SG54471A1 - Antifuse element and method for manufacturing the same - Google Patents
Antifuse element and method for manufacturing the sameInfo
- Publication number
- SG54471A1 SG54471A1 SG1997000481A SG1997000481A SG54471A1 SG 54471 A1 SG54471 A1 SG 54471A1 SG 1997000481 A SG1997000481 A SG 1997000481A SG 1997000481 A SG1997000481 A SG 1997000481A SG 54471 A1 SG54471 A1 SG 54471A1
- Authority
- SG
- Singapore
- Prior art keywords
- manufacturing
- same
- antifuse element
- antifuse
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
- H10W20/49—Adaptable interconnections, e.g. fuses or antifuses
- H10W20/491—Antifuses, i.e. interconnections changeable from non-conductive to conductive
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
- H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
- H10D84/0144—Manufacturing their gate insulating layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
- H10D84/834—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET] comprising FinFETs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/01—Manufacture or treatment
- H10W20/031—Manufacture or treatment of conductive parts of the interconnections
- H10W20/064—Manufacture or treatment of conductive parts of the interconnections by modifying the conductivity of conductive parts, e.g. by alloying
- H10W20/065—Manufacture or treatment of conductive parts of the interconnections by modifying the conductivity of conductive parts, e.g. by alloying by making at least a portion of the conductive part non-conductive, e.g. by oxidation
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8209937A JPH1056066A (ja) | 1996-08-08 | 1996-08-08 | アンチヒューズ素子およびその製造方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG54471A1 true SG54471A1 (en) | 1998-11-16 |
Family
ID=16581138
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG1997000481A SG54471A1 (en) | 1996-08-08 | 1997-02-25 | Antifuse element and method for manufacturing the same |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US5913138A (fr) |
| EP (1) | EP0823733A3 (fr) |
| JP (1) | JPH1056066A (fr) |
| KR (1) | KR100252574B1 (fr) |
| CN (1) | CN1173736A (fr) |
| SG (1) | SG54471A1 (fr) |
| TW (1) | TW428285B (fr) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5856234A (en) * | 1993-09-14 | 1999-01-05 | Actel Corporation | Method of fabricating an antifuse |
| US5485031A (en) | 1993-11-22 | 1996-01-16 | Actel Corporation | Antifuse structure suitable for VLSI application |
| JP3027195B2 (ja) | 1995-06-02 | 2000-03-27 | アクテル・コーポレイション | 隆起タングステンプラグ アンチヒューズ及びその製造方法 |
| US5986322A (en) * | 1995-06-06 | 1999-11-16 | Mccollum; John L. | Reduced leakage antifuse structure |
| US6541363B2 (en) | 1996-10-17 | 2003-04-01 | Guobiao Zhang | Antifuse manufacturing process |
| DE19931082B4 (de) * | 1999-07-06 | 2005-02-24 | Robert Bosch Gmbh | Abgleichbares Halbleiterbauelement |
| US6774439B2 (en) * | 2000-02-17 | 2004-08-10 | Kabushiki Kaisha Toshiba | Semiconductor device using fuse/anti-fuse system |
| JP3629187B2 (ja) * | 2000-06-28 | 2005-03-16 | 株式会社東芝 | 電気フューズ、この電気フューズを備えた半導体装置及びその製造方法 |
| GB0111384D0 (en) * | 2001-05-10 | 2001-07-04 | Esm Ltd | Design and processing of antifuse structure |
| US7816188B2 (en) | 2001-07-30 | 2010-10-19 | Sandisk 3D Llc | Process for fabricating a dielectric film using plasma oxidation |
| US20030183868A1 (en) * | 2002-04-02 | 2003-10-02 | Peter Fricke | Memory structures |
| US6794726B2 (en) | 2002-04-17 | 2004-09-21 | International Business Machines Corporation | MOS antifuse with low post-program resistance |
| US7196570B2 (en) * | 2004-05-05 | 2007-03-27 | Taiwan Semiconductor Manufacturing Co., Ltd. | Multiple-time programmable resistance circuit |
| JP5214213B2 (ja) * | 2006-10-24 | 2013-06-19 | 株式会社半導体エネルギー研究所 | 記憶装置の駆動方法 |
| KR101408716B1 (ko) | 2006-10-24 | 2014-06-20 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 저장 디바이스를 포함하는 반도체 디바이스와 이를 구동하기 위한 방법 |
| JP6150997B2 (ja) * | 2012-10-03 | 2017-06-21 | エスアイアイ・セミコンダクタ株式会社 | 半導体集積回路装置 |
| CN104979282A (zh) * | 2015-06-10 | 2015-10-14 | 中国电子科技集团公司第五十八研究所 | 一种降低mtm反熔丝介质漏电流的工艺方法 |
| US11107764B2 (en) | 2017-09-28 | 2021-08-31 | Intel Corporation | Group III-V semiconductor fuses and their methods of fabrication |
| US11621225B2 (en) * | 2020-09-06 | 2023-04-04 | Nanya Technology Corporation | Electrical fuse matrix |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5181096A (en) * | 1990-04-12 | 1993-01-19 | Actel Corporation | Electrically programmable antifuse incorporating dielectric and amorphous silicon interlayer |
| US5866937A (en) * | 1990-04-12 | 1999-02-02 | Actel Corporation | Double half via antifuse |
| US5196724A (en) * | 1991-04-26 | 1993-03-23 | Quicklogic Corporation | Programmable interconnect structures and programmable integrated circuits |
| WO1993004499A1 (fr) * | 1991-08-19 | 1993-03-04 | Crosspoint Solutions, Inc. | Antifusible ameliore et son procede de fabrication |
| JPH05198681A (ja) * | 1991-10-23 | 1993-08-06 | Fujitsu Ltd | アンチヒューズを備えた半導体装置 |
| JPH08502857A (ja) * | 1992-08-21 | 1996-03-26 | ジリンクス,インコーポレーテッド | アンチヒューズ構造およびその形成方法 |
| US5475253A (en) * | 1992-08-21 | 1995-12-12 | Xilinx, Inc. | Antifuse structure with increased breakdown at edges |
| EP0660408A1 (fr) * | 1993-12-16 | 1995-06-28 | United Technologies Corporation | Procédé de fabrication des dispositifs anti-fusibles |
| US5440167A (en) * | 1994-02-23 | 1995-08-08 | Crosspoint Solutions, Inc. | Antifuse with double via contact and method of manufacture therefor |
| US5682058A (en) * | 1994-03-31 | 1997-10-28 | Crosspoint Solutions, Inc. | Multilayer antifuse with low leakage and method of manufacture therefor |
| US5514900A (en) * | 1994-03-31 | 1996-05-07 | Crosspoint Solutions, Inc. | Mutlilayered antifuse with intermediate metal layer |
| JPH0831944A (ja) * | 1994-07-15 | 1996-02-02 | Hitachi Ltd | 半導体集積回路装置およびその製造方法 |
| JP3027195B2 (ja) * | 1995-06-02 | 2000-03-27 | アクテル・コーポレイション | 隆起タングステンプラグ アンチヒューズ及びその製造方法 |
| US5986322A (en) * | 1995-06-06 | 1999-11-16 | Mccollum; John L. | Reduced leakage antifuse structure |
-
1996
- 1996-08-08 JP JP8209937A patent/JPH1056066A/ja active Pending
-
1997
- 1997-02-19 TW TW086101962A patent/TW428285B/zh not_active IP Right Cessation
- 1997-02-25 SG SG1997000481A patent/SG54471A1/en unknown
- 1997-02-26 EP EP97103111A patent/EP0823733A3/fr not_active Withdrawn
- 1997-02-26 US US08/806,799 patent/US5913138A/en not_active Expired - Fee Related
- 1997-02-27 CN CN97103004A patent/CN1173736A/zh active Pending
- 1997-02-28 KR KR1019970006615A patent/KR100252574B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| KR19980018039A (ko) | 1998-06-05 |
| JPH1056066A (ja) | 1998-02-24 |
| EP0823733A2 (fr) | 1998-02-11 |
| TW428285B (en) | 2001-04-01 |
| KR100252574B1 (ko) | 2000-04-15 |
| US5913138A (en) | 1999-06-15 |
| EP0823733A3 (fr) | 1998-07-15 |
| CN1173736A (zh) | 1998-02-18 |
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