PL2132770T3 - Sposób realizowania zlokalizowanych powłok - Google Patents

Sposób realizowania zlokalizowanych powłok

Info

Publication number
PL2132770T3
PL2132770T3 PL08735767T PL08735767T PL2132770T3 PL 2132770 T3 PL2132770 T3 PL 2132770T3 PL 08735767 T PL08735767 T PL 08735767T PL 08735767 T PL08735767 T PL 08735767T PL 2132770 T3 PL2132770 T3 PL 2132770T3
Authority
PL
Poland
Prior art keywords
mask
cavity
substrate
outline
implement localized
Prior art date
Application number
PL08735767T
Other languages
English (en)
Inventor
Bruno Remiat
Laurent Vandroux
Florent Souche
Original Assignee
Commissariat Energie Atomique
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat Energie Atomique filed Critical Commissariat Energie Atomique
Publication of PL2132770T3 publication Critical patent/PL2132770T3/pl

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
    • H10P76/40—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising inorganic materials
    • H10P76/403—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising inorganic materials for lift-off processes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
    • H10P76/20—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials

Landscapes

  • Drying Of Semiconductors (AREA)
  • Chemical Vapour Deposition (AREA)
  • Weting (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
  • Photovoltaic Devices (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
  • Paper (AREA)
  • Ultra Sonic Daignosis Equipment (AREA)
PL08735767T 2007-04-03 2008-04-03 Sposób realizowania zlokalizowanych powłok PL2132770T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR0754249A FR2914781B1 (fr) 2007-04-03 2007-04-03 Procede de realisation de depots localises
PCT/EP2008/054022 WO2008125511A1 (fr) 2007-04-03 2008-04-03 Procede de realisation de depots localises
EP08735767A EP2132770B1 (fr) 2007-04-03 2008-04-03 Procede de realisation de depots localises

Publications (1)

Publication Number Publication Date
PL2132770T3 true PL2132770T3 (pl) 2012-03-30

Family

ID=38666962

Family Applications (1)

Application Number Title Priority Date Filing Date
PL08735767T PL2132770T3 (pl) 2007-04-03 2008-04-03 Sposób realizowania zlokalizowanych powłok

Country Status (8)

Country Link
US (1) US8815108B2 (pl)
EP (1) EP2132770B1 (pl)
JP (1) JP5283687B2 (pl)
AT (1) ATE528788T1 (pl)
ES (1) ES2374565T3 (pl)
FR (1) FR2914781B1 (pl)
PL (1) PL2132770T3 (pl)
WO (1) WO2008125511A1 (pl)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5340103B2 (ja) * 2009-09-30 2013-11-13 東京エレクトロン株式会社 太陽電池
US9121237B2 (en) 2011-07-28 2015-09-01 Baker Hughes Incorporated Methods of coating wellbore tools and components having such coatings
JP6179900B2 (ja) 2012-03-30 2017-08-16 パナソニックＩｐマネジメント株式会社 太陽電池及びその製造方法
US8728951B2 (en) 2012-07-31 2014-05-20 Varian Semiconductor Equipment Associates, Inc. Method and system for ion-assisted processing
TWI501292B (zh) * 2012-09-26 2015-09-21 財團法人工業技術研究院 形成圖案化摻雜區的方法
JP5867467B2 (ja) * 2013-09-03 2016-02-24 トヨタ自動車株式会社 半導体装置の製造方法
WO2019138613A1 (ja) * 2018-01-09 2019-07-18 株式会社カネカ 太陽電池の製造方法
WO2019163646A1 (ja) * 2018-02-23 2019-08-29 株式会社カネカ 太陽電池の製造方法
WO2020022044A1 (ja) * 2018-07-25 2020-01-30 株式会社カネカ 太陽電池の製造方法
CN114426255B (zh) * 2020-10-28 2025-03-04 中国科学技术大学 一种微纳米结构定点缺陷掺杂的方法及nv色心传感器
CN113766412B (zh) * 2021-11-05 2022-02-15 绍兴中芯集成电路制造股份有限公司 具有弧形底角的凹槽的制备方法、mems麦克风的制备方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8004573A (nl) * 1979-09-19 1981-03-23 Gen Electric Werkwijze voor het vervaardigen van samengestelde voorwerpen.
JPS6167918A (ja) * 1984-09-11 1986-04-08 Ricoh Co Ltd リフトオフ方法
US4614564A (en) * 1984-12-04 1986-09-30 The United States Of America As Represented By The United States Department Of Energy Process for selectively patterning epitaxial film growth on a semiconductor substrate
US4597160A (en) * 1985-08-09 1986-07-01 Rca Corporation Method of fabricating a polysilicon transistor with a high carrier mobility
US5554488A (en) * 1994-07-28 1996-09-10 Northern Telecom Limited Semiconductor device structure and method of formation thereof
US5550405A (en) * 1994-12-21 1996-08-27 Advanced Micro Devices, Incorporated Processing techniques for achieving production-worthy, low dielectric, low interconnect resistance and high performance ICS
JP4056588B2 (ja) * 1996-11-06 2008-03-05 富士通株式会社 半導体装置及びその製造方法
JP2000077336A (ja) * 1998-08-28 2000-03-14 Sony Corp 半導体成長用基板およびその製造方法ならびに半導体装置
JP2002025935A (ja) * 2000-07-11 2002-01-25 Advantest Corp 導体部材形成方法、パターン形成方法

Also Published As

Publication number Publication date
US20100258524A1 (en) 2010-10-14
FR2914781B1 (fr) 2009-11-20
ES2374565T3 (es) 2012-02-17
FR2914781A1 (fr) 2008-10-10
WO2008125511A1 (fr) 2008-10-23
EP2132770A1 (fr) 2009-12-16
US8815108B2 (en) 2014-08-26
ATE528788T1 (de) 2011-10-15
EP2132770B1 (fr) 2011-10-12
JP2010532817A (ja) 2010-10-14
JP5283687B2 (ja) 2013-09-04

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