PL4175079T3 - Sposób wytwarzania obszaru o regularnie zmiennym współczynniku załamania światła w warstwowej strukturze półprzewodnikowej - Google Patents
Sposób wytwarzania obszaru o regularnie zmiennym współczynniku załamania światła w warstwowej strukturze półprzewodnikowejInfo
- Publication number
- PL4175079T3 PL4175079T3 PL22461628.4T PL22461628T PL4175079T3 PL 4175079 T3 PL4175079 T3 PL 4175079T3 PL 22461628 T PL22461628 T PL 22461628T PL 4175079 T3 PL4175079 T3 PL 4175079T3
- Authority
- PL
- Poland
- Prior art keywords
- regulary
- fabrication
- region
- refractive index
- semiconductor structure
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/12—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region the resonator having a periodic structure, e.g. in distributed feedback [DFB] lasers
- H01S5/1231—Grating growth or overgrowth details
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/18—Diffraction gratings
- G02B5/1861—Reflection gratings characterised by their structure, e.g. step profile, contours of substrate or grooves, pitch variations, materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
- H10P50/60—Wet etching
- H10P50/61—Electrolytic etching
- H10P50/617—Electrolytic etching of Group III-V materials
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Semiconductor Lasers (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PL439368A PL439368A1 (pl) | 2021-10-30 | 2021-10-30 | Sposób wytwarzania obszaru o regularnie zmiennym współczynniku załamania światła w wybranej warstwie warstwowej struktury półprzewodnikowej |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| PL4175079T3 true PL4175079T3 (pl) | 2025-12-15 |
Family
ID=84785385
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PL439368A PL439368A1 (pl) | 2021-10-30 | 2021-10-30 | Sposób wytwarzania obszaru o regularnie zmiennym współczynniku załamania światła w wybranej warstwie warstwowej struktury półprzewodnikowej |
| PL22461628.4T PL4175079T3 (pl) | 2021-10-30 | 2022-10-30 | Sposób wytwarzania obszaru o regularnie zmiennym współczynniku załamania światła w warstwowej strukturze półprzewodnikowej |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PL439368A PL439368A1 (pl) | 2021-10-30 | 2021-10-30 | Sposób wytwarzania obszaru o regularnie zmiennym współczynniku załamania światła w wybranej warstwie warstwowej struktury półprzewodnikowej |
Country Status (2)
| Country | Link |
|---|---|
| EP (1) | EP4175079B1 (pl) |
| PL (2) | PL439368A1 (pl) |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2486251A1 (fr) * | 1980-07-03 | 1982-01-08 | Commissariat Energie Atomique | Procede de realisation d'un reseau optique |
| US4722092A (en) | 1985-01-30 | 1988-01-26 | Massachusetts Institute Of Technology | GaInAsP/InP distributed feedback laser |
| US4777148A (en) | 1985-01-30 | 1988-10-11 | Massachusetts Institute Of Technology | Process for making a mesa GaInAsP/InP distributed feedback laser |
| DE29815522U1 (de) | 1998-08-31 | 1998-12-03 | Forchel, Alfred, Prof. Dr., 97074 Würzburg | Halbleiterlaser mit Gitterstruktur |
| CA2254275C (en) * | 1998-11-20 | 2007-06-26 | Patrik Schmuki | Selective electrochemical process for creating semiconductor nano- and micro-patterns |
| EP1094345A1 (en) | 1999-10-19 | 2001-04-25 | BRITISH TELECOMMUNICATIONS public limited company | Method of making a photonic band gap structure |
| US6365428B1 (en) | 2000-06-15 | 2002-04-02 | Sandia Corporation | Embedded high-contrast distributed grating structures |
| US6649439B1 (en) | 2002-08-01 | 2003-11-18 | Northrop Grumman Corporation | Semiconductor-air gap grating fabrication using a sacrificial layer process |
| US8823057B2 (en) | 2006-11-06 | 2014-09-02 | Cree, Inc. | Semiconductor devices including implanted regions for providing low-resistance contact to buried layers and related devices |
| JP5961557B2 (ja) | 2010-01-27 | 2016-08-02 | イェイル ユニヴァーシティ | GaNデバイスのための導電率ベースの選択的エッチング及びその用途 |
| WO2014004261A1 (en) | 2012-06-28 | 2014-01-03 | Yale University | Lateral electrochemical etching of iii-nitride materials for microfabrication |
| US11137536B2 (en) * | 2018-07-26 | 2021-10-05 | Facebook Technologies, Llc | Bragg-like gratings on high refractive index material |
| PL3767762T3 (pl) | 2019-07-14 | 2022-12-12 | Instytut Wysokich Ciśnień Polskiej Akademii Nauk | Dioda laserowa z rozłożonym sprzężeniem zwrotnym i sposób wytwarzania takiej diody |
| WO2021150304A1 (en) * | 2020-01-23 | 2021-07-29 | Yale University | Stacked high contrast gratings and methods of making and using thereof |
-
2021
- 2021-10-30 PL PL439368A patent/PL439368A1/pl unknown
-
2022
- 2022-10-30 EP EP22461628.4A patent/EP4175079B1/en active Active
- 2022-10-30 PL PL22461628.4T patent/PL4175079T3/pl unknown
Also Published As
| Publication number | Publication date |
|---|---|
| EP4175079C0 (en) | 2025-09-10 |
| EP4175079B1 (en) | 2025-09-10 |
| EP4175079A1 (en) | 2023-05-03 |
| PL439368A1 (pl) | 2023-05-02 |
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