PH12021551623A1 - Analysis apparatus, analysis method, and program - Google Patents

Analysis apparatus, analysis method, and program

Info

Publication number
PH12021551623A1
PH12021551623A1 PH1/2021/551623A PH12021551623A PH12021551623A1 PH 12021551623 A1 PH12021551623 A1 PH 12021551623A1 PH 12021551623 A PH12021551623 A PH 12021551623A PH 12021551623 A1 PH12021551623 A1 PH 12021551623A1
Authority
PH
Philippines
Prior art keywords
analysis
program
discriminator
production facility
unit
Prior art date
Application number
PH1/2021/551623A
Other languages
English (en)
Inventor
Yasuyuki FUKUTA
Yasuharu Onishi
Original Assignee
Nec Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nec Corp filed Critical Nec Corp
Publication of PH12021551623A1 publication Critical patent/PH12021551623A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H1/00—Measuring characteristics of vibrations in solids by using direct conduction to the detector
    • G01H1/12—Measuring characteristics of vibrations in solids by using direct conduction to the detector of longitudinal or not specified vibrations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H17/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves, not provided for in the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M99/00—Subject matter not provided for in other groups of this subclass
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/20—Analysis of motion

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Software Systems (AREA)
  • Data Mining & Analysis (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Artificial Intelligence (AREA)
  • Multimedia (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
PH1/2021/551623A 2019-02-05 2020-02-04 Analysis apparatus, analysis method, and program PH12021551623A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019019068 2019-02-05
PCT/JP2020/004042 WO2020162425A1 (fr) 2019-02-05 2020-02-04 Dispositif d'analyse, procédé d'analyse et programme

Publications (1)

Publication Number Publication Date
PH12021551623A1 true PH12021551623A1 (en) 2022-04-18

Family

ID=71947695

Family Applications (1)

Application Number Title Priority Date Filing Date
PH1/2021/551623A PH12021551623A1 (en) 2019-02-05 2020-02-04 Analysis apparatus, analysis method, and program

Country Status (6)

Country Link
JP (1) JP7188463B2 (fr)
KR (1) KR20210107844A (fr)
CN (1) CN113383216A (fr)
PH (1) PH12021551623A1 (fr)
TW (1) TW202045898A (fr)
WO (1) WO2020162425A1 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022053036A (ja) * 2020-09-24 2022-04-05 国立大学法人大阪大学 劣化状況予測システム、および劣化状況予測方法
JP7581063B2 (ja) * 2021-01-25 2024-11-12 株式会社日本製鋼所 コンピュータプログラム、異常検知方法、異常検知装置、成形機システム及び学習モデル生成方法
JP7647480B2 (ja) * 2021-10-01 2025-03-18 株式会社デンソー 騒音要因判定装置、及び騒音要因判定方法
JP2023083737A (ja) * 2021-12-06 2023-06-16 Ｉｈｉ運搬機械株式会社 ベルトコンベヤの異常検出装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3170076B2 (ja) * 1992-12-18 2001-05-28 株式会社小野測器 転がり軸受故障診断装置
JP2000321176A (ja) * 1999-05-17 2000-11-24 Mitsui Eng & Shipbuild Co Ltd 異常検知方法および装置
JP4862708B2 (ja) * 2007-03-19 2012-01-25 Ｊｆｅスチール株式会社 劣化度診断方法、劣化度診断装置、および劣化診断プログラム
JP2011107093A (ja) 2009-11-20 2011-06-02 Jx Nippon Oil & Energy Corp 振動体の異常診断装置及び異常診断方法
CN102494882B (zh) * 2011-11-30 2013-11-06 中国神华能源股份有限公司 矿用振动筛弹簧在线监测与故障诊断装置及其方法
JP6877978B2 (ja) 2016-12-06 2021-05-26 日本電気通信システム株式会社 学習装置、学習方法およびプログラム
JP6914084B2 (ja) * 2017-04-10 2021-08-04 株式会社デンソーテン ノック制御装置、ノック適合方法およびノック適合プログラム
WO2018216258A1 (fr) * 2017-05-25 2018-11-29 日本電気株式会社 Dispositif de traitement, procédé de traitement et programme
CN107560849B (zh) * 2017-08-04 2020-02-18 华北电力大学 多通道深度卷积神经网络的风电机组轴承故障诊断方法
CN108896296A (zh) * 2018-04-18 2018-11-27 北京信息科技大学 一种基于卷积神经网络的风电齿轮箱故障诊断方法

Also Published As

Publication number Publication date
KR20210107844A (ko) 2021-09-01
WO2020162425A1 (fr) 2020-08-13
JP7188463B2 (ja) 2022-12-13
CN113383216A (zh) 2021-09-10
TW202045898A (zh) 2020-12-16
JPWO2020162425A1 (ja) 2021-12-09

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