PL397925A1 - Measuring method for angular deviations of the laser beam and an interferometer for measuring the angular deviations of the laser beam - Google Patents

Measuring method for angular deviations of the laser beam and an interferometer for measuring the angular deviations of the laser beam

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Publication number
PL397925A1
PL397925A1 PL397925A PL39792512A PL397925A1 PL 397925 A1 PL397925 A1 PL 397925A1 PL 397925 A PL397925 A PL 397925A PL 39792512 A PL39792512 A PL 39792512A PL 397925 A1 PL397925 A1 PL 397925A1
Authority
PL
Poland
Prior art keywords
photodetector
laser beam
interferometer
angular deviations
beams
Prior art date
Application number
PL397925A
Other languages
Polish (pl)
Other versions
PL219676B1 (en
Inventor
Marek Dobosz
Olga Iwasińska-Kowalska
Original Assignee
Politechnika Warszawska
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Politechnika Warszawska filed Critical Politechnika Warszawska
Priority to PL397925A priority Critical patent/PL219676B1/en
Publication of PL397925A1 publication Critical patent/PL397925A1/en
Publication of PL219676B1 publication Critical patent/PL219676B1/en

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  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

W sposobie wynalazku, realizowanym z wykorzystaniem dwuwiazkowego ukladu optycznego interferometru z ukladem powierzchni odbijajacych, laserowa wiazke swiatla (2) rozdziela sie na dwie wiazki, a po odbiciu od ukladu powierzchni odbijajacych obie wiazki laczy sie ponownie we wspólnym kierunku propagacji tak, ze interferuja ze soba tworzac obraz prazków interferencyjnych padajacy na fotodetektor (10) czuly na zmiane okresu prazków, przy czym ukladzie optycznym pomiedzy laserem (1), a fotodetektorem (10) doprowadza sie do róznej o liczbe nieparzysta ilosci odbic obu rozdzielonych wiazek od powierzchni odbijajacych, a odchylenie katowe wyznacza sie na podstawie zarejestrowanej przez fotodetektor (10) zmiany okresu prazków interferujacych ze soba wiazek. W interferometrze, wyposazonym w dwuwiazkowy uklad optyczny z ukladem powierzchni odbijajacych, pomiedzy laserem (1), a fotodetektorem (10) ilosc powierzchni odbijajacych znajdujacych sie na drodze pierwszej wiazki (4) jest rózna o liczbe nieparzysta od ilosci powierzchni odbijajacych znajdujacych sie na drodze drugiej wiazki (5). Rozwiazanie moze byc wykorzystane do pomiaru mikro-odchylen powierzchni zwierciadlanej od której odbija sie analizowana wiazka oraz do stabilizacji kierunku propagacji wiazki.In the method of the invention, implemented with the use of a dual beam optical interferometer system with a reflective surface system, the laser light beam (2) separates into two beams, and after being reflected from the reflective surface system, both beams join again in a common propagation direction so that they interfere with each other creating an image of interference bands incident on the photodetector (10) sensitive to changes in the period of the bays, whereby the optical system between the laser (1) and the photodetector (10) is brought to a different number of odd reflections of both separated beams from the reflecting surfaces, and the angular deviation is determined on the basis of a change in the period of bands interfering with each other recorded by the photodetector (10). In the interferometer, equipped with a dual-beam optical system with a reflecting surface system, between the laser (1) and the photodetector (10) the number of reflecting surfaces in the path of the first beam (4) is different by the number of odd surfaces from the number of reflective surfaces in the path bundles (5). The solution can be used to measure the micro-deviation of the mirror surface from which the analyzed beam is reflected, and to stabilize the direction of beam propagation.

PL397925A 2012-01-27 2012-01-27 Measuring method for angular deviations of the laser beam and an interferometer for measuring the angular deviations of the laser beam PL219676B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PL397925A PL219676B1 (en) 2012-01-27 2012-01-27 Measuring method for angular deviations of the laser beam and an interferometer for measuring the angular deviations of the laser beam

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PL397925A PL219676B1 (en) 2012-01-27 2012-01-27 Measuring method for angular deviations of the laser beam and an interferometer for measuring the angular deviations of the laser beam

Publications (2)

Publication Number Publication Date
PL397925A1 true PL397925A1 (en) 2013-08-05
PL219676B1 PL219676B1 (en) 2015-06-30

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PL397925A PL219676B1 (en) 2012-01-27 2012-01-27 Measuring method for angular deviations of the laser beam and an interferometer for measuring the angular deviations of the laser beam

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PL (1) PL219676B1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110631514B (en) * 2018-05-18 2021-03-30 安徽大学 Pentagonal prism type angle sensing measurement device and method based on multi-longitudinal mode self-mixing effect
PL452950A1 (en) * 2025-08-18 2026-05-11 Politechnika Warszawska Method and device for calibrating polygonal patterns

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Publication number Publication date
PL219676B1 (en) 2015-06-30

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