PL363131A1 - System designed to detect electrons in scanning electron microscope - Google Patents
System designed to detect electrons in scanning electron microscopeInfo
- Publication number
- PL363131A1 PL363131A1 PL03363131A PL36313103A PL363131A1 PL 363131 A1 PL363131 A1 PL 363131A1 PL 03363131 A PL03363131 A PL 03363131A PL 36313103 A PL36313103 A PL 36313103A PL 363131 A1 PL363131 A1 PL 363131A1
- Authority
- PL
- Poland
- Prior art keywords
- electron microscope
- scanning electron
- system designed
- detect electrons
- electrons
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/244—Detectors; Associated components or circuits therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/2443—Scintillation detectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/24435—Microchannel plates
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PL363131A PL208151B1 (en) | 2003-10-27 | 2003-10-27 | System designed to detect electrons in scanning electron microscope |
| PCT/PL2004/000079 WO2005041243A1 (en) | 2003-10-27 | 2004-10-06 | Electron detection system for a scanning electron microscope |
| EP04775185A EP1678734A1 (en) | 2003-10-27 | 2004-10-06 | Electron detection system for a scanning electron microscope |
| US11/410,208 US7531812B2 (en) | 2003-10-27 | 2006-04-25 | Method and system for the directional detection of electrons in a scanning electron microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PL363131A PL208151B1 (en) | 2003-10-27 | 2003-10-27 | System designed to detect electrons in scanning electron microscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| PL363131A1 true PL363131A1 (en) | 2005-05-02 |
| PL208151B1 PL208151B1 (en) | 2011-03-31 |
Family
ID=34511363
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PL363131A PL208151B1 (en) | 2003-10-27 | 2003-10-27 | System designed to detect electrons in scanning electron microscope |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP1678734A1 (en) |
| PL (1) | PL208151B1 (en) |
| WO (1) | WO2005041243A1 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| PL217173B1 (en) * | 2008-07-14 | 2014-06-30 | Politechnika Wroclawska | System for detection of electrones and scanning electrone microscope |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5990483A (en) * | 1997-10-06 | 1999-11-23 | El-Mul Technologies Ltd. | Particle detection and particle detector devices |
| WO1999046797A1 (en) * | 1998-03-10 | 1999-09-16 | Erik Essers | Scanning electron microscope |
| DE60105199T2 (en) * | 2000-12-22 | 2005-08-11 | Fei Co., Hillsboro | SEM WITH A SECONDARY ELECTRODE DETECTOR WITH A CENTRAL ELECTRODE |
-
2003
- 2003-10-27 PL PL363131A patent/PL208151B1/en unknown
-
2004
- 2004-10-06 WO PCT/PL2004/000079 patent/WO2005041243A1/en not_active Ceased
- 2004-10-06 EP EP04775185A patent/EP1678734A1/en not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| PL208151B1 (en) | 2011-03-31 |
| EP1678734A1 (en) | 2006-07-12 |
| WO2005041243A1 (en) | 2005-05-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| GB2401461B (en) | Self scanning system with enhanced features | |
| GB0100319D0 (en) | Scanning microscope | |
| EP1880540A4 (en) | Scanning systems and methods | |
| AU2002356461A1 (en) | Improved scanning probe microscope | |
| AU2003242859A1 (en) | Scanning probe microscope | |
| AU2003257990A8 (en) | Improved method and system for scanning apertureless fluorescence microscope | |
| GB2374723B (en) | Scanning electron microscope | |
| IL150056A0 (en) | Low-pressure chamber for scanning electron microscopy in a wet environment | |
| AU2003296941A8 (en) | Electron beam sensor | |
| IL163568A0 (en) | Sample dimension measuring method and scanning electron microscope | |
| AU2003249804A1 (en) | Electron microscopy cell fraction sample preparation | |
| PL359748A1 (en) | Secondary electron detection system for scanning electron microscope | |
| AU2001265266A1 (en) | Microcolumn for use in sample extraction | |
| GB0505856D0 (en) | Cathode and counter-cathode arrangement in an ion source | |
| EP1703539A4 (en) | Electron beam device | |
| PL363131A1 (en) | System designed to detect electrons in scanning electron microscope | |
| PL1638595T3 (en) | Freeze-dried fsh / lh formulations | |
| PL362826A1 (en) | System for detection of secondary and backward scattered electrons for use in scanning electron microscope | |
| SG109515A1 (en) | Converting scanning electron microscopes | |
| EP1670029A4 (en) | Electron tube | |
| SG118192A1 (en) | Reducing chromatic aberration in images formed by emission electrons | |
| GB0005717D0 (en) | Scanning electron microscope | |
| GB2401720B (en) | Field electron emitters | |
| EP1794773A4 (en) | Portable electron microscope using micro-column | |
| PL364510A1 (en) | The method and the system designed for directional detection of electrons in the scanning electron microscope |