PL447058A1 - Sposób pomiaru rezystancji termicznej rdzenia ferromagnetycznego induktora i układ do pomiaru rezystancji termicznej rdzenia ferromagnetycznego induktora - Google Patents

Sposób pomiaru rezystancji termicznej rdzenia ferromagnetycznego induktora i układ do pomiaru rezystancji termicznej rdzenia ferromagnetycznego induktora

Info

Publication number
PL447058A1
PL447058A1 PL447058A PL44705823A PL447058A1 PL 447058 A1 PL447058 A1 PL 447058A1 PL 447058 A PL447058 A PL 447058A PL 44705823 A PL44705823 A PL 44705823A PL 447058 A1 PL447058 A1 PL 447058A1
Authority
PL
Poland
Prior art keywords
inductor
measuring
thermal resistance
ferromagnetic core
electronics
Prior art date
Application number
PL447058A
Other languages
English (en)
Inventor
Krzysztof Górecki
Original Assignee
Uniwersytet Morski W Gdyni
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Uniwersytet Morski W Gdyni filed Critical Uniwersytet Morski W Gdyni
Priority to PL447058A priority Critical patent/PL447058A1/pl
Publication of PL447058A1 publication Critical patent/PL447058A1/pl

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
    • H10P90/12—Preparing bulk and homogeneous wafers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G01R31/2603—Apparatus or methods therefor for curve tracing of semiconductor characteristics, e.g. on oscilloscope
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2608—Circuits therefor for testing bipolar transistors
    • G01R31/261—Circuits therefor for testing bipolar transistors for measuring break-down voltage or punch through voltage therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2621—Circuits therefor for testing field effect transistors, i.e. FET's
    • G01R31/2623—Circuits therefor for testing field effect transistors, i.e. FET's for measuring break-down voltage therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

Przedmiotem zgłoszenia jest sposób pomiaru rezystancji termicznej rdzenia ferromagnetycznego induktora i schematycznie przedstawiony na rysunku układ do pomiaru rezystancji termicznej rdzenia ferromagnetycznego induktora, które mają zastosowanie przy projektowaniu i diagnostyce układów impulsowego przekształcania energii elektrycznej stosowanych w przemyśle elektronicznym i elektrotechnicznym, jak również przy kontroli jakości elementów indukcyjnych dla przemysłu elektronicznego.
PL447058A 2023-12-11 2023-12-11 Sposób pomiaru rezystancji termicznej rdzenia ferromagnetycznego induktora i układ do pomiaru rezystancji termicznej rdzenia ferromagnetycznego induktora PL447058A1 (pl)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PL447058A PL447058A1 (pl) 2023-12-11 2023-12-11 Sposób pomiaru rezystancji termicznej rdzenia ferromagnetycznego induktora i układ do pomiaru rezystancji termicznej rdzenia ferromagnetycznego induktora

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PL447058A PL447058A1 (pl) 2023-12-11 2023-12-11 Sposób pomiaru rezystancji termicznej rdzenia ferromagnetycznego induktora i układ do pomiaru rezystancji termicznej rdzenia ferromagnetycznego induktora

Publications (1)

Publication Number Publication Date
PL447058A1 true PL447058A1 (pl) 2025-06-16

Family

ID=96014223

Family Applications (1)

Application Number Title Priority Date Filing Date
PL447058A PL447058A1 (pl) 2023-12-11 2023-12-11 Sposób pomiaru rezystancji termicznej rdzenia ferromagnetycznego induktora i układ do pomiaru rezystancji termicznej rdzenia ferromagnetycznego induktora

Country Status (1)

Country Link
PL (1) PL447058A1 (pl)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02272743A (ja) * 1989-04-14 1990-11-07 Yuzo Kamoshita 半導体のライフタイム測定装置
PL197351B1 (pl) * 2001-12-03 2008-03-31 Akademia Morska W Gdyni Sposób i układ do pomiaru rezystancji termicznej scalonych regulatorów PWM
US11227805B2 (en) * 2018-10-23 2022-01-18 Texas Instruments Incorporated System and method for surge-testing a gallium nitride transistor device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02272743A (ja) * 1989-04-14 1990-11-07 Yuzo Kamoshita 半導体のライフタイム測定装置
PL197351B1 (pl) * 2001-12-03 2008-03-31 Akademia Morska W Gdyni Sposób i układ do pomiaru rezystancji termicznej scalonych regulatorów PWM
US11227805B2 (en) * 2018-10-23 2022-01-18 Texas Instruments Incorporated System and method for surge-testing a gallium nitride transistor device

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