SG63732A1 - Esd protection for high density drams using triple-well technology - Google Patents

Esd protection for high density drams using triple-well technology

Info

Publication number
SG63732A1
SG63732A1 SG1997002774A SG1997002774A SG63732A1 SG 63732 A1 SG63732 A1 SG 63732A1 SG 1997002774 A SG1997002774 A SG 1997002774A SG 1997002774 A SG1997002774 A SG 1997002774A SG 63732 A1 SG63732 A1 SG 63732A1
Authority
SG
Singapore
Prior art keywords
triple
high density
esd protection
well technology
density drams
Prior art date
Application number
SG1997002774A
Other languages
English (en)
Inventor
E Ajith Amerasekera
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of SG63732A1 publication Critical patent/SG63732A1/en

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/60Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
    • H10D89/601Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
    • H10D89/711Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using bipolar transistors as protective elements
    • H10D89/713Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using bipolar transistors as protective elements including a PNP transistor and a NPN transistor, wherein each of said transistors has its base region coupled to the collector region of the other transistor, e.g. silicon controlled rectifier [SCR] devices
SG1997002774A 1996-08-02 1997-08-02 Esd protection for high density drams using triple-well technology SG63732A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US2305396P 1996-08-02 1996-08-02

Publications (1)

Publication Number Publication Date
SG63732A1 true SG63732A1 (en) 1999-03-30

Family

ID=21812862

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1997002774A SG63732A1 (en) 1996-08-02 1997-08-02 Esd protection for high density drams using triple-well technology

Country Status (5)

Country Link
EP (1) EP0822596A3 (fr)
JP (1) JPH1084098A (fr)
KR (1) KR100502379B1 (fr)
SG (1) SG63732A1 (fr)
TW (1) TW401637B (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19752848C2 (de) * 1997-11-28 2003-12-24 Infineon Technologies Ag Elektrisch entkoppelter Feldeffekt-Transistor in Dreifach-Wanne und Verwendung desselben
EP1127377B1 (fr) * 1999-01-15 2005-04-20 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Transistor de securite a dissipation electrostatique
SE9900439D0 (sv) * 1999-02-09 1999-02-09 Ericsson Telefon Ab L M Electrostatic discharge protection of integrated circuits
GR20000100040A (el) * 2000-02-11 2001-10-31 I.S.D. Λυσεις Ολοκληρωμενων Συστηματων Ανωνυμος Εταιρεια Προστασια εναντι esd τυπου scr με συζευξη p-well για τεχνολογιες τριπλου πηγαδιου cmos/bicmos
JP2002124580A (ja) 2000-10-18 2002-04-26 Yamaha Corp 入力保護回路
GR20010100030A (el) * 2001-01-22 2002-11-01 I.S.D Λυσεις Ολοκληρωμενων Συστηματων Ανωνυμος Εταιρεια Προστασια εναντι της ηλεκτροστατικης εκφορτωσης(εsd)τυπου ελεγχομενου ανορθωτη πυριτιου (scr) με εξαιρετικα χαμηλη ταση σκανδαλι
DE10351014B4 (de) 2003-10-31 2008-06-05 Infineon Technologies Ag Diodenstruktur und integrale Leistungsschaltanordnung mit Low-Leakage-Diode
WO2005078798A2 (fr) * 2004-02-13 2005-08-25 Austriamicrosystems Ag Montage et procede pour proteger un circuit integre a semi-conducteur
DE102004007241A1 (de) * 2004-02-13 2005-09-01 Austriamicrosystems Ag Schaltungsanordnung und Verfahren zum Schutz einer integrierten Halbleiterschaltung
DE102004029008A1 (de) * 2004-06-16 2006-01-05 Austriamicrosystems Ag Schutzanordnung für eine Halbleiterschaltungsanordnung mit einer Thyristorstruktur und Verfahren zu ihrem Betrieb
KR101118709B1 (ko) 2005-02-07 2012-03-12 삼성전자주식회사 정전기 방전 보호 소자
CN101738122B (zh) 2009-12-14 2011-12-21 杭州沈氏换热器有限公司 一种盘管及具有该盘管的换热器

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4131928A (en) * 1977-06-24 1978-12-26 Motorola, Inc. Voltage clamp device for monolithic circuits
US4698655A (en) * 1983-09-23 1987-10-06 Motorola, Inc. Overvoltage and overtemperature protection circuit
US5268588A (en) * 1992-09-30 1993-12-07 Texas Instruments Incorporated Semiconductor structure for electrostatic discharge protection
US5539233A (en) * 1993-07-22 1996-07-23 Texas Instruments Incorporated Controlled low collector breakdown voltage vertical transistor for ESD protection circuits

Also Published As

Publication number Publication date
EP0822596A3 (fr) 2000-01-05
EP0822596A2 (fr) 1998-02-04
KR19980018323A (ko) 1998-06-05
KR100502379B1 (ko) 2005-09-26
JPH1084098A (ja) 1998-03-31
TW401637B (en) 2000-08-11

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