TW201033602A - Defect inspection device for formed sheet - Google Patents

Defect inspection device for formed sheet Download PDF

Info

Publication number: TW201033602A
Authority: TW; Taiwan
Prior art keywords: defect; point; image; light source; linear light
Prior art date: 2008-11-21

Application number

TW098139122A

Other languages

English (en)

Chinese (zh)

Inventor

Osamu Hirose

Original Assignee

Sumitomo Chemical Co

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2008-11-21

Filing date

2009-11-18

Publication date

2010-09-16

2009-11-18 Application filed by Sumitomo Chemical Co filed Critical Sumitomo Chemical Co

2010-09-16 Publication of TW201033602A publication Critical patent/TW201033602A/zh

Links

230000007547 defect Effects 0.000 title claims abstract description 585
238000007689 inspection Methods 0.000 title claims description 153
238000001514 detection method Methods 0.000 claims abstract description 144
238000004422 calculation algorithm Methods 0.000 claims abstract description 114
238000000034 method Methods 0.000 claims description 99
238000003384 imaging method Methods 0.000 claims description 48
230000008859 change Effects 0.000 claims description 30
230000001133 acceleration Effects 0.000 claims description 8
239000002245 particle Substances 0.000 claims description 5
238000010191 image analysis Methods 0.000 abstract description 53
238000012545 processing Methods 0.000 description 33
238000004458 analytical method Methods 0.000 description 17
230000002950 deficient Effects 0.000 description 16
238000005286 illumination Methods 0.000 description 14
238000010586 diagram Methods 0.000 description 13
238000009499 grossing Methods 0.000 description 10
238000004364 calculation method Methods 0.000 description 7
238000005452 bending Methods 0.000 description 6
230000008569 process Effects 0.000 description 6
229910008355 Si-Sn Inorganic materials 0.000 description 5
229910006453 Si—Sn Inorganic materials 0.000 description 5
239000010408 film Substances 0.000 description 5
229920005992 thermoplastic resin Polymers 0.000 description 5
241000251468 Actinopterygii Species 0.000 description 4
238000000354 decomposition reaction Methods 0.000 description 4
230000010365 information processing Effects 0.000 description 4
239000012788 optical film Substances 0.000 description 4
238000011144 upstream manufacturing Methods 0.000 description 4
241001270131 Agaricus moelleri Species 0.000 description 3
230000000694 effects Effects 0.000 description 3
230000001605 fetal effect Effects 0.000 description 3
239000000463 material Substances 0.000 description 3
229920005989 resin Polymers 0.000 description 3
239000011347 resin Substances 0.000 description 3
238000012546 transfer Methods 0.000 description 3
238000012935 Averaging Methods 0.000 description 2
208000032544 Cicatrix Diseases 0.000 description 2
230000001154 acute effect Effects 0.000 description 2
230000005540 biological transmission Effects 0.000 description 2
239000012141 concentrate Substances 0.000 description 2
230000001419 dependent effect Effects 0.000 description 2
210000003128 head Anatomy 0.000 description 2
229910052751 metal Inorganic materials 0.000 description 2
239000002184 metal Substances 0.000 description 2
238000000465 moulding Methods 0.000 description 2
-1 polyethylene Polymers 0.000 description 2
231100000241 scar Toxicity 0.000 description 2
230000037387 scars Effects 0.000 description 2
238000012360 testing method Methods 0.000 description 2
229920002284 Cellulose triacetate Polymers 0.000 description 1
239000004698 Polyethylene Substances 0.000 description 1
239000004743 Polypropylene Substances 0.000 description 1
239000004793 Polystyrene Substances 0.000 description 1
239000004372 Polyvinyl alcohol Substances 0.000 description 1
KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
229910020780 SixSn Inorganic materials 0.000 description 1
NNLVGZFZQQXQNW-ADJNRHBOSA-N [(2r,3r,4s,5r,6s)-4,5-diacetyloxy-3-[(2s,3r,4s,5r,6r)-3,4,5-triacetyloxy-6-(acetyloxymethyl)oxan-2-yl]oxy-6-[(2r,3r,4s,5r,6s)-4,5,6-triacetyloxy-2-(acetyloxymethyl)oxan-3-yl]oxyoxan-2-yl]methyl acetate Chemical compound O([C@@H]1O[C@@H]([C@H]([C@H](OC(C)=O)[C@H]1OC(C)=O)O[C@H]1[C@@H]([C@@H](OC(C)=O)[C@H](OC(C)=O)[C@@H](COC(C)=O)O1)OC(C)=O)COC(=O)C)[C@@H]1[C@@H](COC(C)=O)O[C@@H](OC(C)=O)[C@H](OC(C)=O)[C@H]1OC(C)=O NNLVGZFZQQXQNW-ADJNRHBOSA-N 0.000 description 1
230000002146 bilateral effect Effects 0.000 description 1
230000015572 biosynthetic process Effects 0.000 description 1
238000006243 chemical reaction Methods 0.000 description 1
230000000295 complement effect Effects 0.000 description 1
229920001577 copolymer Polymers 0.000 description 1
238000011156 evaluation Methods 0.000 description 1
238000002474 experimental method Methods 0.000 description 1
238000000605 extraction Methods 0.000 description 1
229910052736 halogen Inorganic materials 0.000 description 1
150000002367 halogens Chemical class 0.000 description 1
230000006872 improvement Effects 0.000 description 1
238000007373 indentation Methods 0.000 description 1
229910001507 metal halide Inorganic materials 0.000 description 1
150000005309 metal halides Chemical class 0.000 description 1
229910044991 metal oxide Inorganic materials 0.000 description 1
150000004706 metal oxides Chemical class 0.000 description 1
239000000113 methacrylic resin Substances 0.000 description 1
239000000203 mixture Substances 0.000 description 1
238000012986 modification Methods 0.000 description 1
230000004048 modification Effects 0.000 description 1
230000003287 optical effect Effects 0.000 description 1
230000010287 polarization Effects 0.000 description 1
229920000515 polycarbonate Polymers 0.000 description 1
239000004417 polycarbonate Substances 0.000 description 1
229920000573 polyethylene Polymers 0.000 description 1
229920000098 polyolefin Polymers 0.000 description 1
229920001155 polypropylene Polymers 0.000 description 1
229920002223 polystyrene Polymers 0.000 description 1
229920002451 polyvinyl alcohol Polymers 0.000 description 1
239000004800 polyvinyl chloride Substances 0.000 description 1
229920000915 polyvinyl chloride Polymers 0.000 description 1
238000003825 pressing Methods 0.000 description 1
238000012887 quadratic function Methods 0.000 description 1
238000012552 review Methods 0.000 description 1
229910052707 ruthenium Inorganic materials 0.000 description 1
239000004065 semiconductor Substances 0.000 description 1
230000002194 synthesizing effect Effects 0.000 description 1

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/8921—Streaks
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
- G01N21/8903—Optical details; Scanning details using a multiple detector array
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9511—Optical elements other than lenses, e.g. mirrors

Landscapes

Engineering & Computer Science (AREA)
Textile Engineering (AREA)
Physics & Mathematics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
General Physics & Mathematics (AREA)
Immunology (AREA)
Pathology (AREA)
Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

TW098139122A 2008-11-21 2009-11-18 Defect inspection device for formed sheet TW201033602A (en)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP2008298680A JP5619348B2 (ja)	2008-11-21	2008-11-21	成形シートの欠陥検査装置

Publications (1)

Publication Number	Publication Date
TW201033602A true TW201033602A (en)	2010-09-16

Family

ID=42198000

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
TW098139122A TW201033602A (en)	2008-11-21	2009-11-18	Defect inspection device for formed sheet

Country Status (8)

Country	Link
JP (1)	JP5619348B2 (pl)
KR (1)	KR20110095344A (pl)
CN (1)	CN102224412A (pl)
CZ (1)	CZ2011295A3 (pl)
PL (1)	PL396135A1 (pl)
SK (1)	SK50342011A3 (pl)
TW (1)	TW201033602A (pl)
WO (1)	WO2010058557A1 (pl)

Cited By (4)

* Cited by examiner, † Cited by third party
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TWI451076B (zh) *	2013-02-08	2014-09-01	Benq Materials Corp	光學鏡片髒汙檢測方法
TWI493177B (zh) *	2013-10-15	2015-07-21	Benq Materials Corp	一種檢測具週期性結構光學薄膜的瑕疵檢測方法及其檢測裝置
TWI588472B (zh) *	2012-08-28	2017-06-21	Sumitomo Chemical Co	Defect inspection device and defect inspection method
TWI762592B (zh) *	2017-03-03	2022-05-01	日商住友化學股份有限公司	缺陷檢查系統、膜製造裝置、膜製造方法、印字裝置及印字方法

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CN103354781B (zh) *	2010-12-23	2016-03-23	倍耐力轮胎股份公司	在轮胎构建处理中用于控制半成品的生产和供给的方法和设备
CN102854193A (zh) *	2012-08-30	2013-01-02	苏州天准精密技术有限公司	一种用于图像瑕疵检测的检测方法和检测系统
KR102110006B1 (ko) *	2013-01-16	2020-05-12	스미또모 가가꾸 가부시키가이샤	화상 생성 장치, 결함 검사 장치 및 결함 검사 방법
WO2014112653A1 (ja) *	2013-01-16	2014-07-24	住友化学株式会社	画像生成装置、欠陥検査装置および欠陥検査方法
WO2014119772A1 (ja) *	2013-01-30	2014-08-07	住友化学株式会社	画像生成装置、欠陥検査装置および欠陥検査方法
JP6250317B2 (ja) *	2013-07-08	2017-12-20	住友化学株式会社	欠陥検査方法
WO2015069218A1 (en) *	2013-11-05	2015-05-14	Compagnie Generale Des Etablissements Michelin	Method and apparatus for non-destructive detection of tire anomalies
WO2016080401A1 (ja) *	2014-11-18	2016-05-26	三菱レイヨン株式会社	金属板の補修方法、及び鋳型の製造方法
JP6590653B2 (ja) *	2014-11-19	2019-10-16	首都高技術株式会社	点群データ利用システム
CN105785604A (zh) *	2014-12-24	2016-07-20	台湾动力检测科技股份有限公司	显示设备的光学层件的缺陷检测方法
CN107709628B (zh)	2015-06-26	2020-06-16	美泰乐科技(日本)股份有限公司	用于电解硬质金镀敷液的防置换剂和包含其的电解硬质金镀敷液
JP6628185B2 (ja) *	2016-03-11	2020-01-08	パナソニックＩｐマネジメント株式会社	透明体の検査方法
JP2017211325A (ja) *	2016-05-27	2017-11-30	株式会社ニレコ	欠点検査方法及び欠点検査装置
JP2017215277A (ja) *	2016-06-02	2017-12-07	住友化学株式会社	欠陥検査システム、フィルム製造装置及び欠陥検査方法
JP2017217649A (ja) *	2016-06-02	2017-12-14	国立大学法人九州大学	キャッピングシートの破損被疑箇所検出装置、キャッピングシートの破損被疑箇所検出方法、コンピュータプログラム
JP6622679B2 (ja) *	2016-10-26	2019-12-18	川崎重工業株式会社	サークルスクラッチ検査装置
JP7054481B2 (ja) *	2017-08-24	2022-04-14	日本電気硝子株式会社	板ガラスの製造方法
JP7048342B2 (ja) *	2018-02-15	2022-04-05	株式会社島精機製作所	延反方法と延反システム
JP7389321B2 (ja) *	2018-07-31	2023-11-30	住友金属鉱山株式会社	基板の検査装置、基板の検査方法
CN110857920A (zh) *	2018-08-24	2020-03-03	东华大学	一种卷装长丝的成型不良缺陷检测方法
WO2020079567A1 (en) *	2018-10-15	2020-04-23	3M Innovative Properties Company	Automated inspection for sheet parts of arbitrary shape from manufactured film
PL3934454T3 (pl) *	2019-03-05	2024-03-11	Philip Morris Products S.A.	Stanowisko kontroli i sposób kontroli arkusza materiału
JP2020190441A (ja) *	2019-05-20	2020-11-26	セーレン株式会社	皺検査装置、皺判定装置及び皺検査方法
JP2023032770A (ja) *	2021-08-27	2023-03-09	株式会社東芝	二次電池のための検査システム及び検査方法
WO2023047866A1 (ja) *	2021-09-27	2023-03-30	東レ株式会社	シート状物の凹凸測定装置、シート状物の凹凸測定方法
CN116993719B (zh) *	2023-09-25	2024-10-29	惠州艺都宇正数码科技有限公司	一种oca光学薄膜表面缺陷视觉检测方法及系统
CN121304608A (zh) *	2025-10-15	2026-01-09	杭州安脉盛智能技术有限公司	一种缺陷高度估计方法、装置、设备及可读存储介质

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JPH09159622A (ja) *	1995-12-05	1997-06-20	Kawasaki Steel Corp	表面欠陥検査装置
JP4507533B2 (ja) *	2003-08-29	2010-07-21	凸版印刷株式会社	周期性パターンにおけるスジ状ムラの検査方法
JP4882204B2 (ja) *	2004-03-05	2012-02-22	凸版印刷株式会社	周期性パターンにおけるスジ状ムラの検査方法
JP5006551B2 (ja) *	2006-02-14	2012-08-22	住友化学株式会社	欠陥検査装置及び欠陥検査方法
JP5367292B2 (ja) *	2008-03-31	2013-12-11	古河電気工業株式会社	表面検査装置および表面検査方法

2008
- 2008-11-21 JP JP2008298680A patent/JP5619348B2/ja not_active Expired - Fee Related
2009
- 2009-11-17 PL PL396135A patent/PL396135A1/pl unknown
- 2009-11-17 KR KR1020117013650A patent/KR20110095344A/ko not_active Withdrawn
- 2009-11-17 WO PCT/JP2009/006163 patent/WO2010058557A1/ja not_active Ceased
- 2009-11-17 CN CN2009801464034A patent/CN102224412A/zh active Pending
- 2009-11-17 CZ CZ20110295A patent/CZ2011295A3/cs unknown
- 2009-11-17 SK SK5034-2011A patent/SK50342011A3/sk not_active Application Discontinuation
- 2009-11-18 TW TW098139122A patent/TW201033602A/zh unknown

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
TWI588472B (zh) *	2012-08-28	2017-06-21	Sumitomo Chemical Co	Defect inspection device and defect inspection method
TWI451076B (zh) *	2013-02-08	2014-09-01	Benq Materials Corp	光學鏡片髒汙檢測方法
TWI493177B (zh) *	2013-10-15	2015-07-21	Benq Materials Corp	一種檢測具週期性結構光學薄膜的瑕疵檢測方法及其檢測裝置
TWI762592B (zh) *	2017-03-03	2022-05-01	日商住友化學股份有限公司	缺陷檢查系統、膜製造裝置、膜製造方法、印字裝置及印字方法

Also Published As

Publication number	Publication date
CZ2011295A3 (cs)	2011-11-09
CN102224412A (zh)	2011-10-19
JP5619348B2 (ja)	2014-11-05
KR20110095344A (ko)	2011-08-24
JP2010122192A (ja)	2010-06-03
SK50342011A3 (sk)	2011-09-05
WO2010058557A1 (ja)	2010-05-27
PL396135A1 (pl)	2011-12-05

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JP5619348B2 (ja)	2014-11-05	成形シートの欠陥検査装置
KR102023231B1 (ko)	2019-09-19	결함 검사 장치 및 결함 검사 방법
KR102168143B1 (ko)	2020-10-20	화상 생성 장치, 결함 검사 장치 및 결함 검사 방법
CN102630299B (zh)	2014-07-30	缺陷检查用图像处理装置和缺陷检查用图像处理方法
JP2013140050A (ja)	2013-07-18	欠陥検査装置および欠陥検査方法
CN112889087B (zh)	2024-09-17	对片材部件的自动检查的系统、处理单元和方法
JP6191622B2 (ja)	2017-09-06	画像生成装置、欠陥検査装置および欠陥検査方法
JP2020134187A (ja)	2020-08-31	傷検査装置および方法
JP7293907B2 (ja)	2023-06-20	外観検査管理システム、外観検査管理装置、外観検査管理方法及びプログラム
JP5006551B2 (ja)	2012-08-22	欠陥検査装置及び欠陥検査方法
CN104919306B (zh)	2017-11-21	图像生成装置、缺陷检查装置以及缺陷检查方法
JP6566903B2 (ja)	2019-08-28	表面欠陥検出方法および表面欠陥検出装置
JP2005083906A (ja)	2005-03-31	欠陥検出装置
JP2024109397A (ja)	2024-08-14	電池外装体の外観検査装置
JP2018054525A (ja)	2018-04-05	欠陥検査装置及び欠陥検査方法
JP2013003062A (ja)	2013-01-07	画像生成装置および欠陥検査装置
JP2020046255A (ja)	2020-03-26	透明体検査装置及び透明体検査方法

TW201033602A - Defect inspection device for formed sheet - Google Patents

Info

Links

Classifications

Landscapes

Applications Claiming Priority (1)

Publications (1)

Family

ID=42198000

Family Applications (1)

Country Status (8)

Cited By (4)

Families Citing this family (27)

Family Cites Families (5)

Cited By (4)

Also Published As

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