PL424588A1 - Method for measuring angular deviations of a laser beam and the optical system for measuring angular micro-deviations of a laser beam - Google Patents

Method for measuring angular deviations of a laser beam and the optical system for measuring angular micro-deviations of a laser beam

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Publication number
PL424588A1
PL424588A1 PL424588A PL42458818A PL424588A1 PL 424588 A1 PL424588 A1 PL 424588A1 PL 424588 A PL424588 A PL 424588A PL 42458818 A PL42458818 A PL 42458818A PL 424588 A1 PL424588 A1 PL 424588A1
Authority
PL
Poland
Prior art keywords
polarization
light
micro
laser beam
deviations
Prior art date
Application number
PL424588A
Other languages
Polish (pl)
Other versions
PL241303B1 (en
Inventor
Marek Dobosz
Michał JANKOWSKI
Original Assignee
Politechnika Warszawska
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Politechnika Warszawska filed Critical Politechnika Warszawska
Priority to PL424588A priority Critical patent/PL241303B1/en
Publication of PL424588A1 publication Critical patent/PL424588A1/en
Publication of PL241303B1 publication Critical patent/PL241303B1/en

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Abstract

Sposób pomiaru odchyleń kątowych wiązki laserowej, za pomocą jednoosiowego czujnika mikro-odchyleń kątowych (7), w którym za pomocą lasera (1) generuje się spolaryzowaną liniowo wiązkę światła (8) i kieruje się ją do jednoosiowego czujnika mikro-odchyleń (7), cechuje się tym, że pomiar odbywa się dwuetapowo a wyemitowaną przez laser (1) wiązkę (8) przepuszcza się przez nastawny rotator (3) polaryzacji światła. W pierwszym etapie nastawny rotator (3) polaryzacji ustawia się na pierwszą polaryzację, a następnie wiązkę o pierwszej polaryzacji wprowadza się do polaryzacyjnego elementu światłodzielącego (2), do drugiego elementu światłodzielącego (4) oraz do czujnika mikro-odchyleń kątowych (7) i dokonuje się pomiaru odchylenia w pierwszej płaszczyźnie. W drugim etapie ustawia się nastawny rotator (3) polaryzacji światła na drugą polaryzację różniącą się od pierwszej o 90 stopni i wiązkę o drugiej polaryzacji kieruje się do elementu światłodzielącego (2) a następnie do elementu (5) obracającego płaszczyznę odchyleń kątowych wiązki laserowej, do drugiego elementu światłodzielącego (4) oraz do czujnika mikro-odchyleń kątowych (7) i wykonuje się pomiar odchylenia w drugiej płaszczyźnie. Układ optyczny do pomiaru mikro-odchyleń kątowych wiązki laserowej zwłaszcza błędów rotacyjnych, wyposażony w laser (1) emitujący wiązkę światła laserowego prowadzonego w torze optycznym do jednoosiowego czujnika mikro-odchyleń kątowych (7) cechuje się tym, że w torze optycznym, na drodze wiązki światła znajduje się nastawny rotator (3) polaryzacji światła, za którym znajduje się pierwszy element światłodzielący (2) wrażliwy na polaryzację i w zależności od niej kierujący wiązkę do pierwszej lub do drugiej gałęzi toru, które to gałęzie toru łączą się w drugim elemencie światłodzielącym (4) wrażliwym na polaryzację, przy czym w jednej z gałęzi znajduje się element (5) obracający płaszczyznę odchyleń kątowych wiązki laserowej.The method of measuring the angular deviations of the laser beam using a uniaxial micro-angular displacement sensor (7), in which a laser beam (1) generates a linearly polarized light beam (8) and directs it to a single-axis micro-deviation sensor (7), characterized by the fact that the measurement takes place in two stages and the beam (8) emitted by the laser (1) is passed through an adjustable rotator (3) of light polarization. In the first stage, the adjustable rotator (3) of polarization is set to the first polarization, and then the first polarization beam is introduced into the polarizing light splitting element (2), to the second light splitting element (4) and to the sensor of micro-angular deviations (7) and makes measuring the deviation in the first plane. In the second stage, the adjustable rotator (3) of polarization of light is set to the second polarization differing from the first by 90 degrees and the beam of the second polarization is directed to the light splitting element (2) and then to the element (5) rotating the plane of the angular deviation of the laser beam, to the second light splitting element (4) and to the micro-angular displacement sensor (7) and the second plane deviation is measured. The optical system for measuring micro-angular deviations of the laser beam, especially rotational errors, equipped with a laser (1) emitting a laser light beam guided in the optical path to the uniaxial sensor of micro-angular deviations (7) is characterized by the fact that in the optical path, the beam path of light there is an adjustable rotator (3) of light polarization, behind which is the first light-splitting element (2) sensitive to polarization and depending on it directing the beam to the first or second branch of the track, which track branches connect in the second light-splitting element (4 ) sensitive to polarization, where in one of the branches there is an element (5) rotating the plane of angular deviations of the laser beam.

PL424588A 2018-02-14 2018-02-14 Method for measuring angular deviations of a laser beam and the optical system for measuring angular micro-deviations of a laser beam PL241303B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PL424588A PL241303B1 (en) 2018-02-14 2018-02-14 Method for measuring angular deviations of a laser beam and the optical system for measuring angular micro-deviations of a laser beam

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PL424588A PL241303B1 (en) 2018-02-14 2018-02-14 Method for measuring angular deviations of a laser beam and the optical system for measuring angular micro-deviations of a laser beam

Publications (2)

Publication Number Publication Date
PL424588A1 true PL424588A1 (en) 2019-08-26
PL241303B1 PL241303B1 (en) 2022-09-05

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PL424588A PL241303B1 (en) 2018-02-14 2018-02-14 Method for measuring angular deviations of a laser beam and the optical system for measuring angular micro-deviations of a laser beam

Country Status (1)

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PL (1) PL241303B1 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08166225A (en) * 1994-12-14 1996-06-25 Toyo Commun Equip Co Ltd Method and apparatus for measuring angle of minute optical component
US20090122322A1 (en) * 2007-11-09 2009-05-14 Bossa Nova Technologies, Llc Interferometric method and apparatus for linear detection of motion from a surface
PL418450A1 (en) * 2016-08-24 2018-02-26 Politechnika Warszawska Method for measuring angular micro-deviations relative to a laser beam, preferably rotation errors of machines and the interferometer for measurements of angular micro-deviations relative to a laser beam, preferably rotation errors of machines

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08166225A (en) * 1994-12-14 1996-06-25 Toyo Commun Equip Co Ltd Method and apparatus for measuring angle of minute optical component
US20090122322A1 (en) * 2007-11-09 2009-05-14 Bossa Nova Technologies, Llc Interferometric method and apparatus for linear detection of motion from a surface
PL418450A1 (en) * 2016-08-24 2018-02-26 Politechnika Warszawska Method for measuring angular micro-deviations relative to a laser beam, preferably rotation errors of machines and the interferometer for measurements of angular micro-deviations relative to a laser beam, preferably rotation errors of machines

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
YUSUKE SAITO, INT. J. OF PRECISIO ENG AND MANUFACT, 2007 *

Also Published As

Publication number Publication date
PL241303B1 (en) 2022-09-05

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