PT742434E - Metodo de microanalise quatitativa por raios x para ligas metalicas - Google Patents
Metodo de microanalise quatitativa por raios x para ligas metalicasInfo
- Publication number
- PT742434E PT742434E PT96500055T PT96500055T PT742434E PT 742434 E PT742434 E PT 742434E PT 96500055 T PT96500055 T PT 96500055T PT 96500055 T PT96500055 T PT 96500055T PT 742434 E PT742434 E PT 742434E
- Authority
- PT
- Portugal
- Prior art keywords
- sem
- intensities
- microanalysis
- epma
- ray
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 2
- 238000004452 microanalysis Methods 0.000 title abstract 2
- 229910001092 metal group alloy Inorganic materials 0.000 title 1
- 239000000463 material Substances 0.000 abstract 3
- 238000004453 electron probe microanalysis Methods 0.000 abstract 2
- 239000000203 mixture Substances 0.000 abstract 2
- 238000002441 X-ray diffraction Methods 0.000 abstract 1
- 239000000956 alloy Substances 0.000 abstract 1
- 229910045601 alloy Inorganic materials 0.000 abstract 1
- 238000004458 analytical method Methods 0.000 abstract 1
- 238000010894 electron beam technology Methods 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 abstract 1
- 239000002184 metal Substances 0.000 abstract 1
- 239000000126 substance Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20091—Measuring the energy-dispersion spectrum [EDS] of diffracted radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
- G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
- G01N23/2252—Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Dispersion Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| ES9500880A ES2114439B1 (es) | 1995-05-09 | 1995-05-09 | Dispositivo que contiene un conjunto de muestras patron de aceros para el microanalisis cuantitativo de aleaciones metalicas de base hierro. |
| ES9601013A ES2114490B1 (es) | 1996-05-07 | 1996-05-07 | Metodo para el microanalisis cuantitativo de rayos x de aleaciones metalicas basado en un conjunto de muestras patron de la aleacion y un modelo matematico de ajuste. |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| PT742434E true PT742434E (pt) | 2004-06-30 |
Family
ID=26154885
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PT96500055T PT742434E (pt) | 1995-05-09 | 1996-05-08 | Metodo de microanalise quatitativa por raios x para ligas metalicas |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP0742434B1 (pt) |
| AT (1) | ATE258680T1 (pt) |
| DE (1) | DE69631395T2 (pt) |
| PT (1) | PT742434E (pt) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20010112744A (ko) * | 2000-06-15 | 2001-12-22 | 권수식 | 합금화 용융아연도금강판의 합금화도 측정방법 |
| JP6009963B2 (ja) * | 2013-02-14 | 2016-10-19 | 日本電子株式会社 | 試料分析方法および試料分析装置 |
| JP6033716B2 (ja) * | 2013-03-18 | 2016-11-30 | 新日鐵住金株式会社 | 金属内の異物弁別方法 |
| CN104122283A (zh) * | 2014-08-01 | 2014-10-29 | 桂林理工大学 | 一种基于电子探针原位分析的全岩组份测试方法 |
| JP6336881B2 (ja) * | 2014-10-20 | 2018-06-06 | 日本電子株式会社 | 散布図表示装置、散布図表示方法、および表面分析装置 |
| KR101639130B1 (ko) * | 2014-10-23 | 2016-07-22 | 현대제철 주식회사 | 강 중 구성 원소의 epma 분석 방법 |
| RU2597935C1 (ru) * | 2015-06-17 | 2016-09-20 | Федеральное государственное бюджетное учреждение науки Ордена Трудового Красного Знамени Институт нефтехимического синтеза им. А.В. Топчиева Российской академии наук (ИНХС РАН) | Способ определения состава твердого раствора |
| CN110954448A (zh) * | 2019-12-11 | 2020-04-03 | 中国建材检验认证集团股份有限公司 | 定量测定物理混合物的组成及其含量的方法、装置和系统 |
| CN110987993A (zh) * | 2019-12-17 | 2020-04-10 | 中国地质大学（武汉） | 一种原位有机质定量统计分析方法 |
| CN111678937B (zh) * | 2020-05-21 | 2023-05-09 | 首钢集团有限公司 | 一种确定钢中微观偏析比取值范围的图像方法 |
| CN113138204B (zh) * | 2021-04-13 | 2024-07-09 | 武汉理工大学 | 适用于电子探针分析的n-标样的制备方法 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU890182A1 (ru) * | 1980-04-01 | 1981-12-15 | Березниковский филиал Всесоюзного научно-исследовательского и проектного института титана | Способ рентгенорадиометрического анализа неоднородных сплавов или лигатур |
| SU1670551A1 (ru) * | 1988-06-15 | 1991-08-15 | Институт нефте- и углехимического синтеза при Иркутском государственном университете | Способ проверки качества предварительной аттестации стандартных образцов сплавов |
| JP2853261B2 (ja) * | 1989-05-16 | 1999-02-03 | 三菱マテリアル株式会社 | 金属分析方法および分析装置 |
| JP2759680B2 (ja) * | 1989-07-19 | 1998-05-28 | 株式会社日立製作所 | 分析システム |
-
1996
- 1996-05-08 EP EP96500055A patent/EP0742434B1/en not_active Expired - Lifetime
- 1996-05-08 AT AT96500055T patent/ATE258680T1/de not_active IP Right Cessation
- 1996-05-08 PT PT96500055T patent/PT742434E/pt unknown
- 1996-05-08 DE DE69631395T patent/DE69631395T2/de not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| ATE258680T1 (de) | 2004-02-15 |
| EP0742434A1 (en) | 1996-11-13 |
| DE69631395T2 (de) | 2004-11-04 |
| DE69631395D1 (de) | 2004-03-04 |
| EP0742434B1 (en) | 2004-01-28 |
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