TW200616331A - Voltage tolerant structure for I/O cells - Google Patents

Voltage tolerant structure for I/O cells

Info

Publication number
TW200616331A
TW200616331A TW094132386A TW94132386A TW200616331A TW 200616331 A TW200616331 A TW 200616331A TW 094132386 A TW094132386 A TW 094132386A TW 94132386 A TW94132386 A TW 94132386A TW 200616331 A TW200616331 A TW 200616331A
Authority
TW
Taiwan
Prior art keywords
transistor
pmos pull
input
coupled
voltage
Prior art date
Application number
TW094132386A
Other languages
English (en)
Inventor
Vincent Gosmain
David Bernard
Original Assignee
Atmel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atmel Corp filed Critical Atmel Corp
Publication of TW200616331A publication Critical patent/TW200616331A/zh

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003—Modifications for increasing the reliability for protection
    • H03K19/00315—Modifications for increasing the reliability for protection in field-effect transistor circuits

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Logic Circuits (AREA)
TW094132386A 2004-09-28 2005-09-20 Voltage tolerant structure for I/O cells TW200616331A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0410264A FR2875950B1 (fr) 2004-09-28 2004-09-28 Structure tolerante a la tension pour des cellules d'entree/ sortie
US11/028,934 US7180331B2 (en) 2004-09-28 2005-01-03 Voltage tolerant structure for I/O cells

Publications (1)

Publication Number Publication Date
TW200616331A true TW200616331A (en) 2006-05-16

Family

ID=34950107

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094132386A TW200616331A (en) 2004-09-28 2005-09-20 Voltage tolerant structure for I/O cells

Country Status (3)

Country Link
US (1) US7180331B2 (zh)
FR (1) FR2875950B1 (zh)
TW (1) TW200616331A (zh)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7742265B2 (en) * 2005-06-06 2010-06-22 Standard Microsystems Corporation High voltage power supply clamp circuitry for electrostatic discharge (ESD) protection
US7907003B2 (en) * 2009-01-14 2011-03-15 Standard Microsystems Corporation Method for improving power-supply rejection
GB2469636B8 (en) * 2009-04-20 2017-08-02 Advanced Risc Mach Ltd Protecting lower voltage domain devices during operation in a higher voltage domain
US8902554B1 (en) * 2013-06-12 2014-12-02 Cypress Semiconductor Corporation Over-voltage tolerant circuit and method
US9484911B2 (en) 2015-02-25 2016-11-01 Qualcomm Incorporated Output driver with back-powering prevention
US10090838B2 (en) * 2015-09-30 2018-10-02 Silicon Laboratories Inc. Over voltage tolerant circuit
CN107147388B (zh) * 2017-04-21 2020-10-16 北京时代民芯科技有限公司 一种低潜通cmos三态输出电路
TWI685196B (zh) * 2019-01-24 2020-02-11 瑞昱半導體股份有限公司 切換裝置與漏電控制方法
US11575259B2 (en) * 2021-07-08 2023-02-07 Qualcomm Incorporated Interface circuit with robust electrostatic discharge
US12087774B2 (en) * 2021-09-29 2024-09-10 Texas Instruments Incorporated Reducing back powering in I/O circuits
US12126333B1 (en) * 2023-03-31 2024-10-22 Winbond Electronics Corp. Electrical circuit for switching bias voltage of bonding pad and electronic device having the electrical circuit

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0766710A (ja) * 1993-08-26 1995-03-10 Hitachi Ltd 入出力バッファ回路
US5723987A (en) * 1996-06-06 1998-03-03 Intel Corporation Level shifting output buffer with p channel pulldown transistors which are bypassed
US6194923B1 (en) * 1996-10-08 2001-02-27 Nvidia Corporation Five volt tolerant output driver
US5952848A (en) * 1997-03-14 1999-09-14 Lucent Technologies Inc. High-voltage tolerant input buffer in low-voltage technology
US5926056A (en) * 1998-01-12 1999-07-20 Lucent Technologies Inc. Voltage tolerant output buffer
US6150843A (en) * 1998-01-29 2000-11-21 Vlsi Technology, Inc. Five volt tolerant I/O buffer
US6130556A (en) * 1998-06-16 2000-10-10 Lsi Logic Corporation Integrated circuit I/O buffer with 5V well and passive gate voltage
US6144221A (en) 1998-07-02 2000-11-07 Seiko Epson Corporation Voltage tolerant interface circuit
US6388475B1 (en) 1999-12-29 2002-05-14 Intle Corporation Voltage tolerant high drive pull-up driver for an I/O buffer
GB2374475B (en) 2000-12-15 2005-05-11 Micron Technology Inc Input-output buffer circuit and method for avoiding inadvertent conduction of a pull-up transistor
US6714043B1 (en) * 2002-05-16 2004-03-30 Lattice Semiconductor Corporation Output buffer having programmable drive current and output voltage limits

Also Published As

Publication number Publication date
FR2875950B1 (fr) 2008-04-04
US20060066355A1 (en) 2006-03-30
US7180331B2 (en) 2007-02-20
FR2875950A1 (fr) 2006-03-31

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