PL369476A1 - Sposób i urządzenie do diagnozowania urządzeń technicznych - Google Patents

Sposób i urządzenie do diagnozowania urządzeń technicznych

Info

Publication number
PL369476A1
PL369476A1 PL369476A PL36947604A PL369476A1 PL 369476 A1 PL369476 A1 PL 369476A1 PL 369476 A PL369476 A PL 369476A PL 36947604 A PL36947604 A PL 36947604A PL 369476 A1 PL369476 A1 PL 369476A1
Authority
PL
Poland
Prior art keywords
diagnosis
technological devices
technological
devices
Prior art date
Application number
PL369476A
Other languages
English (en)
Other versions
PL207601B1 (pl
Inventor
Michał Orkisz
Original Assignee
Abb Sp.Z O.O.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Abb Sp.Z O.O. filed Critical Abb Sp.Z O.O.
Priority to PL369476A priority Critical patent/PL207601B1/pl
Priority to JP2007525569A priority patent/JP2008509420A/ja
Priority to KR1020077004714A priority patent/KR100915720B1/ko
Priority to EP05760043A priority patent/EP1776573A1/en
Priority to CNB2005800269765A priority patent/CN100559153C/zh
Priority to US11/659,632 priority patent/US20070283189A1/en
Priority to PCT/PL2005/000043 priority patent/WO2006016827A1/en
Publication of PL369476A1 publication Critical patent/PL369476A1/pl
Publication of PL207601B1 publication Critical patent/PL207601B1/pl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M99/00Subject matter not provided for in other groups of this subclass
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M99/00Subject matter not provided for in other groups of this subclass
    • G01M99/005Testing of complete machines, e.g. washing-machines or mobile phones
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M99/00Subject matter not provided for in other groups of this subclass
    • G01M99/008Subject matter not provided for in other groups of this subclass by doing functionality tests
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0208Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
    • G05B23/021Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system adopting a different treatment of each operating region or a different mode of the monitored system, e.g. transient modes; different operating configurations of monitored system
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0256Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults injecting test signals and analyzing monitored process response, e.g. injecting the test signal while interrupting the normal operation of the monitored system; superimposing the test signal onto a control signal during normal operation of the monitored system

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
PL369476A 2004-08-09 2004-08-09 Sposób i urządzenie do diagnozowania urządzeń technicznych PL207601B1 (pl)

Priority Applications (7)

Application Number Priority Date Filing Date Title
PL369476A PL207601B1 (pl) 2004-08-09 2004-08-09 Sposób i urządzenie do diagnozowania urządzeń technicznych
JP2007525569A JP2008509420A (ja) 2004-08-09 2005-07-13 技術的装置を診断するための方法及びデバイス
KR1020077004714A KR100915720B1 (ko) 2004-08-09 2005-07-13 기술 장비를 진단하기 위한 방법
EP05760043A EP1776573A1 (en) 2004-08-09 2005-07-13 A method and a device for diagnosing technical equipment
CNB2005800269765A CN100559153C (zh) 2004-08-09 2005-07-13 用于诊断技术装备的方法和设备
US11/659,632 US20070283189A1 (en) 2004-08-09 2005-07-13 Method and a Device for Diagnosing Technical Equipment
PCT/PL2005/000043 WO2006016827A1 (en) 2004-08-09 2005-07-13 A method and a device for diagnosing technical equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PL369476A PL207601B1 (pl) 2004-08-09 2004-08-09 Sposób i urządzenie do diagnozowania urządzeń technicznych

Publications (2)

Publication Number Publication Date
PL369476A1 true PL369476A1 (pl) 2006-02-20
PL207601B1 PL207601B1 (pl) 2011-01-31

Family

ID=35116005

Family Applications (1)

Application Number Title Priority Date Filing Date
PL369476A PL207601B1 (pl) 2004-08-09 2004-08-09 Sposób i urządzenie do diagnozowania urządzeń technicznych

Country Status (7)

Country Link
US (1) US20070283189A1 (pl)
EP (1) EP1776573A1 (pl)
JP (1) JP2008509420A (pl)
KR (1) KR100915720B1 (pl)
CN (1) CN100559153C (pl)
PL (1) PL207601B1 (pl)
WO (1) WO2006016827A1 (pl)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014185812A1 (en) * 2013-05-14 2014-11-20 Siemens Aktiengesellschaft Diagnostics of a mechanical part

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0461145A (ja) * 1990-06-22 1992-02-27 Mitsubishi Electric Corp 半導体試験装置
US5214577A (en) * 1990-10-24 1993-05-25 Osaka Gas Co., Ltd. Automatic test generation for model-based real-time fault diagnostic systems
JP3195031B2 (ja) * 1992-02-28 2001-08-06 株式会社日立製作所 テスト仕様生成方法及び半導体装置検査装置及び半導体装置検査方法
JP2778888B2 (ja) * 1992-12-07 1998-07-23 株式会社東芝 プラント異常診断装置
US5629878A (en) * 1993-10-07 1997-05-13 International Business Machines Corporation Test planning and execution models for generating non-redundant test modules for testing a computer system
JP3129617B2 (ja) * 1994-12-01 2001-01-31 本田技研工業株式会社 オフライン品質検証装置
US5761090A (en) * 1995-10-10 1998-06-02 The University Of Chicago Expert system for testing industrial processes and determining sensor status
TW451287B (en) * 1998-09-19 2001-08-21 United Microelectronics Corp Succession effect analysis method of production machine cluster
JP3532461B2 (ja) * 1999-06-04 2004-05-31 三菱電機株式会社 A/t試験装置の計測方法
JP2001033355A (ja) * 1999-07-19 2001-02-09 Meiwa Electric Co 設備異常要因特定支援装置
CN1433534A (zh) * 2000-01-29 2003-07-30 Abb研究有限公司 求出生产设备效率、故障事件和故障事件原因的系统和方法
GB2362481B (en) * 2000-05-09 2004-12-01 Rolls Royce Plc Fault diagnosis
US7075926B2 (en) * 2000-05-24 2006-07-11 Alcatel Internetworking, Inc. (Pe) Programmable packet processor with flow resolution logic
US7139676B2 (en) * 2002-01-18 2006-11-21 Agilent Technologies, Inc Revising a test suite using diagnostic efficacy evaluation
KR100548314B1 (ko) * 2002-10-11 2006-02-02 엘지전자 주식회사 무선통신 수신시스템의 오류제어방법

Also Published As

Publication number Publication date
WO2006016827A1 (en) 2006-02-16
JP2008509420A (ja) 2008-03-27
KR100915720B1 (ko) 2009-09-04
US20070283189A1 (en) 2007-12-06
KR20070044472A (ko) 2007-04-27
CN101027544A (zh) 2007-08-29
CN100559153C (zh) 2009-11-11
EP1776573A1 (en) 2007-04-25
PL207601B1 (pl) 2011-01-31

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