SG93918A1 - Pretreatment process for plasma immersion ion implantation - Google Patents
Pretreatment process for plasma immersion ion implantationInfo
- Publication number
- SG93918A1 SG93918A1 SG200007536A SG200007536A SG93918A1 SG 93918 A1 SG93918 A1 SG 93918A1 SG 200007536 A SG200007536 A SG 200007536A SG 200007536 A SG200007536 A SG 200007536A SG 93918 A1 SG93918 A1 SG 93918A1
- Authority
- SG
- Singapore
- Prior art keywords
- ion implantation
- pretreatment process
- plasma immersion
- immersion ion
- plasma
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32412—Plasma immersion ion implantation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P30/00—Ion implantation into wafers, substrates or parts of devices
- H10P30/20—Ion implantation into wafers, substrates or parts of devices into semiconductor materials, e.g. for doping
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/04—Coating on selected surface areas, e.g. using masks
- C23C14/042—Coating on selected surface areas, e.g. using masks using masks
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/48—Ion implantation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32174—Circuits specially adapted for controlling the RF discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32192—Microwave generated discharge
- H01J37/32311—Circuits specially adapted for controlling the microwave discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32422—Arrangement for selecting ions or species in the plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
- H01J37/32853—Hygiene
- H01J37/32871—Means for trapping or directing unwanted particles
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P30/00—Ion implantation into wafers, substrates or parts of devices
- H10P30/20—Ion implantation into wafers, substrates or parts of devices into semiconductor materials, e.g. for doping
- H10P30/22—Ion implantation into wafers, substrates or parts of devices into semiconductor materials, e.g. for doping using masks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P32/00—Diffusion of dopants within, into or out of wafers, substrates or parts of devices
- H10P32/10—Diffusion of dopants within, into or out of semiconductor bodies or layers
- H10P32/12—Diffusion of dopants within, into or out of semiconductor bodies or layers between a solid phase and a gaseous phase
- H10P32/1204—Diffusion of dopants within, into or out of semiconductor bodies or layers between a solid phase and a gaseous phase from a plasma phase
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Health & Medical Sciences (AREA)
- Physical Vapour Deposition (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/469,661 US6458430B1 (en) | 1999-12-22 | 1999-12-22 | Pretreatment process for plasma immersion ion implantation |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG93918A1 true SG93918A1 (en) | 2003-01-21 |
Family
ID=23864621
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG200007536A SG93918A1 (en) | 1999-12-22 | 2000-12-20 | Pretreatment process for plasma immersion ion implantation |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US6458430B1 (de) |
| EP (1) | EP1111084B1 (de) |
| JP (1) | JP2001267266A (de) |
| KR (1) | KR100559197B1 (de) |
| DE (1) | DE60009246T2 (de) |
| SG (1) | SG93918A1 (de) |
| TW (1) | TWI228543B (de) |
Families Citing this family (68)
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| US20030001108A1 (en) * | 1999-11-05 | 2003-01-02 | Energy Sciences, Inc. | Particle beam processing apparatus and materials treatable using the apparatus |
| US7026635B2 (en) | 1999-11-05 | 2006-04-11 | Energy Sciences | Particle beam processing apparatus and materials treatable using the apparatus |
| US6939434B2 (en) | 2000-08-11 | 2005-09-06 | Applied Materials, Inc. | Externally excited torroidal plasma source with magnetic control of ion distribution |
| US6893907B2 (en) | 2002-06-05 | 2005-05-17 | Applied Materials, Inc. | Fabrication of silicon-on-insulator structure using plasma immersion ion implantation |
| US7223676B2 (en) | 2002-06-05 | 2007-05-29 | Applied Materials, Inc. | Very low temperature CVD process with independently variable conformality, stress and composition of the CVD layer |
| US7294563B2 (en) | 2000-08-10 | 2007-11-13 | Applied Materials, Inc. | Semiconductor on insulator vertical transistor fabrication and doping process |
| US7166524B2 (en) | 2000-08-11 | 2007-01-23 | Applied Materials, Inc. | Method for ion implanting insulator material to reduce dielectric constant |
| US7303982B2 (en) | 2000-08-11 | 2007-12-04 | Applied Materials, Inc. | Plasma immersion ion implantation process using an inductively coupled plasma source having low dissociation and low minimum plasma voltage |
| US7465478B2 (en) | 2000-08-11 | 2008-12-16 | Applied Materials, Inc. | Plasma immersion ion implantation process |
| US7094670B2 (en) | 2000-08-11 | 2006-08-22 | Applied Materials, Inc. | Plasma immersion ion implantation process |
| US7183177B2 (en) | 2000-08-11 | 2007-02-27 | Applied Materials, Inc. | Silicon-on-insulator wafer transfer method using surface activation plasma immersion ion implantation for wafer-to-wafer adhesion enhancement |
| US7137354B2 (en) | 2000-08-11 | 2006-11-21 | Applied Materials, Inc. | Plasma immersion ion implantation apparatus including a plasma source having low dissociation and low minimum plasma voltage |
| US7479456B2 (en) | 2004-08-26 | 2009-01-20 | Applied Materials, Inc. | Gasless high voltage high contact force wafer contact-cooling electrostatic chuck |
| US7037813B2 (en) | 2000-08-11 | 2006-05-02 | Applied Materials, Inc. | Plasma immersion ion implantation process using a capacitively coupled plasma source having low dissociation and low minimum plasma voltage |
| US7094316B1 (en) | 2000-08-11 | 2006-08-22 | Applied Materials, Inc. | Externally excited torroidal plasma source |
| US7430984B2 (en) | 2000-08-11 | 2008-10-07 | Applied Materials, Inc. | Method to drive spatially separate resonant structure with spatially distinct plasma secondaries using a single generator and switching elements |
| US7288491B2 (en) | 2000-08-11 | 2007-10-30 | Applied Materials, Inc. | Plasma immersion ion implantation process |
| US7320734B2 (en) | 2000-08-11 | 2008-01-22 | Applied Materials, Inc. | Plasma immersion ion implantation system including a plasma source having low dissociation and low minimum plasma voltage |
| US20030235659A1 (en) * | 2000-11-30 | 2003-12-25 | Energy Sciences, Inc. | Particle beam processing apparatus |
| US6841342B2 (en) * | 2001-08-08 | 2005-01-11 | Tokyo Electron Limited | Substrate processing apparatus and substrate processing method |
| KR100390918B1 (ko) * | 2001-08-30 | 2003-07-12 | 주식회사 하이닉스반도체 | 반도체 메모리 소자의 제조방법 |
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| JP4627964B2 (ja) * | 2002-10-24 | 2011-02-09 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| WO2004092831A2 (en) * | 2003-04-09 | 2004-10-28 | Rohm And Haas, Electronic Materials, L.L.C. | Photoresists and methods for use thereof |
| US7022611B1 (en) * | 2003-04-28 | 2006-04-04 | Lam Research Corporation | Plasma in-situ treatment of chemically amplified resist |
| US20050019697A1 (en) * | 2003-07-24 | 2005-01-27 | Advanced Ion Beam Technology, Inc. | Method of treating wafers with photoresist to perform metrology analysis using large current e-beam systems |
| US7494905B2 (en) * | 2003-08-21 | 2009-02-24 | Texas Instruments Incorporated | Method for preparing a source material including forming a paste for ion implantation |
| US7291360B2 (en) | 2004-03-26 | 2007-11-06 | Applied Materials, Inc. | Chemical vapor deposition plasma process using plural ion shower grids |
| US7695590B2 (en) | 2004-03-26 | 2010-04-13 | Applied Materials, Inc. | Chemical vapor deposition plasma reactor having plural ion shower grids |
| US7244474B2 (en) | 2004-03-26 | 2007-07-17 | Applied Materials, Inc. | Chemical vapor deposition plasma process using an ion shower grid |
| US20050250346A1 (en) * | 2004-05-06 | 2005-11-10 | Applied Materials, Inc. | Process and apparatus for post deposition treatment of low k dielectric materials |
| US7396746B2 (en) | 2004-05-24 | 2008-07-08 | Varian Semiconductor Equipment Associates, Inc. | Methods for stable and repeatable ion implantation |
| FR2871812B1 (fr) * | 2004-06-16 | 2008-09-05 | Ion Beam Services Sa | Implanteur ionique fonctionnant en mode plasma pulse |
| US7741621B2 (en) * | 2004-07-14 | 2010-06-22 | City University Of Hong Kong | Apparatus and method for focused electric field enhanced plasma-based ion implantation |
| US8058156B2 (en) | 2004-07-20 | 2011-11-15 | Applied Materials, Inc. | Plasma immersion ion implantation reactor having multiple ion shower grids |
| US7767561B2 (en) | 2004-07-20 | 2010-08-03 | Applied Materials, Inc. | Plasma immersion ion implantation reactor having an ion shower grid |
| US7666464B2 (en) | 2004-10-23 | 2010-02-23 | Applied Materials, Inc. | RF measurement feedback control and diagnostics for a plasma immersion ion implantation reactor |
| KR101172561B1 (ko) * | 2004-11-24 | 2012-08-08 | 나노시스, 인크. | 나노와이어 박막을 위한 콘택 도핑 및 어닐링 시스템 및공정 |
| US7423721B2 (en) * | 2004-12-15 | 2008-09-09 | Asml Netherlands B.V. | Lithographic apparatus |
| US7428915B2 (en) | 2005-04-26 | 2008-09-30 | Applied Materials, Inc. | O-ringless tandem throttle valve for a plasma reactor chamber |
| US20060251827A1 (en) * | 2005-05-09 | 2006-11-09 | Applied Materials, Inc. | Tandem uv chamber for curing dielectric materials |
| US20060249175A1 (en) * | 2005-05-09 | 2006-11-09 | Applied Materials, Inc. | High efficiency UV curing system |
| US7109098B1 (en) | 2005-05-17 | 2006-09-19 | Applied Materials, Inc. | Semiconductor junction formation process including low temperature plasma deposition of an optical absorption layer and high speed optical annealing |
| US7312162B2 (en) | 2005-05-17 | 2007-12-25 | Applied Materials, Inc. | Low temperature plasma deposition process for carbon layer deposition |
| US7422775B2 (en) | 2005-05-17 | 2008-09-09 | Applied Materials, Inc. | Process for low temperature plasma deposition of an optical absorption layer and high speed optical annealing |
| US7312148B2 (en) | 2005-08-08 | 2007-12-25 | Applied Materials, Inc. | Copper barrier reflow process employing high speed optical annealing |
| US7323401B2 (en) | 2005-08-08 | 2008-01-29 | Applied Materials, Inc. | Semiconductor substrate process using a low temperature deposited carbon-containing hard mask |
| US7429532B2 (en) | 2005-08-08 | 2008-09-30 | Applied Materials, Inc. | Semiconductor substrate process using an optically writable carbon-containing mask |
| US7335611B2 (en) | 2005-08-08 | 2008-02-26 | Applied Materials, Inc. | Copper conductor annealing process employing high speed optical annealing with a low temperature-deposited optical absorber layer |
| DE102006009822B4 (de) | 2006-03-01 | 2013-04-18 | Schott Ag | Verfahren zur Plasmabehandlung von Glasoberflächen, dessen Verwendung sowie Glassubstrat und dessen Verwendung |
| US7786024B2 (en) * | 2006-11-29 | 2010-08-31 | Nanosys, Inc. | Selective processing of semiconductor nanowires by polarized visible radiation |
| US8749053B2 (en) | 2009-06-23 | 2014-06-10 | Intevac, Inc. | Plasma grid implant system for use in solar cell fabrications |
| KR20120137361A (ko) * | 2010-02-09 | 2012-12-20 | 인테벡, 인코포레이티드 | 태양 전지 제조용의 조정가능한 섀도우 마스크 어셈블리 |
| CN102376519B (zh) * | 2010-08-17 | 2013-12-25 | 中国科学院微电子研究所 | 一种离子注入剂量检测控制方法 |
| CN102376520B (zh) * | 2010-08-17 | 2013-12-25 | 中国科学院微电子研究所 | 等离子体浸没注入机的注入离子剂量检测控制装置 |
| US20130045591A1 (en) * | 2011-08-15 | 2013-02-21 | Texas Instruments Incorporated | Negative tone develop process with photoresist doping |
| SG10201508582WA (en) | 2011-11-08 | 2015-11-27 | Intevac Inc | Substrate processing system and method |
| KR101982903B1 (ko) * | 2012-02-14 | 2019-05-27 | 엔테그리스, 아이엔씨. | 주입 용품에서 인 축적을 최소화하기 위한 대체 물질 및 혼합물 |
| WO2014100506A1 (en) | 2012-12-19 | 2014-06-26 | Intevac, Inc. | Grid for plasma ion implant |
| EP2819162B1 (de) * | 2013-06-24 | 2020-06-17 | IMEC vzw | Verfahren zur Herstellung von Kontaktbereichen auf einem Halbleitersubstrat |
| US9754791B2 (en) * | 2015-02-07 | 2017-09-05 | Applied Materials, Inc. | Selective deposition utilizing masks and directional plasma treatment |
| US10553411B2 (en) | 2015-09-10 | 2020-02-04 | Taiwan Semiconductor Manufacturing Co., Ltd. | Ion collector for use in plasma systems |
| US10799587B2 (en) * | 2016-05-11 | 2020-10-13 | Huan NIU | Ion implantation of neutron capture elements into nanodiamond particles to form composition for neutron capture therapy usage |
| US11174683B2 (en) | 2019-02-25 | 2021-11-16 | Century Products, Inc. | Tapered joint for securing cone arm in hole opener |
| CN110690097B (zh) * | 2019-09-26 | 2022-06-24 | 深圳市金奥兰科技有限公司 | 一种等离子刻蚀机用尘埃消除装置 |
| CN110961128A (zh) * | 2019-10-24 | 2020-04-07 | 武汉大学苏州研究院 | 金属-碳氮复合电催化材料及其制备方法 |
| CN114730131B (zh) | 2019-11-14 | 2025-10-28 | 默克专利股份有限公司 | 含碱可溶的丙烯酸类树脂的重氮萘醌(dnq)型光刻胶组合物 |
| CN116092926A (zh) * | 2023-01-31 | 2023-05-09 | 上海华虹宏力半导体制造有限公司 | 一种离子注入方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5965034A (en) * | 1995-12-04 | 1999-10-12 | Mc Electronics Co., Ltd. | High frequency plasma process wherein the plasma is executed by an inductive structure in which the phase and anti-phase portion of the capacitive currents between the inductive structure and the plasma are balanced |
| WO2001015200A1 (en) * | 1999-08-06 | 2001-03-01 | Axcelis Technologies, Inc. | Implanting system and method |
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| US3908183A (en) * | 1973-03-14 | 1975-09-23 | California Linear Circuits Inc | Combined ion implantation and kinetic transport deposition process |
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| US4096315A (en) * | 1976-12-15 | 1978-06-20 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Process for producing a well-adhered durable optical coating on an optical plastic substrate |
| JPS55134929A (en) * | 1979-04-06 | 1980-10-21 | Matsushita Electronics Corp | Ion implantation |
| US4239787A (en) * | 1979-06-25 | 1980-12-16 | Bell Telephone Laboratories, Incorporated | Semitransparent and durable photolithography masks |
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-
1999
- 1999-12-22 US US09/469,661 patent/US6458430B1/en not_active Expired - Fee Related
-
2000
- 2000-12-19 EP EP00311393A patent/EP1111084B1/de not_active Expired - Lifetime
- 2000-12-19 DE DE60009246T patent/DE60009246T2/de not_active Expired - Fee Related
- 2000-12-19 TW TW089127171A patent/TWI228543B/zh not_active IP Right Cessation
- 2000-12-20 KR KR1020000079100A patent/KR100559197B1/ko not_active Expired - Fee Related
- 2000-12-20 SG SG200007536A patent/SG93918A1/en unknown
- 2000-12-22 JP JP2000390650A patent/JP2001267266A/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5965034A (en) * | 1995-12-04 | 1999-10-12 | Mc Electronics Co., Ltd. | High frequency plasma process wherein the plasma is executed by an inductive structure in which the phase and anti-phase portion of the capacitive currents between the inductive structure and the plasma are balanced |
| WO2001015200A1 (en) * | 1999-08-06 | 2001-03-01 | Axcelis Technologies, Inc. | Implanting system and method |
Non-Patent Citations (1)
| Title |
|---|
| REASS W: "OPTIMAL PULSE-MODULATOR DESIGN CRITERIA FOR PLASMA SOURCE ION IMPLANTERS" DIGEST OF TECHNICAL PAPERS OF THE INTERNATIONAL PULSED POWER CONFERENCE,US,NEW YORK, IEEE, vol. CONF. 9, 21 June 1993 (1993-06-21), pages 452-455, XP000531140 ISBN: 0-7803-1416-6 * |
Also Published As
| Publication number | Publication date |
|---|---|
| EP1111084B1 (de) | 2004-03-24 |
| KR20010062546A (ko) | 2001-07-07 |
| JP2001267266A (ja) | 2001-09-28 |
| US6458430B1 (en) | 2002-10-01 |
| DE60009246D1 (de) | 2004-04-29 |
| KR100559197B1 (ko) | 2006-03-10 |
| TWI228543B (en) | 2005-03-01 |
| EP1111084A1 (de) | 2001-06-27 |
| DE60009246T2 (de) | 2005-02-24 |
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