624,423 patent/US5786703A/en not_active Expired - Lifetime
1996
- 1996-03-29 NO NO961303A patent/NO961303L/no not_active Application Discontinuation

Also Published As

Publication number	Publication date
AU7700894A (en)	1995-05-01
ATE282210T1 (de)	2004-11-15
JPH09503302A (ja)	1997-03-31
FI934327A0 (fi)	1993-10-01
DE69434129D1 (de)	2004-12-16
CN1052308C (zh)	2000-05-10
EP0721591A1 (en)	1996-07-17
US5786703A (en)	1998-07-28
CN1132554A (zh)	1996-10-02
WO1995010048A1 (en)	1995-04-13
FI100136B (fi)	1997-09-30
NO961303D0 (no)	1996-03-29
FI934327A7 (fi)	1995-04-02
EP0721591B1 (en)	2004-11-10
AU681698B2 (en)	1997-09-04

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Legal Events

Date	Code	Title	Description
2003-04-14	FC2A	Withdrawal, rejection or dismissal of laid open patent application