PL2453226T3 - System i sposób obrazowania promieniowaniem rentgenowskim w ciemnym polu - Google Patents
System i sposób obrazowania promieniowaniem rentgenowskim w ciemnym poluInfo
- Publication number
- PL2453226T3 PL2453226T3 PL10796655T PL10796655T PL2453226T3 PL 2453226 T3 PL2453226 T3 PL 2453226T3 PL 10796655 T PL10796655 T PL 10796655T PL 10796655 T PL10796655 T PL 10796655T PL 2453226 T3 PL2453226 T3 PL 2453226T3
- Authority
- PL
- Poland
- Prior art keywords
- imaging system
- field imaging
- ray dark
- dark
- ray
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20075—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring interferences of X-rays, e.g. Borrmann effect
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/061—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements characterised by a multilayer structure
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
- G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Nanotechnology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Radiology & Medical Imaging (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009100886628A CN101943668B (zh) | 2009-07-07 | 2009-07-07 | X射线暗场成像系统和方法 |
| EP10796655.8A EP2453226B1 (en) | 2009-07-07 | 2010-07-06 | X-ray dark-field imaging system and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| PL2453226T3 true PL2453226T3 (pl) | 2017-06-30 |
Family
ID=43428751
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PL10796655T PL2453226T3 (pl) | 2009-07-07 | 2010-07-06 | System i sposób obrazowania promieniowaniem rentgenowskim w ciemnym polu |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8515002B2 (pl) |
| EP (1) | EP2453226B1 (pl) |
| CN (1) | CN101943668B (pl) |
| PL (1) | PL2453226T3 (pl) |
| WO (1) | WO2011003278A1 (pl) |
Families Citing this family (56)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1879020A1 (en) * | 2006-07-12 | 2008-01-16 | Paul Scherrer Institut | X-ray interferometer for phase contrast imaging |
| CN102221565B (zh) | 2010-04-19 | 2013-06-12 | 清华大学 | X射线源光栅步进成像系统与成像方法 |
| DE102010027596B4 (de) * | 2010-07-19 | 2015-04-23 | Siemens Aktiengesellschaft | Verwendung eines Gitters in einem Phasenkontrast-Röntgensystem und Phasenkontrast-Röntgensystem |
| JP2012095865A (ja) * | 2010-11-02 | 2012-05-24 | Fujifilm Corp | 放射線撮影装置、放射線撮影システム |
| JP5150711B2 (ja) * | 2010-12-07 | 2013-02-27 | 富士フイルム株式会社 | 放射線撮影装置及び放射線撮影システム |
| EP2822468B1 (en) * | 2012-03-05 | 2017-11-01 | University Of Rochester | Methods and apparatus for differential phase-contrast cone-beam ct and hybrid cone-beam ct |
| CN103364839B (zh) * | 2012-04-01 | 2015-12-09 | 中国科学院高能物理研究所 | 基于光栅剪切成像的安检设备及方法 |
| WO2013171657A1 (en) | 2012-05-14 | 2013-11-21 | Koninklijke Philips N.V. | Dark field computed tomography imaging |
| WO2014001975A2 (en) * | 2012-06-27 | 2014-01-03 | Koninklijke Philips N.V. | Grating-based differential phase contrast imaging |
| EP2867655B1 (en) * | 2012-06-27 | 2019-05-08 | Koninklijke Philips N.V. | Dark-field imaging |
| US9001967B2 (en) * | 2012-12-28 | 2015-04-07 | Carestream Health, Inc. | Spectral grating-based differential phase contrast system for medical radiographic imaging |
| US9700267B2 (en) | 2012-12-21 | 2017-07-11 | Carestream Health, Inc. | Method and apparatus for fabrication and tuning of grating-based differential phase contrast imaging system |
| US9907524B2 (en) | 2012-12-21 | 2018-03-06 | Carestream Health, Inc. | Material decomposition technique using x-ray phase contrast imaging system |
| US9724063B2 (en) | 2012-12-21 | 2017-08-08 | Carestream Health, Inc. | Surrogate phantom for differential phase contrast imaging |
| US9357975B2 (en) | 2013-12-30 | 2016-06-07 | Carestream Health, Inc. | Large FOV phase contrast imaging based on detuned configuration including acquisition and reconstruction techniques |
| US10578563B2 (en) | 2012-12-21 | 2020-03-03 | Carestream Health, Inc. | Phase contrast imaging computed tomography scanner |
| US10096098B2 (en) | 2013-12-30 | 2018-10-09 | Carestream Health, Inc. | Phase retrieval from differential phase contrast imaging |
| US9494534B2 (en) | 2012-12-21 | 2016-11-15 | Carestream Health, Inc. | Material differentiation with phase contrast imaging |
| US9217719B2 (en) * | 2013-01-10 | 2015-12-22 | Novaray Medical, Inc. | Method and apparatus for improved sampling resolution in X-ray imaging systems |
| GB201311091D0 (en) * | 2013-06-21 | 2013-08-07 | Ucl Business Plc | X-Ray imaging |
| CN109115816A (zh) * | 2014-02-14 | 2019-01-01 | 佳能株式会社 | X射线Talbot干涉仪和X射线Talbot干涉仪系统 |
| DE102014203811B4 (de) * | 2014-03-03 | 2019-07-11 | Siemens Healthcare Gmbh | Ergänzungssystem zur interferometrischen Röntgenbildgebung und projektive Röntgenvorrichtung |
| JP2015166676A (ja) * | 2014-03-03 | 2015-09-24 | キヤノン株式会社 | Ｘ線撮像システム |
| CN106659449B (zh) | 2014-08-13 | 2020-11-24 | 皇家飞利浦有限公司 | 断层摄影中的定量暗场成像 |
| CN106456083B (zh) | 2014-10-13 | 2018-06-08 | 皇家飞利浦有限公司 | 用于对可移动对象进行相位衬度和/或暗场成像的光栅设备 |
| CN105606633B (zh) | 2014-11-04 | 2019-03-19 | 清华大学 | X射线相衬成像系统与成像方法 |
| CN105628718A (zh) | 2014-11-04 | 2016-06-01 | 同方威视技术股份有限公司 | 多能谱x射线光栅成像系统与成像方法 |
| JP6451400B2 (ja) * | 2015-02-26 | 2019-01-16 | コニカミノルタ株式会社 | 画像処理システム及び画像処理装置 |
| CN106153646B (zh) * | 2015-04-08 | 2022-06-24 | 清华大学 | X射线成像系统和方法 |
| US11116465B2 (en) | 2015-09-16 | 2021-09-14 | Koninklijke Philips N.V. | Dark-field enhanced virtual x-ray colonoscopy |
| JP6613988B2 (ja) * | 2016-03-30 | 2019-12-04 | コニカミノルタ株式会社 | 放射線撮影システム |
| CN105852895B (zh) * | 2016-04-29 | 2018-07-31 | 合肥工业大学 | 单次曝光的硬x射线光栅干涉仪的信息提取方法 |
| CN107481914B (zh) * | 2016-06-08 | 2023-06-06 | 清华大学 | 一种透射型低能量电子显微系统 |
| CN107473179B (zh) * | 2016-06-08 | 2019-04-23 | 清华大学 | 一种表征二维纳米材料的方法 |
| EP3258253A1 (en) * | 2016-06-13 | 2017-12-20 | Technische Universität München | X-ray tensor tomography system |
| US10809210B2 (en) * | 2016-11-22 | 2020-10-20 | Shimadzu Corporation | X-ray phase imaging apparatus |
| US10923243B2 (en) * | 2016-12-15 | 2021-02-16 | Koninklijke Philips N.V. | Grating structure for x-ray imaging |
| JP6673188B2 (ja) * | 2016-12-26 | 2020-03-25 | 株式会社島津製作所 | Ｘ線位相撮影装置 |
| JP6753342B2 (ja) * | 2017-03-15 | 2020-09-09 | 株式会社島津製作所 | 放射線格子検出器およびｘ線検査装置 |
| JP6844461B2 (ja) * | 2017-07-20 | 2021-03-17 | 株式会社島津製作所 | Ｘ線位相イメージング装置および情報取得手法 |
| EP3435325A1 (en) | 2017-07-26 | 2019-01-30 | Koninklijke Philips N.V. | Scatter correction for dark field imaging |
| JP6943090B2 (ja) * | 2017-09-05 | 2021-09-29 | 株式会社島津製作所 | Ｘ線イメージング装置 |
| CN107607560B (zh) * | 2017-09-22 | 2021-06-25 | 上海联影医疗科技股份有限公司 | 一种光学相位衬度成像系统、方法及计算机可读媒质 |
| US11013482B2 (en) * | 2017-10-31 | 2021-05-25 | Shimadzu Corporation | Phase contrast X-ray imaging system |
| EP3494885A1 (en) * | 2017-12-07 | 2019-06-12 | Koninklijke Philips N.V. | Apparatus for presentation of dark field x-ray image information |
| EP3496109A1 (en) * | 2017-12-08 | 2019-06-12 | Koninklijke Philips N.V. | Oscillatory dark-field imaging |
| CN108169258A (zh) * | 2017-12-14 | 2018-06-15 | 上海海洋大学 | 一种用于含骨鱼肉片的检测器移动型检测设备及方法 |
| US11154270B2 (en) * | 2018-01-19 | 2021-10-26 | Shimadzu Corporation | X-ray imaging apparatus |
| CN108680589B (zh) * | 2018-05-31 | 2021-07-16 | 北京航空航天大学 | 基于横向错位光栅的三维锥束计算机层析成像方法及装置 |
| WO2019239624A1 (ja) * | 2018-06-15 | 2019-12-19 | 株式会社島津製作所 | Ｘ線イメージング装置 |
| EP3603515A1 (en) * | 2018-08-01 | 2020-02-05 | Koninklijke Philips N.V. | Apparatus for generating x-ray imaging data |
| CN113171116A (zh) * | 2021-01-18 | 2021-07-27 | 深圳市第二人民医院(深圳市转化医学研究院) | 一种用于检测软组织异物的多模态x射线成像设备及其方法 |
| CN113866195B (zh) * | 2021-11-23 | 2023-07-18 | 合肥工业大学 | 一种x射线光栅干涉仪成像的多衬度信号提取方法 |
| CN115412689B (zh) * | 2022-07-26 | 2023-04-25 | 瀚湄信息科技(上海)有限公司 | 一种基于动态标定的暗场噪音处理方法、装置和电子设备 |
| CN120195197A (zh) * | 2023-12-21 | 2025-06-24 | 清华大学 | 辐射成像设备和方法 |
| CN120189140A (zh) * | 2023-12-21 | 2025-06-24 | 清华大学 | 辐射成像设备、ct成像设备及其方法 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7046757B1 (en) * | 2005-04-18 | 2006-05-16 | Siemens Medical Solutions Usa, Inc. | X-ray scatter elimination by frequency shifting |
| CN101044987A (zh) * | 2006-02-01 | 2007-10-03 | 西门子公司 | 产生投影的和断层造影的相位对比照片的x射线ct系统 |
| EP1879020A1 (en) * | 2006-07-12 | 2008-01-16 | Paul Scherrer Institut | X-ray interferometer for phase contrast imaging |
| CN201191275Y (zh) * | 2007-11-23 | 2009-02-04 | 同方威视技术股份有限公司 | 一种x射线光栅相衬成像系统 |
| WO2009076700A1 (en) | 2007-12-14 | 2009-06-25 | Commonwealth Scientific And Industrial Research Organisation | Phase-contrast imaging method and apparatus |
| DE102008048683A1 (de) * | 2008-09-24 | 2010-04-08 | Siemens Aktiengesellschaft | Verfahren zur Bestimmung von Phase und/oder Amplitude zwischen interferierenden benachbarten Röntgenstrahlen in einem Detektorpixel bei einem Talbot-Interferometer |
| JP5174180B2 (ja) * | 2008-10-29 | 2013-04-03 | キヤノン株式会社 | Ｘ線撮像装置およびｘ線撮像方法 |
| US7949095B2 (en) * | 2009-03-02 | 2011-05-24 | University Of Rochester | Methods and apparatus for differential phase-contrast fan beam CT, cone-beam CT and hybrid cone-beam CT |
| JP2010236986A (ja) * | 2009-03-31 | 2010-10-21 | Fujifilm Corp | 放射線位相画像撮影装置 |
| JP2010253194A (ja) * | 2009-04-28 | 2010-11-11 | Fujifilm Corp | 放射線位相画像撮影装置 |
-
2009
- 2009-07-07 CN CN2009100886628A patent/CN101943668B/zh active Active
-
2010
- 2010-07-06 EP EP10796655.8A patent/EP2453226B1/en active Active
- 2010-07-06 WO PCT/CN2010/001010 patent/WO2011003278A1/zh not_active Ceased
- 2010-07-06 PL PL10796655T patent/PL2453226T3/pl unknown
- 2010-07-06 US US13/147,952 patent/US8515002B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| WO2011003278A1 (zh) | 2011-01-13 |
| EP2453226B1 (en) | 2016-10-26 |
| EP2453226A1 (en) | 2012-05-16 |
| US20110293064A1 (en) | 2011-12-01 |
| EP2453226A4 (en) | 2014-10-29 |
| CN101943668A (zh) | 2011-01-12 |
| CN101943668B (zh) | 2013-03-27 |
| US8515002B2 (en) | 2013-08-20 |
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