PL4211419T3 - System analizy powierzchni pojazdu - Google Patents

System analizy powierzchni pojazdu

Info

Publication number
PL4211419T3
PL4211419T3 PL21763228.0T PL21763228T PL4211419T3 PL 4211419 T3 PL4211419 T3 PL 4211419T3 PL 21763228 T PL21763228 T PL 21763228T PL 4211419 T3 PL4211419 T3 PL 4211419T3
Authority
PL
Poland
Prior art keywords
analysis system
surface analysis
vehicle surface
vehicle
analysis
Prior art date
Application number
PL21763228.0T
Other languages
English (en)
Inventor
Jozsef Bugovics
Dudasz ZSOLT
Hans Schlüter
Original Assignee
AUTO1 Group SE
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE202020003891.1U external-priority patent/DE202020003891U1/de
Priority claimed from DE102020005611.3A external-priority patent/DE102020005611A1/de
Application filed by AUTO1 Group SE filed Critical AUTO1 Group SE
Publication of PL4211419T3 publication Critical patent/PL4211419T3/pl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06QINFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q10/00Administration; Management
    • G06Q10/20Administration of product repair or maintenance
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/70Determining position or orientation of objects or cameras
    • G06T7/73Determining position or orientation of objects or cameras using feature-based methods
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/10Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths
    • H04N23/13Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths with multiple sensors
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/90Arrangement of cameras or camera modules, e.g. multiple cameras in TV studios or sports stadiums
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8861Determining coordinates of flaws
    • G01N2021/8864Mapping zones of defects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Business, Economics & Management (AREA)
  • Signal Processing (AREA)
  • Theoretical Computer Science (AREA)
  • Human Resources & Organizations (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Tourism & Hospitality (AREA)
  • General Business, Economics & Management (AREA)
  • Strategic Management (AREA)
  • Operations Research (AREA)
  • Marketing (AREA)
  • Entrepreneurship & Innovation (AREA)
  • Economics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Image Processing (AREA)
PL21763228.0T 2020-09-14 2021-07-29 System analizy powierzchni pojazdu PL4211419T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE202020003891.1U DE202020003891U1 (de) 2020-09-14 2020-09-14 Fahrzeugoberflächenanalysesystem
DE102020005611.3A DE102020005611A1 (de) 2020-09-14 2020-09-14 Fahrzeugoberflächenanalysesystem
PCT/DE2021/000127 WO2022053089A1 (de) 2020-09-14 2021-07-29 Fahrzeugoberflächenanalysesystem

Publications (1)

Publication Number Publication Date
PL4211419T3 true PL4211419T3 (pl) 2025-09-08

Family

ID=77595251

Family Applications (1)

Application Number Title Priority Date Filing Date
PL21763228.0T PL4211419T3 (pl) 2020-09-14 2021-07-29 System analizy powierzchni pojazdu

Country Status (7)

Country Link
US (1) US12249056B2 (pl)
EP (1) EP4211419B1 (pl)
JP (1) JP2023542103A (pl)
ES (1) ES3036283T3 (pl)
PL (1) PL4211419T3 (pl)
PT (1) PT4211419T (pl)
WO (1) WO2022053089A1 (pl)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12449349B2 (en) * 2022-10-05 2025-10-21 Schlumberger Technology Corporation Trend-based colorimetric analysis techniques for field component and tool string diagnostics
JP2024106677A (ja) * 2023-01-27 2024-08-08 本田技研工業株式会社 画像処理装置
CN116402789B (zh) * 2023-03-30 2023-11-28 开思时代科技(深圳)有限公司 车辆喷漆需求数据分析方法及系统
CN116973378B (zh) * 2023-09-22 2024-01-09 山东梁山华宇集团汽车制造有限公司 一种车辆生产质量检测系统
CN117788461B (zh) * 2024-02-23 2024-05-07 华中科技大学同济医学院附属同济医院 一种基于图像分析的磁共振图像质量评估系统
CN118781122B (zh) * 2024-09-12 2025-01-07 上海临滴科技有限公司 工业影像实时分析系统及方法
CN120298863A (zh) * 2025-03-18 2025-07-11 佛山市长盛兴隆装饰材料有限公司 一种装饰纸喷涂质量评估方法及系统

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6858826B2 (en) * 1996-10-25 2005-02-22 Waveworx Inc. Method and apparatus for scanning three-dimensional objects
JP2007524808A (ja) * 2003-03-07 2007-08-30 インターナショナル インダストリー サポート、インク 立体カメラセットを有する走査システム
DE102005058353B4 (de) 2005-12-06 2009-09-24 Wilhelm Ruppert Verfahren zur Aufnahme digitaler Abbildungen
CA2683206C (en) * 2009-10-17 2018-07-03 Hermary Opto Electronics Inc. Enhanced imaging method and apparatus
JP5673621B2 (ja) * 2012-07-18 2015-02-18 オムロン株式会社 欠陥検査方法及び欠陥検査装置
US20140152806A1 (en) * 2012-11-30 2014-06-05 Sharp Cars Detailing & More, LLC Automated studio
DE202013002483U1 (de) * 2013-03-15 2014-06-16 Csb-System Ag Vorrichtung zur Vermessung einer Schlachttierkörperhälfte
US10430936B2 (en) * 2018-02-22 2019-10-01 The Boeing Company Active real-time characterization system for identifying surface contamination
DE202018001659U1 (de) * 2018-03-29 2019-07-03 Twinner Gmbh Fahrzeugerfassungssystem
DE102018002621A1 (de) 2018-03-29 2019-10-02 Twinner Gmbh Fahrzeugerfassungssystem
BR112020019738A2 (pt) * 2018-03-29 2021-02-17 Twinner Gmbh sistema de detecção de veículo
JP2020051981A (ja) * 2018-09-28 2020-04-02 Jfeテクノリサーチ株式会社 検査装置
EP3963355A1 (en) * 2019-03-08 2022-03-09 OSRAM GmbH Component for a lidar sensor system, lidar sensor system, lidar sensor device, method for a lidar sensor system and method for a lidar sensor device

Also Published As

Publication number Publication date
ES3036283T3 (en) 2025-09-17
US12249056B2 (en) 2025-03-11
EP4211419B1 (de) 2025-04-30
WO2022053089A1 (de) 2022-03-17
JP2023542103A (ja) 2023-10-05
US20230360187A1 (en) 2023-11-09
EP4211419A1 (de) 2023-07-19
PT4211419T (pt) 2025-08-01

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