SE0003985L - En anordning och ett förfarande för inspektion - Google Patents

En anordning och ett förfarande för inspektion

Info

Publication number
SE0003985L
SE0003985L SE0003985A SE0003985A SE0003985L SE 0003985 L SE0003985 L SE 0003985L SE 0003985 A SE0003985 A SE 0003985A SE 0003985 A SE0003985 A SE 0003985A SE 0003985 L SE0003985 L SE 0003985L
Authority
SE
Sweden
Prior art keywords
layer
multilayer structure
arrangement
joint layer
temperature distribution
Prior art date
Application number
SE0003985A
Other languages
Unknown language ( )
English (en)
Other versions
SE0003985D0 (sv
Inventor
Torbjoern Nilsson
Mikael Johansson
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Priority to SE0003985A priority Critical patent/SE0003985L/sv
Publication of SE0003985D0 publication Critical patent/SE0003985D0/sv
Priority to AU2002223644A priority patent/AU2002223644A1/en
Priority to PCT/EP2001/012312 priority patent/WO2002037089A1/en
Priority to US10/001,290 priority patent/US20020050566A1/en
Publication of SE0003985L publication Critical patent/SE0003985L/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
SE0003985A 2000-11-01 2000-11-01 En anordning och ett förfarande för inspektion SE0003985L (sv)

Priority Applications (4)

Application Number Priority Date Filing Date Title
SE0003985A SE0003985L (sv) 2000-11-01 2000-11-01 En anordning och ett förfarande för inspektion
AU2002223644A AU2002223644A1 (en) 2000-11-01 2001-10-25 An arrangement and a method for inspection
PCT/EP2001/012312 WO2002037089A1 (en) 2000-11-01 2001-10-25 An arrangement and a method for inspection
US10/001,290 US20020050566A1 (en) 2000-11-01 2001-11-01 Arrangement and a method for inspection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0003985A SE0003985L (sv) 2000-11-01 2000-11-01 En anordning och ett förfarande för inspektion

Publications (2)

Publication Number Publication Date
SE0003985D0 SE0003985D0 (sv) 2000-11-01
SE0003985L true SE0003985L (sv) 2002-05-02

Family

ID=20281656

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0003985A SE0003985L (sv) 2000-11-01 2000-11-01 En anordning och ett förfarande för inspektion

Country Status (4)

Country Link
US (1) US20020050566A1 (sv)
AU (1) AU2002223644A1 (sv)
SE (1) SE0003985L (sv)
WO (1) WO2002037089A1 (sv)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004051244A1 (de) * 2002-12-03 2004-06-17 Solectron Gmbh Verfahren und vorrichtung zur detektion von defekten leiterplattenrohlingen
US7425093B2 (en) 2003-07-16 2008-09-16 Cabot Corporation Thermography test method and apparatus for bonding evaluation in sputtering targets
US7129492B2 (en) * 2003-07-29 2006-10-31 Toyota Motor Manufacturing North America, Inc. Systems and methods for inspecting coatings
JP2007502978A (ja) * 2003-08-21 2007-02-15 グローバル セキュリティー デバイシーズ リミテッド 隠匿物を検出する方法
US7462809B2 (en) * 2004-10-22 2008-12-09 Northrop Grumman Corporation Spectral filter system for infrared imaging of substrates through coatings
US20080111074A1 (en) * 2004-10-22 2008-05-15 Northrop Grumman Corporation Method for infrared imaging of substrates through coatings
US7164146B2 (en) * 2004-10-22 2007-01-16 Northrop Grumman Corporation System for detecting structural defects and features utilizing blackbody self-illumination
US7520666B2 (en) * 2005-12-07 2009-04-21 Technion Research And Development Foundation Ltd. Method and system for detecting damage in layered structures
US7485882B2 (en) * 2006-06-15 2009-02-03 Siemens Energy, Inc. Hand held magnetic induction thermography system
US8527215B2 (en) * 2009-05-15 2013-09-03 Siemens Energy, Inc. Automated inspection system and method for nondestructive inspection of a workpiece using induction thermography
US8204294B2 (en) * 2009-11-25 2012-06-19 Toyota Motor Engineering & Manufacturing North America, Inc. Systems and methods for detecting defects in coatings utilizing color-based thermal mismatch
CN102156146B (zh) * 2011-04-08 2012-12-12 郑双武 受热钢管焊接接头裂纹检测方法
JP5469653B2 (ja) * 2011-12-12 2014-04-16 本田技研工業株式会社 非破壊検査システム
CN103308555A (zh) * 2012-03-15 2013-09-18 沈小俊 一种红外热成像检测桥梁橡胶支座缺陷的方法
CN104730078A (zh) * 2013-12-23 2015-06-24 北京红源光电技术公司 一种基于红外热像仪aoi的电路板检测方法
JP7126200B2 (ja) * 2018-09-28 2022-08-26 株式会社カネカ 半導体関連部材の熱拡散性能の評価方法および評価装置並びに半導体関連部材の熱抵抗算出方法および算出装置
WO2023048161A1 (ja) * 2021-09-21 2023-03-30 国立大学法人東海国立大学機構 界面情報特定装置、界面情報特定方法、プログラム、内部情報特定装置および光加熱装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2569851A1 (fr) * 1984-09-04 1986-03-07 Gen Electric Procede de detection de defaut d'adherence
GB8431928D0 (en) * 1984-12-18 1985-01-30 Stevenson G M Non-destructively testing heat shrinkable sleeves
JPS62237346A (ja) * 1986-04-08 1987-10-17 Olympus Optical Co Ltd 表面実装部品の半田付検査装置
US5631465A (en) * 1996-02-29 1997-05-20 Shepard; Steven M. Method of interpreting thermographic data for non-destructive evaluation
DE19841968C1 (de) * 1998-09-14 2000-06-29 Karlsruhe Forschzent Verfahren zur Bestimmung der Haftung in einem Schichtverbund
US6394646B1 (en) * 1999-04-16 2002-05-28 General Electric Company Method and apparatus for quantitative nondestructive evaluation of metal airfoils using high resolution transient thermography
JP2002543379A (ja) * 1999-04-23 2002-12-17 プレスコ テクノロジー インコーポレーテッド 多層プラスチック容器検査用の装置と方法

Also Published As

Publication number Publication date
SE0003985D0 (sv) 2000-11-01
US20020050566A1 (en) 2002-05-02
WO2002037089A1 (en) 2002-05-10
AU2002223644A1 (en) 2002-05-15

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