PL3963284T3 - Linia do kontroli pustych pojemników szklanych - Google Patents
Linia do kontroli pustych pojemników szklanychInfo
- Publication number
- PL3963284T3 PL3963284T3 PL20754305.9T PL20754305T PL3963284T3 PL 3963284 T3 PL3963284 T3 PL 3963284T3 PL 20754305 T PL20754305 T PL 20754305T PL 3963284 T3 PL3963284 T3 PL 3963284T3
- Authority
- PL
- Poland
- Prior art keywords
- line
- glass containers
- empty glass
- inspecting empty
- inspecting
- Prior art date
Links
- 239000011521 glass Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
- G01N21/9054—Inspection of sealing surface and container finish
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
- G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
- G01F17/00—Methods or apparatus for determining the capacity of containers or cavities, or the volume of solid bodies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N2021/845—Objects on a conveyor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/03—Investigating materials by wave or particle radiation by transmission
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/03—Investigating materials by wave or particle radiation by transmission
- G01N2223/04—Investigating materials by wave or particle radiation by transmission and measuring absorption
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
- G01N2223/3308—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object translates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/643—Specific applications or type of materials object on conveyor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/645—Specific applications or type of materials quality control
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/646—Specific applications or type of materials flaws, defects
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- Fluid Mechanics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Sorting Of Articles (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1904532A FR3095506B1 (fr) | 2019-04-29 | 2019-04-29 | Ligne de contrôle de récipients vides en verre |
| PCT/FR2020/050679 WO2020221975A1 (fr) | 2019-04-29 | 2020-04-21 | Ligne de contrôle de récipients vides en verre |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| PL3963284T3 true PL3963284T3 (pl) | 2023-10-30 |
Family
ID=67956997
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PL20754305.9T PL3963284T3 (pl) | 2019-04-29 | 2020-04-21 | Linia do kontroli pustych pojemników szklanych |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US11927542B2 (pl) |
| EP (1) | EP3963284B1 (pl) |
| JP (1) | JP7543307B2 (pl) |
| CN (1) | CN113767279B (pl) |
| ES (1) | ES2955345T3 (pl) |
| FR (1) | FR3095506B1 (pl) |
| MX (1) | MX2021013033A (pl) |
| PL (1) | PL3963284T3 (pl) |
| WO (1) | WO2020221975A1 (pl) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR3074907B1 (fr) * | 2017-12-08 | 2019-12-27 | Tiama | Methode et machine pour controler un procede de formage |
| IT201900006925A1 (it) * | 2019-05-16 | 2020-11-16 | Sica Spa | Sistema di controllo della qualità di lavorazione di tubi in materiale termoplastico |
| EP3926416B1 (fr) * | 2020-06-19 | 2025-12-10 | Rolex Sa | Dispositif de mesure d'un composant horloger |
| DE102021109998B3 (de) * | 2021-04-20 | 2022-04-07 | Heye International Gmbh | Verfahren zur Fehlerinspektion eines dreidimensionalen Objektes |
| JP7563304B2 (ja) * | 2021-06-16 | 2024-10-08 | トヨタ自動車株式会社 | Ｘ線ｃｔ装置及び画像生成方法 |
| CN113432531A (zh) * | 2021-06-22 | 2021-09-24 | 广东工业大学 | 一种瓶胚尺寸测量方法 |
| EP4163588A1 (en) * | 2021-10-08 | 2023-04-12 | Tech Pro Packag S.L. | Process and installation for manufacturing and inspecting metal containers |
| CN114295631B (zh) * | 2021-12-31 | 2023-11-14 | 江苏壹利特机器人科技有限公司 | 玻璃瓶口裂缝检测系统 |
Family Cites Families (47)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR1491418A (fr) | 1966-06-21 | 1967-08-11 | Verrerie Souchon Neuvesel | Tête de lecture pour la mesure unilatérale et ponctuelle de l'épaisseur d'un isolant |
| SE7308776L (pl) | 1973-06-21 | 1974-12-23 | Platmanufaktur Ab | |
| US4075086A (en) | 1975-04-04 | 1978-02-21 | Owens-Illinois, Inc. | Glass container handling |
| FR2401415A1 (fr) | 1977-08-24 | 1979-03-23 | Emballage Ste Gle Pour | Inspection et controle d'objets transparents |
| JPS6042401B2 (ja) * | 1979-09-26 | 1985-09-21 | 富士電機株式会社 | 管状材の管壁厚み測定方法 |
| CH652826A5 (de) | 1980-06-16 | 1985-11-29 | Peter Dr Hermann | Vorrichtung zur erkennung von fehlern, insbesondere risse, in transparenten koerpern auf optischem wege. |
| JPS60260807A (ja) | 1984-06-08 | 1985-12-24 | Kawasaki Steel Corp | 管状材の放射線透過式肉厚測定装置 |
| DE3515353A1 (de) | 1985-04-27 | 1986-10-30 | Seitz Enzinger Noll Maschinenbau Ag, 6800 Mannheim | Vorrichtung zum foerdern von flaschen in haengender lage |
| EP0320139A3 (en) | 1987-12-08 | 1990-08-08 | Emhart Industries, Inc. | Optical measurement of wall thickness of transparent articles |
| US5291271A (en) | 1992-08-19 | 1994-03-01 | Owens-Brockway Glass Container Inc. | Measurement of transparent container wall thickness |
| FR2738343B1 (fr) | 1995-08-30 | 1997-10-24 | Cohen Sabban Joseph | Dispositif de microstratigraphie optique |
| US5602890A (en) * | 1995-09-27 | 1997-02-11 | Thermedics Detection Inc. | Container fill level and pressurization inspection using multi-dimensional images |
| US5608516A (en) | 1995-12-13 | 1997-03-04 | Emhart Glass Machinery Investments Inc. | Glass bottle inspection machine |
| DE19756697A1 (de) | 1997-12-19 | 1999-07-01 | Manfred Dr Ing Pfeiler | Vorrichtung zur Stückgut-Röntgentomosynthese |
| JP2000055827A (ja) | 1998-08-10 | 2000-02-25 | Hitachi Eng Co Ltd | ガラス容器等の口部検査方法及び装置 |
| JP2000193607A (ja) | 1998-12-28 | 2000-07-14 | Kirin Brewery Co Ltd | 壜の欠陥検査方法および装置 |
| DE60028731C9 (de) | 1999-01-19 | 2018-05-17 | Msc & Sgcc | Verfahren und vorrichtung zur erfassung von rissen in gegenständen aus durchsichtigem oder lichtdurchlässigem material |
| US6581751B1 (en) | 2000-10-04 | 2003-06-24 | Owens-Brockway Glass Container Inc. | Method and apparatus for inspecting articles of glassware |
| US6855929B2 (en) * | 2000-12-01 | 2005-02-15 | Ebara Corporation | Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former |
| US6510751B2 (en) | 2000-12-21 | 2003-01-28 | Emhart Glass S.A. | Glass container inspection machine |
| JP3089963U (ja) | 2002-05-14 | 2002-11-22 | 高嶋技研株式会社 | Ｘ線によるボトル内入味検査機能を持つキャップ締付検査装置 |
| FR2846314B1 (fr) | 2002-10-25 | 2005-08-19 | Bsn Glasspack | Machine de deplacement de recipients devant des postes de controle |
| US7480363B2 (en) | 2004-09-15 | 2009-01-20 | Ge Betz, Inc. | Converting a digital radiograph to an absolute thickness map |
| FR2900238B1 (fr) | 2006-04-24 | 2008-07-25 | Sgcc Sa | Module et installation de controle d'un article et installation de reglage de ce module |
| FR2907370B1 (fr) | 2006-10-18 | 2017-11-17 | Tiama | Procede et installation pour le marquage a chaud d'objets translucides ou transparents |
| FR2907554B1 (fr) | 2006-10-24 | 2009-03-20 | Tiama Sa | Poste d'inspection optique pour detecter des defauts reflechissant la lumiere |
| FR2907553B1 (fr) | 2006-10-24 | 2009-02-13 | Tiama Sa | Procede et dispositif pour detecter des defauts a faible et fort contrastes dans des objets transparents ou translucides |
| DE102007008958B3 (de) | 2007-02-21 | 2008-04-03 | Hartmut Geisel | Verfahren und Einrichtung zur Überwachung von Glasartikeln |
| FR2916048B1 (fr) | 2007-05-09 | 2010-05-28 | Tiama | Procede et dispositif d'inspection d'articles transparents ou translucides en vue d'optimiser le fonctionnement d'une machine de controle |
| DE102007044530B4 (de) | 2007-09-18 | 2009-06-10 | VMA Gesellschaft für visuelle Meßtechnik und Automatisierung mbH | Anordnung zur Messung der Dicke und des Abstandes transparenter Objekte |
| CN101561405B (zh) | 2008-04-17 | 2011-07-06 | 清华大学 | 一种直线轨迹扫描成像系统和方法 |
| US8867816B2 (en) | 2008-09-05 | 2014-10-21 | Optosecurity Inc. | Method and system for performing X-ray inspection of a liquid product at a security checkpoint |
| GB0902138D0 (en) | 2009-02-10 | 2009-03-25 | Durham Scient Crystals Ltd | Apparatus and method for viewing an object |
| JP5530745B2 (ja) | 2010-02-16 | 2014-06-25 | 月桂冠株式会社 | ガラス壜の検査方法、検査装置、および検査システム |
| DE102010046461B4 (de) | 2010-09-24 | 2020-06-18 | Symplex Vision Systems Gmbh | Inspektionsverfahren, Inspektionsstation und Belichtungs- und Auswertevorrichtung |
| FR2965344B1 (fr) | 2010-09-28 | 2013-04-05 | Tiama | Dispositif d'inspection pour les bagues et cols de recipients |
| WO2012043618A1 (ja) * | 2010-10-01 | 2012-04-05 | キリンテクノシステム株式会社 | ガラス壜の検査装置および方法 |
| US8708134B2 (en) | 2011-01-11 | 2014-04-29 | Emhart Glass S.A. | Star wheel conveyor outfeed mechanism and method |
| FR2971847B1 (fr) | 2011-02-18 | 2013-07-19 | Tiama | Procede et dispositif pour detecter des defauts de repartition de matiere dans des recipients transparents |
| US8570504B2 (en) * | 2011-05-17 | 2013-10-29 | Gii Acquisition, Llc | Method and system for optically inspecting parts |
| WO2013078344A1 (en) * | 2011-11-22 | 2013-05-30 | Xinray Systems Inc | High speed, small footprint x-ray tomography inspection systems, devices, and methods |
| JP5879576B2 (ja) | 2012-10-26 | 2016-03-08 | キリンテクノシステム株式会社 | 容器搬送装置 |
| JP6266574B2 (ja) * | 2015-09-10 | 2018-01-24 | 株式会社日立ハイテクサイエンス | Ｘ線検査方法及びｘ線検査装置 |
| FR3052555B1 (fr) * | 2016-06-09 | 2019-06-28 | Tiama | Procede pour determiner la capacite de recipients en verre |
| FR3073043B1 (fr) | 2017-10-27 | 2019-11-15 | Tiama | Procede et installation de controle dimensionnel en ligne d'objets manufactures |
| FR3073044B1 (fr) | 2017-10-27 | 2020-10-02 | Tiama | Procede et dispositif de mesure de dimensions par rayons x, sur des recipients en verre vide defilant en ligne |
| FR3074907B1 (fr) | 2017-12-08 | 2019-12-27 | Tiama | Methode et machine pour controler un procede de formage |
-
2019
- 2019-04-29 FR FR1904532A patent/FR3095506B1/fr active Active
-
2020
- 2020-04-21 JP JP2021564280A patent/JP7543307B2/ja active Active
- 2020-04-21 ES ES20754305T patent/ES2955345T3/es active Active
- 2020-04-21 WO PCT/FR2020/050679 patent/WO2020221975A1/fr not_active Ceased
- 2020-04-21 PL PL20754305.9T patent/PL3963284T3/pl unknown
- 2020-04-21 MX MX2021013033A patent/MX2021013033A/es unknown
- 2020-04-21 US US17/603,642 patent/US11927542B2/en active Active
- 2020-04-21 EP EP20754305.9A patent/EP3963284B1/fr active Active
- 2020-04-21 CN CN202080032317.7A patent/CN113767279B/zh active Active
Also Published As
| Publication number | Publication date |
|---|---|
| FR3095506A1 (fr) | 2020-10-30 |
| WO2020221975A1 (fr) | 2020-11-05 |
| CN113767279B (zh) | 2024-06-25 |
| JP2022532495A (ja) | 2022-07-15 |
| ES2955345T3 (es) | 2023-11-30 |
| CN113767279A (zh) | 2021-12-07 |
| US11927542B2 (en) | 2024-03-12 |
| FR3095506B1 (fr) | 2021-05-07 |
| EP3963284A1 (fr) | 2022-03-09 |
| MX2021013033A (es) | 2021-12-10 |
| US20220196567A1 (en) | 2022-06-23 |
| EP3963284B1 (fr) | 2023-06-07 |
| JP7543307B2 (ja) | 2024-09-02 |
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