SG54471A1 - Antifuse element and method for manufacturing the same - Google Patents

Antifuse element and method for manufacturing the same

Info

Publication number
SG54471A1
SG54471A1 SG1997000481A SG1997000481A SG54471A1 SG 54471 A1 SG54471 A1 SG 54471A1 SG 1997000481 A SG1997000481 A SG 1997000481A SG 1997000481 A SG1997000481 A SG 1997000481A SG 54471 A1 SG54471 A1 SG 54471A1
Authority
SG
Singapore
Prior art keywords
manufacturing
same
antifuse element
antifuse
Prior art date
Application number
SG1997000481A
Other languages
English (en)
Inventor
Toru Yamaoka
Hiroshi Sakurai
Hirotsugu Honda
Hiroshi Yuasa
Original Assignee
Matsushita Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp filed Critical Matsushita Electronics Corp
Publication of SG54471A1 publication Critical patent/SG54471A1/en

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W20/00Interconnections in chips, wafers or substrates
    • H10W20/40Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
    • H10W20/49Adaptable interconnections, e.g. fuses or antifuses
    • H10W20/491Antifuses, i.e. interconnections changeable from non-conductive to conductive
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/0123Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
    • H10D84/0126Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
    • H10D84/0144Manufacturing their gate insulating layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/80Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
    • H10D84/82Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
    • H10D84/83Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
    • H10D84/834Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET] comprising FinFETs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W20/00Interconnections in chips, wafers or substrates
    • H10W20/01Manufacture or treatment
    • H10W20/031Manufacture or treatment of conductive parts of the interconnections
    • H10W20/064Manufacture or treatment of conductive parts of the interconnections by modifying the conductivity of conductive parts, e.g. by alloying
    • H10W20/065Manufacture or treatment of conductive parts of the interconnections by modifying the conductivity of conductive parts, e.g. by alloying by making at least a portion of the conductive part non-conductive, e.g. by oxidation
SG1997000481A 1996-08-08 1997-02-25 Antifuse element and method for manufacturing the same SG54471A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8209937A JPH1056066A (ja) 1996-08-08 1996-08-08 アンチヒューズ素子およびその製造方法

Publications (1)

Publication Number Publication Date
SG54471A1 true SG54471A1 (en) 1998-11-16

Family

ID=16581138

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1997000481A SG54471A1 (en) 1996-08-08 1997-02-25 Antifuse element and method for manufacturing the same

Country Status (7)

Country Link
US (1) US5913138A (fr)
EP (1) EP0823733A3 (fr)
JP (1) JPH1056066A (fr)
KR (1) KR100252574B1 (fr)
CN (1) CN1173736A (fr)
SG (1) SG54471A1 (fr)
TW (1) TW428285B (fr)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5856234A (en) * 1993-09-14 1999-01-05 Actel Corporation Method of fabricating an antifuse
US5485031A (en) 1993-11-22 1996-01-16 Actel Corporation Antifuse structure suitable for VLSI application
JP3027195B2 (ja) 1995-06-02 2000-03-27 アクテル・コーポレイション 隆起タングステンプラグ アンチヒューズ及びその製造方法
US5986322A (en) * 1995-06-06 1999-11-16 Mccollum; John L. Reduced leakage antifuse structure
US6541363B2 (en) 1996-10-17 2003-04-01 Guobiao Zhang Antifuse manufacturing process
DE19931082B4 (de) * 1999-07-06 2005-02-24 Robert Bosch Gmbh Abgleichbares Halbleiterbauelement
US6774439B2 (en) * 2000-02-17 2004-08-10 Kabushiki Kaisha Toshiba Semiconductor device using fuse/anti-fuse system
JP3629187B2 (ja) * 2000-06-28 2005-03-16 株式会社東芝 電気フューズ、この電気フューズを備えた半導体装置及びその製造方法
GB0111384D0 (en) * 2001-05-10 2001-07-04 Esm Ltd Design and processing of antifuse structure
US7816188B2 (en) 2001-07-30 2010-10-19 Sandisk 3D Llc Process for fabricating a dielectric film using plasma oxidation
US20030183868A1 (en) * 2002-04-02 2003-10-02 Peter Fricke Memory structures
US6794726B2 (en) 2002-04-17 2004-09-21 International Business Machines Corporation MOS antifuse with low post-program resistance
US7196570B2 (en) * 2004-05-05 2007-03-27 Taiwan Semiconductor Manufacturing Co., Ltd. Multiple-time programmable resistance circuit
JP5214213B2 (ja) * 2006-10-24 2013-06-19 株式会社半導体エネルギー研究所 記憶装置の駆動方法
KR101408716B1 (ko) 2006-10-24 2014-06-20 가부시키가이샤 한도오따이 에네루기 켄큐쇼 저장 디바이스를 포함하는 반도체 디바이스와 이를 구동하기 위한 방법
JP6150997B2 (ja) * 2012-10-03 2017-06-21 エスアイアイ・セミコンダクタ株式会社 半導体集積回路装置
CN104979282A (zh) * 2015-06-10 2015-10-14 中国电子科技集团公司第五十八研究所 一种降低mtm反熔丝介质漏电流的工艺方法
US11107764B2 (en) 2017-09-28 2021-08-31 Intel Corporation Group III-V semiconductor fuses and their methods of fabrication
US11621225B2 (en) * 2020-09-06 2023-04-04 Nanya Technology Corporation Electrical fuse matrix

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5181096A (en) * 1990-04-12 1993-01-19 Actel Corporation Electrically programmable antifuse incorporating dielectric and amorphous silicon interlayer
US5866937A (en) * 1990-04-12 1999-02-02 Actel Corporation Double half via antifuse
US5196724A (en) * 1991-04-26 1993-03-23 Quicklogic Corporation Programmable interconnect structures and programmable integrated circuits
WO1993004499A1 (fr) * 1991-08-19 1993-03-04 Crosspoint Solutions, Inc. Antifusible ameliore et son procede de fabrication
JPH05198681A (ja) * 1991-10-23 1993-08-06 Fujitsu Ltd アンチヒューズを備えた半導体装置
JPH08502857A (ja) * 1992-08-21 1996-03-26 ジリンクス,インコーポレーテッド アンチヒューズ構造およびその形成方法
US5475253A (en) * 1992-08-21 1995-12-12 Xilinx, Inc. Antifuse structure with increased breakdown at edges
EP0660408A1 (fr) * 1993-12-16 1995-06-28 United Technologies Corporation Procédé de fabrication des dispositifs anti-fusibles
US5440167A (en) * 1994-02-23 1995-08-08 Crosspoint Solutions, Inc. Antifuse with double via contact and method of manufacture therefor
US5682058A (en) * 1994-03-31 1997-10-28 Crosspoint Solutions, Inc. Multilayer antifuse with low leakage and method of manufacture therefor
US5514900A (en) * 1994-03-31 1996-05-07 Crosspoint Solutions, Inc. Mutlilayered antifuse with intermediate metal layer
JPH0831944A (ja) * 1994-07-15 1996-02-02 Hitachi Ltd 半導体集積回路装置およびその製造方法
JP3027195B2 (ja) * 1995-06-02 2000-03-27 アクテル・コーポレイション 隆起タングステンプラグ アンチヒューズ及びその製造方法
US5986322A (en) * 1995-06-06 1999-11-16 Mccollum; John L. Reduced leakage antifuse structure

Also Published As

Publication number Publication date
KR19980018039A (ko) 1998-06-05
JPH1056066A (ja) 1998-02-24
EP0823733A2 (fr) 1998-02-11
TW428285B (en) 2001-04-01
KR100252574B1 (ko) 2000-04-15
US5913138A (en) 1999-06-15
EP0823733A3 (fr) 1998-07-15
CN1173736A (zh) 1998-02-18

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