SE0101374L - Förfarande och anordning för optisk avsyning - Google Patents

Förfarande och anordning för optisk avsyning

Info

Publication number
SE0101374L
SE0101374L SE0101374A SE0101374A SE0101374L SE 0101374 L SE0101374 L SE 0101374L SE 0101374 A SE0101374 A SE 0101374A SE 0101374 A SE0101374 A SE 0101374A SE 0101374 L SE0101374 L SE 0101374L
Authority
SE
Sweden
Prior art keywords
sweep
inspection
optical inspection
scanner
inspection method
Prior art date
Application number
SE0101374A
Other languages
Unknown language ( )
English (en)
Swedish (sv)
Other versions
SE0101374D0 (sv
Inventor
Svante Bjoerk
Original Assignee
Svante Bjoerk Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Svante Bjoerk Ab filed Critical Svante Bjoerk Ab
Priority to SE0101374A priority Critical patent/SE0101374L/
Publication of SE0101374D0 publication Critical patent/SE0101374D0/xx
Priority to EP02445049A priority patent/EP1348946B1/de
Priority to AT02445049T priority patent/ATE409312T1/de
Priority to DE60229036T priority patent/DE60229036D1/de
Priority to US10/125,590 priority patent/US6961127B2/en
Publication of SE0101374L publication Critical patent/SE0101374L/

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
SE0101374A 2001-04-19 2001-04-19 Förfarande och anordning för optisk avsyning SE0101374L (sv)

Priority Applications (5)

Application Number Priority Date Filing Date Title
SE0101374A SE0101374L (sv) 2001-04-19 2001-04-19 Förfarande och anordning för optisk avsyning
EP02445049A EP1348946B1 (de) 2001-04-19 2002-04-18 Vorrichtung und Verfahren zur optischen Inspektion
AT02445049T ATE409312T1 (de) 2001-04-19 2002-04-18 Vorrichtung und verfahren zur optischen inspektion
DE60229036T DE60229036D1 (de) 2001-04-19 2002-04-18 Vorrichtung und Verfahren zur optischen Inspektion
US10/125,590 US6961127B2 (en) 2001-04-19 2002-04-19 Device and method for optical inspection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0101374A SE0101374L (sv) 2001-04-19 2001-04-19 Förfarande och anordning för optisk avsyning

Publications (2)

Publication Number Publication Date
SE0101374D0 SE0101374D0 (sv) 2001-04-19
SE0101374L true SE0101374L (sv) 2002-10-20

Family

ID=20283814

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0101374A SE0101374L (sv) 2001-04-19 2001-04-19 Förfarande och anordning för optisk avsyning

Country Status (5)

Country Link
US (1) US6961127B2 (de)
EP (1) EP1348946B1 (de)
AT (1) ATE409312T1 (de)
DE (1) DE60229036D1 (de)
SE (1) SE0101374L (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE514090C2 (sv) * 1999-04-12 2000-12-18 Photonic Systems Ab Förfarande och system för detektering av föroreningar i ett transparent material
EP2339419A1 (de) 2003-12-31 2011-06-29 3M Innovative Properties Co. Maximierung des Ausbeute von Artikeln aus Bahnen-Materialien
US6950717B1 (en) 2004-03-19 2005-09-27 Sara Lee Corporation System and method for controlling width and stitch density of a fabric web
US7623699B2 (en) 2004-04-19 2009-11-24 3M Innovative Properties Company Apparatus and method for the automated marking of defects on webs of material
US7889907B2 (en) * 2005-01-12 2011-02-15 The Boeing Company Apparatus and methods for inspecting tape lamination
US8175739B2 (en) 2007-07-26 2012-05-08 3M Innovative Properties Company Multi-unit process spatial synchronization
US7542821B2 (en) 2007-07-26 2009-06-02 3M Innovative Properties Company Multi-unit process spatial synchronization of image inspection systems
US7797133B2 (en) 2008-09-10 2010-09-14 3M Innovative Properties Company Multi-roller registered repeat defect detection of a web process line
ITMI20090218A1 (it) * 2009-02-19 2010-08-20 Laem System S R L Dispositivo e metodo per il controllo di qualità in linea di impianti per la produzione di film estrusi in materiale termoplastico
US8428334B2 (en) * 2010-03-26 2013-04-23 Cooper S.K. Kuo Inspection System
JP5474869B2 (ja) * 2010-09-03 2014-04-16 日東電工株式会社 偏光膜を有する積層体ストリップロールの製造方法
US10063727B2 (en) * 2015-12-29 2018-08-28 Kabushiki Kaisha Toshiba Marking apparatus and decoloring apparatus
US9594059B1 (en) * 2015-12-31 2017-03-14 The Boeing Company System and method for automated bond testing
CN111630072A (zh) 2018-01-31 2020-09-04 3M创新有限公司 光不稳定的巴比妥酸酯化合物
WO2019150242A1 (en) * 2018-01-31 2019-08-08 3M Innovative Properties Company Infrared light transmission inspection for continuous moving web
EP3746775A1 (de) 2018-01-31 2020-12-09 3M Innovative Properties Company Anordnung aus virtuellen kameras zur inspektion hergestellter bahnen

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5757246A (en) * 1980-09-25 1982-04-06 Fuji Photo Film Co Ltd Detecting and measuring apparatus for flaw
US5068799A (en) 1985-04-24 1991-11-26 Jarrett Jr Harold M System and method for detecting flaws in continuous web materials
GB8822183D0 (en) * 1988-09-21 1988-10-26 Radix Systems Ltd Method & apparatus for processing line scan optical images
US5440648A (en) 1991-11-19 1995-08-08 Dalsa, Inc. High speed defect detection apparatus having defect detection circuits mounted in the camera housing
JP3278518B2 (ja) * 1993-12-27 2002-04-30 日本板硝子株式会社 物体の構造および／または模様に関する欠陥を検出する方法および装置
EP0696733A1 (de) * 1994-08-12 1996-02-14 Kabushiki Kaisha Toshiba Anordnung zum Prüfen von Oberflächen
SE511822C2 (sv) 1996-11-13 1999-11-29 Svante Bjoerk Ab Anordning och metod för att markera defekter på en transparent remsa
SE9801170L (sv) * 1998-04-02 1999-10-03 Photonic Systems Ab Förfarande och system för övervakning eller avsökning av ett föremål, material eller dylikt
SE514090C2 (sv) 1999-04-12 2000-12-18 Photonic Systems Ab Förfarande och system för detektering av föroreningar i ett transparent material
SE514081C2 (sv) 1999-04-12 2000-12-18 Photonic Systems Ab Förfarande och anordning för kalibrering av utrustning för ytjämnhetsbestämning hos film- eller arkmaterial

Also Published As

Publication number Publication date
SE0101374D0 (sv) 2001-04-19
US6961127B2 (en) 2005-11-01
DE60229036D1 (de) 2008-11-06
EP1348946B1 (de) 2008-09-24
EP1348946A1 (de) 2003-10-01
US20020154307A1 (en) 2002-10-24
ATE409312T1 (de) 2008-10-15

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