TR201820176T4 - Yüzey kusurlarının tespit edilmesine yönelik bir denetleme sisteminin kontrol edilmesine yönelik cihaz ve yöntem. - Google Patents

Yüzey kusurlarının tespit edilmesine yönelik bir denetleme sisteminin kontrol edilmesine yönelik cihaz ve yöntem. Download PDF

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Publication number
TR201820176T4
TR201820176T4 TR2018/20176T TR201820176T TR201820176T4 TR 201820176 T4 TR201820176 T4 TR 201820176T4 TR 2018/20176 T TR2018/20176 T TR 2018/20176T TR 201820176 T TR201820176 T TR 201820176T TR 201820176 T4 TR201820176 T4 TR 201820176T4
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Turkey
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digitized
product
processing device
image processing
checking
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TR2018/20176T
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English (en)
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Henkemeyer Harald
Missmahl Wolf
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Thyssenkrupp Steel Europe Ag
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Publication of TR201820176T4 publication Critical patent/TR201820176T4/tr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/217—Validation; Performance evaluation; Active pattern learning techniques
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/24—Classification techniques
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/77—Processing image or video features in feature spaces; using data integration or data reduction, e.g. principal component analysis [PCA] or independent component analysis [ICA] or self-organising maps [SOM]; Blind source separation
    • G06V10/776—Validation; Performance evaluation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918—Metal
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30136—Metal

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
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  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
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  • Data Mining & Analysis (AREA)
  • Evolutionary Computation (AREA)
  • Artificial Intelligence (AREA)
  • Textile Engineering (AREA)
  • Quality & Reliability (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • General Engineering & Computer Science (AREA)
  • Evolutionary Biology (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Software Systems (AREA)
  • Multimedia (AREA)
  • Databases & Information Systems (AREA)
  • Medical Informatics (AREA)
  • Computing Systems (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)

Abstract

Bir ürünün, özellikle yassı çelik ürünün yüzey kusurlarının tespit edilmesine yönelik bir denetleme siteminin kontrol edilmesine yönelik bir yöntem gösterilir ve açıklanır. Denetlenecek olan yüzeye sahip ürünün üretim sürecini önemli ölçüde etkilemeden oldukça yüksek derecede kalite kontrolü elde edebilmek için, bu tür bir yöntem ön görülür, burada en az bir kamera, tercihen dijital kamera, en az bir ürünün en az bir yüzeyinin kaydedilmesine yönelik üretilir, burada kayıt dijital olarak bir görüntü işleme cihazına iletilir, burada bir yüzey kusurunun en az bir dijitalleştirilmiş görseli dijitalleştirilmiş kayıtlara entegre edilir, burada görüntü işleme cihazı yüzey kusurunun dijitalleştirilmiş görselini içeren dijitalleştirilmiş kayıtlar referans alınarak bir kusur tespiti gerçekleştirir ve burada görüntü işleme cihazının, bir yüzey kusurunun dijitalleştirilmiş görselini denetlenen yüzey kusuru olarak tespit edip etmediği belirlenir.
TR2018/20176T 2013-09-10 2014-08-28 Yüzey kusurlarının tespit edilmesine yönelik bir denetleme sisteminin kontrol edilmesine yönelik cihaz ve yöntem. TR201820176T4 (tr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102013109915.7A DE102013109915B4 (de) 2013-09-10 2013-09-10 Verfahren und Vorrichtung zur Überprüfung eines Inspektionssystems zur Erkennung von Oberflächendefekten

Publications (1)

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TR201820176T4 true TR201820176T4 (tr) 2019-01-21

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TR2018/20176T TR201820176T4 (tr) 2013-09-10 2014-08-28 Yüzey kusurlarının tespit edilmesine yönelik bir denetleme sisteminin kontrol edilmesine yönelik cihaz ve yöntem.

Country Status (9)

Country Link
US (1) US20160203593A1 (tr)
EP (1) EP3044571B1 (tr)
JP (1) JP6560220B2 (tr)
KR (1) KR20160054543A (tr)
CN (1) CN105531581B (tr)
DE (1) DE102013109915B4 (tr)
RU (1) RU2665806C2 (tr)
TR (1) TR201820176T4 (tr)
WO (1) WO2015036261A1 (tr)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102016224307A1 (de) * 2015-12-15 2017-06-22 Heidelberger Druckmaschinen Ag Verfahren zur Überprüfung eines Bildinspektionssystems
JP6333871B2 (ja) * 2016-02-25 2018-05-30 ファナック株式会社 入力画像から検出した対象物を表示する画像処理装置
WO2017198348A1 (en) * 2016-05-17 2017-11-23 Abb Schweiz Ag Real-time, full web image processing method and system for web manufacturing supervision
US10031087B2 (en) 2016-09-22 2018-07-24 SSAB Enterprises, LLC Methods and systems for the quantitative measurement of internal defects in as-cast steel products
DE102017006566B3 (de) 2017-07-12 2018-10-31 Inlevel Gmbh Vorrichtung und Verfahren zur optischen Überwachung von Oberflächen eines Körpers
EP3668077B1 (en) * 2017-08-09 2023-08-02 FUJIFILM Corporation Image processing system, server device, image processing method, and image processing program
DE102017008383A1 (de) * 2017-09-07 2019-03-07 Heuft Systemtechnik Gmbh Inspektionsvorrichtung mit optischem Wasserzeichen
CN109685756A (zh) * 2017-10-16 2019-04-26 乐达创意科技有限公司 影像特征自动辨识装置、系统及方法
CN108445008A (zh) * 2018-02-27 2018-08-24 首钢京唐钢铁联合有限责任公司 一种带钢表面缺陷的检测方法
CN109692877B (zh) * 2018-12-29 2020-11-10 中冶南方工程技术有限公司 一种冷轧带钢表面质量管理系统及方法
CN109765245B (zh) * 2019-02-25 2021-08-13 武汉精立电子技术有限公司 大尺寸显示屏缺陷检测定位方法
DE102019204346A1 (de) * 2019-03-28 2020-10-01 Volkswagen Aktiengesellschaft Verfahren und System zum Überprüfen einer optischen Beanstandung an einem Kraftfahrzeug
CN110116138B (zh) * 2019-06-13 2020-04-07 沈阳建筑大学 一种轧制过程中热态钢板长度及侧弯测量方法
CN110220730A (zh) * 2019-06-27 2019-09-10 宜兴硅谷电子科技有限公司 一种应用于字符喷印机的质量异常检出方法
EP3767403B1 (de) * 2019-07-16 2022-09-07 Carl Zeiss Industrielle Messtechnik GmbH Machine-learning gestützte form- und oberflächenmessung zur produktionsüberwachung
CN111629205B (zh) * 2020-07-28 2020-11-20 天津美腾科技股份有限公司 一种应用于工业相机模拟测试的系统和方法
JP7501264B2 (ja) * 2020-09-15 2024-06-18 株式会社アイシン 異常検出装置、異常検出プログラム、および異常検出システム
DE102020129040A1 (de) 2020-11-04 2022-05-05 Speira Gmbh Verfahren und Vorrichtung zur Erkennung von Oberflächenstrukturen
CN113032919B (zh) 2021-03-12 2022-03-04 奥特斯科技(重庆)有限公司 部件承载件制造方法、处理系统、计算机程序和系统架构
CN113281341A (zh) * 2021-04-19 2021-08-20 唐山学院 热镀锌带钢的双传感器表面质量检测系统的检测优化方法
DE102021116868B4 (de) 2021-06-30 2023-06-29 Deutsches Zentrum für Luft- und Raumfahrt e.V. Verfahren und Vorrichtung zum Bestimmen der Sensorgüte eines bildgebenden Sensorsystems sowie Verfahren und Vorrichtung zum Erkennen von Fehlstellen
CN114565314B (zh) * 2022-03-09 2024-06-18 武汉科技大学 一种基于数字孪生的热轧钢卷端面质量管控系统及方法
CN114935576A (zh) * 2022-06-14 2022-08-23 广汽本田汽车有限公司 工件视觉检测设备的准确性验证方法、装置、设备及介质

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3712513A1 (de) * 1987-04-13 1988-11-03 Roth Electric Gmbh Verfahren und vorrichtung zur erkennung von oberflaechenfehlern
JPH07261372A (ja) * 1994-03-18 1995-10-13 Fujitsu Ltd パターン検証方法および検証装置
JPH08136471A (ja) * 1994-11-11 1996-05-31 Nkk Corp 表面欠陥計の自己診断装置
EP0880023A1 (de) * 1997-05-23 1998-11-25 Siemag Transplan Gmbh Verfahren und Vorrichtung zur automatischen Detektion von Oberflächenfehlern beim kontinuierlichen mechanischem Abtragen von Material von Stranggiessprodukten
JPH1114553A (ja) * 1997-06-23 1999-01-22 Omron Corp 視覚欠陥検査装置における欠陥サンプルデータ出力方法および装置
DE10031978A1 (de) * 2000-06-30 2002-01-10 Sms Demag Ag Verfahren und Vorrichtung zur automatischen Zundererkennung aus Oberflächen von metallischem Bandgut, insbesondere von warmgewalztem Stahlband und Edelstahlband
DE10065321A1 (de) * 2000-12-30 2002-07-11 Krones Ag Inspektionsvorrichtung und -verfahren
US7043071B2 (en) * 2002-09-13 2006-05-09 Synopsys, Inc. Soft defect printability simulation and analysis for masks
US7333650B2 (en) * 2003-05-29 2008-02-19 Nidek Co., Ltd. Defect inspection apparatus
CN100371939C (zh) * 2003-08-27 2008-02-27 上海宏力半导体制造有限公司 在缺陷管理系统中使用的方法
WO2005038445A1 (ja) * 2003-10-21 2005-04-28 Daihatsu Motor Co., Ltd. 表面欠陥検査方法及び装置
JP2006220644A (ja) * 2005-01-14 2006-08-24 Hitachi High-Technologies Corp パターン検査方法及びその装置
US7848561B2 (en) * 2005-12-30 2010-12-07 Honeywell International Inc. Determining capability of an on-line sensor
EP1901230A1 (de) * 2006-09-13 2008-03-19 Thyssenkrupp Nirosta GmbH Verfahren zur automatischen Oberflächeninspektion eines bewegten Körpers
JP4982213B2 (ja) * 2007-03-12 2012-07-25 株式会社日立ハイテクノロジーズ 欠陥検査装置及び欠陥検査方法
JP5156452B2 (ja) * 2008-03-27 2013-03-06 東京エレクトロン株式会社 欠陥分類方法、プログラム、コンピュータ記憶媒体及び欠陥分類装置
JP5255953B2 (ja) * 2008-08-28 2013-08-07 株式会社日立ハイテクノロジーズ 欠陥検査方法及び装置
US8175373B2 (en) * 2009-02-16 2012-05-08 Kla-Tencor Corporation Use of design information and defect image information in defect classification
US8406919B1 (en) * 2010-03-12 2013-03-26 Key Technology, Inc. Quality regulating apparatus and method
DE102010043632B4 (de) * 2010-11-09 2017-08-24 Krones Aktiengesellschaft Verfahren zur Funktionskontrolle einer Inspektionsvorrichtung und Vorrichtung zur Inspektion eines Produktsstroms
CN102628814B (zh) * 2012-02-28 2013-12-18 西南交通大学 一种基于数字图像处理的钢轨光带异常自动检测方法
US9858658B2 (en) * 2012-04-19 2018-01-02 Applied Materials Israel Ltd Defect classification using CAD-based context attributes

Also Published As

Publication number Publication date
CN105531581B (zh) 2019-07-12
DE102013109915A1 (de) 2015-03-12
JP2016532121A (ja) 2016-10-13
RU2016113558A (ru) 2017-10-16
JP6560220B2 (ja) 2019-08-14
US20160203593A1 (en) 2016-07-14
WO2015036261A1 (de) 2015-03-19
RU2665806C2 (ru) 2018-09-04
KR20160054543A (ko) 2016-05-16
RU2016113558A3 (tr) 2018-05-30
DE102013109915B4 (de) 2015-04-02
EP3044571B1 (de) 2018-10-10
CN105531581A (zh) 2016-04-27
EP3044571A1 (de) 2016-07-20

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