ES2114490A1 - Metodo para el microanalisis cuantitativo de rayos x de aleaciones metalicas basado en un conjunto de muestras patron de la aleacion y un modelo matematico de ajuste. - Google Patents

Metodo para el microanalisis cuantitativo de rayos x de aleaciones metalicas basado en un conjunto de muestras patron de la aleacion y un modelo matematico de ajuste.

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Publication number
ES2114490A1
ES2114490A1 ES09601013A ES9601013A ES2114490A1 ES 2114490 A1 ES2114490 A1 ES 2114490A1 ES 09601013 A ES09601013 A ES 09601013A ES 9601013 A ES9601013 A ES 9601013A ES 2114490 A1 ES2114490 A1 ES 2114490A1
Authority
ES
Spain
Prior art keywords
quantitative
alloy
standard samples
metal alloys
adjustment model
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
ES09601013A
Other languages
English (en)
Other versions
ES2114490B1 (es
Inventor
De Castillo Y Valder Fernandez
Arboledas Jaime Botella
Bello Juan Francisco Almagro
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Acerinox SA
Original Assignee
Acerinox SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Acerinox SA filed Critical Acerinox SA
Priority to ES9601013A priority Critical patent/ES2114490B1/es
Priority to EP96500055A priority patent/EP0742434B1/en
Priority to AT96500055T priority patent/ATE258680T1/de
Priority to DE69631395T priority patent/DE69631395T2/de
Priority to PT96500055T priority patent/PT742434E/pt
Publication of ES2114490A1 publication Critical patent/ES2114490A1/es
Application granted granted Critical
Publication of ES2114490B1 publication Critical patent/ES2114490B1/es
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

METODO PARA EL MICROANALISIS CUANTITATIVO DE RAYOS X DE ALEACIONES METALICAS BASADO EN UN CONJUNTO DE MUESTRAS PATRON DE LA ALEACION Y UN MODELO MATEMATICO DE AJUSTE. EL METODO SE BASA EN LA APLICACION DE UN DISPOSITIVO QUE CONTIENE UN CONJUNTO DE ALEACIONES DE LA MISMA BASE METALICA, HOMOGENEAS QUIMICA Y ESTRUCTURALMENTE, ADECUADAS PARA SU UTILIZACION COMO PATRONES EN EL MICROANALISIS CUANTITATIVO DE LA ALEACION METALICA DE INTERES, EN SISTEMAS DE ANALISIS DE RAYOS X QUE UTILIZAN DETECTORES DE DISPERSION DE ENERGIAS (EDS), O DE DISPERSION DE LONGITUDES DE ONDAS (WDS), ACOPLADOS A UN MICROSCOPIO ELECTRONICO DE BARRIDO (SEM) O A UNA MICROSONDA ELECTRONICA (EPMA). EMPLEANDO DICHO DISPOSITIVO SE CALIBRA EL SISTEMA DE ANALISIS, SE PREPARA LA MUESTRA A ANALIZAR, SE OBTIENEN LAS INTENSIDADES NETAS DE CADA ELEMENTO Y SE INTRODUCEN LOS VALORES DE LAS INTENSIDADES NETAS EN UNA ECUACION DE AJUSTE QUE RELACIONA MATEMATICAMENTE LAS INTENSIDADES DE LOS ELEMENTOS CON LA COMPOSICION CENTESIMAL PARA CALCULAR LA COMPOSICION DE LA MUESTRA PROBLEMA. ESTE METODO TIENE APLICACION EN LA INDUSTRIA SIDERURGICA.
ES9601013A 1995-05-09 1996-05-07 Metodo para el microanalisis cuantitativo de rayos x de aleaciones metalicas basado en un conjunto de muestras patron de la aleacion y un modelo matematico de ajuste. Expired - Fee Related ES2114490B1 (es)

Priority Applications (5)

Application Number Priority Date Filing Date Title
ES9601013A ES2114490B1 (es) 1996-05-07 1996-05-07 Metodo para el microanalisis cuantitativo de rayos x de aleaciones metalicas basado en un conjunto de muestras patron de la aleacion y un modelo matematico de ajuste.
EP96500055A EP0742434B1 (en) 1995-05-09 1996-05-08 X-ray quantative microanalysis method for metal alloys
AT96500055T ATE258680T1 (de) 1995-05-09 1996-05-08 Quantatives mikroanalyseverfahren mit röntgenstrahlen für metallegierungen
DE69631395T DE69631395T2 (de) 1995-05-09 1996-05-08 Quantatives Mikroanalyseverfahren mit Röntgenstrahlen für Metallegierungen
PT96500055T PT742434E (pt) 1995-05-09 1996-05-08 Metodo de microanalise quatitativa por raios x para ligas metalicas

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES9601013A ES2114490B1 (es) 1996-05-07 1996-05-07 Metodo para el microanalisis cuantitativo de rayos x de aleaciones metalicas basado en un conjunto de muestras patron de la aleacion y un modelo matematico de ajuste.

Publications (2)

Publication Number Publication Date
ES2114490A1 true ES2114490A1 (es) 1998-05-16
ES2114490B1 ES2114490B1 (es) 1999-02-01

Family

ID=8294717

Family Applications (1)

Application Number Title Priority Date Filing Date
ES9601013A Expired - Fee Related ES2114490B1 (es) 1995-05-09 1996-05-07 Metodo para el microanalisis cuantitativo de rayos x de aleaciones metalicas basado en un conjunto de muestras patron de la aleacion y un modelo matematico de ajuste.

Country Status (1)

Country Link
ES (1) ES2114490B1 (es)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4134012A (en) * 1977-10-17 1979-01-09 Bausch & Lomb, Inc. X-ray analytical system
JPS58150845A (ja) * 1982-03-04 1983-09-07 Kawatetsu Kousen Kogyo Kk Ｘ線測定による多元系合金めつき層の定量分析法
GB2116698A (en) * 1982-02-26 1983-09-28 Coal Ind Coal analysis using x-rays
US4592082A (en) * 1984-08-10 1986-05-27 The United States Of America As Represented By The United States Department Of Energy Quantitative determination of mineral composition by powder X-ray diffraction
US4659437A (en) * 1985-01-19 1987-04-21 Tokusen Kogyo Kabushiki Kaisha Method of thermal diffusion alloy plating for steel wire on continuous basis
US4697080A (en) * 1986-01-06 1987-09-29 The United States Of America As Represented By The United States Department Of Energy Analysis with electron microscope of multielement samples using pure element standards
JPH0335149A (ja) * 1989-06-30 1991-02-15 Nkk Corp メッキ鋼板のメッキ付着量およびメッキ被膜組成の測定方法およびその測定装置

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4134012A (en) * 1977-10-17 1979-01-09 Bausch & Lomb, Inc. X-ray analytical system
GB2116698A (en) * 1982-02-26 1983-09-28 Coal Ind Coal analysis using x-rays
JPS58150845A (ja) * 1982-03-04 1983-09-07 Kawatetsu Kousen Kogyo Kk Ｘ線測定による多元系合金めつき層の定量分析法
US4592082A (en) * 1984-08-10 1986-05-27 The United States Of America As Represented By The United States Department Of Energy Quantitative determination of mineral composition by powder X-ray diffraction
US4659437A (en) * 1985-01-19 1987-04-21 Tokusen Kogyo Kabushiki Kaisha Method of thermal diffusion alloy plating for steel wire on continuous basis
US4697080A (en) * 1986-01-06 1987-09-29 The United States Of America As Represented By The United States Department Of Energy Analysis with electron microscope of multielement samples using pure element standards
JPH0335149A (ja) * 1989-06-30 1991-02-15 Nkk Corp メッキ鋼板のメッキ付着量およびメッキ被膜組成の測定方法およびその測定装置

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
BASE DE DATOS PAJ en EPOQUE. Japanese Patent Information Organisation (Tokio, JP) & JP 3035149 A (NKK CORP) 15.02.91 * Resumen * *
BASE DE DATOS PAJ en EPOQUE. Japanese Patent Information Organisation (Tokio, JP) & JP 58150845 A (KAWATETSU KOUSEN KOGYO y otros) 07.09.83 * Resumen * *

Also Published As

Publication number Publication date
ES2114490B1 (es) 1999-02-01

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