TW200628811A - Non-linear frequency and phase measurement scheme - Google Patents

Non-linear frequency and phase measurement scheme

Info

Publication number
TW200628811A
TW200628811A TW094135186A TW94135186A TW200628811A TW 200628811 A TW200628811 A TW 200628811A TW 094135186 A TW094135186 A TW 094135186A TW 94135186 A TW94135186 A TW 94135186A TW 200628811 A TW200628811 A TW 200628811A
Authority
TW
Taiwan
Prior art keywords
phase measurement
linear frequency
measurement scheme
frequency
phase
Prior art date
Application number
TW094135186A
Other languages
English (en)
Inventor
Alexaander Lampe
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Publication of TW200628811A publication Critical patent/TW200628811A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
    • G01R23/10—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into a train of pulses, which are then counted, i.e. converting the signal into a square wave
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Frequencies, Analyzing Spectra (AREA)
  • Position Fixing By Use Of Radio Waves (AREA)
  • Measuring Phase Differences (AREA)
TW094135186A 2004-10-11 2005-10-07 Non-linear frequency and phase measurement scheme TW200628811A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP04104975 2004-10-11

Publications (1)

Publication Number Publication Date
TW200628811A true TW200628811A (en) 2006-08-16

Family

ID=35462650

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094135186A TW200628811A (en) 2004-10-11 2005-10-07 Non-linear frequency and phase measurement scheme

Country Status (6)

Country Link
US (1) US7987061B2 (zh)
EP (1) EP1802984A1 (zh)
JP (1) JP2008516253A (zh)
CN (1) CN101040190B (zh)
TW (1) TW200628811A (zh)
WO (1) WO2006040699A1 (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101576586B (zh) * 2008-05-09 2010-12-22 中国科学院半导体研究所 一种基于自适应滤波的相位检测方法
US7881895B2 (en) 2008-05-27 2011-02-01 Sony Ericsson Mobile Communications Ab Methods of calibrating a clock using multiple clock periods with a single counter and related devices and methods
FR2936606B1 (fr) * 2008-10-01 2010-09-10 Schneider Electric Ind Sas Dispositif et procede de mesure de frequence dans un module automate
KR20140040692A (ko) 2011-01-06 2014-04-03 더루우브리졸코오포레이션 초음파 측정
JP5719760B2 (ja) 2011-12-28 2015-05-20 株式会社日立ハイテクノロジーズ 欠陥分類装置
NL2010698C2 (en) * 2013-04-24 2014-10-27 Frapinv S B V Method and system for measuring a frequency of oscillation of a piezoelectric resonator.
CN108957123B (zh) * 2018-08-21 2019-09-17 南京航空航天大学 基于频率—相位斜率映射的微波频率测量方法及装置
US11526193B2 (en) * 2019-03-07 2022-12-13 Skyworks Solutions, Inc. Maintaining the correct time when counter values are transferred between clock domains
CN110361099B (zh) * 2019-07-17 2020-08-25 东北大学 一种谱域低相干光干涉光程差解调方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH590481A5 (zh) * 1975-09-12 1977-08-15 Suisse Horlogerie
DE2921899C2 (de) 1979-05-30 1987-01-22 Nord-Micro Elektronik Feinmechanik AG, 6000 Frankfurt Verfahren zur Frequenzmessung
JPH077024B2 (ja) * 1987-11-05 1995-01-30 古野電気株式会社 周波数差検出装置およびドップラ周波数検出装置
US5107439A (en) * 1990-11-09 1992-04-21 Hewlett-Packard Company Continuous overlapping frequency measurement
US5469466A (en) * 1994-01-18 1995-11-21 Hewlett-Packard Company System for highly repeatable clock parameter recovery from data modulated signals
JP3665512B2 (ja) * 1999-07-12 2005-06-29 株式会社東芝 二値信号の比較装置及びこれを用いたｐｌｌ回路
US6452377B1 (en) * 1999-11-12 2002-09-17 Itt Manufacturing Enterprises, Inc. Phase meter using a permuter and matched filter
JP4558904B2 (ja) * 2000-08-17 2010-10-06 アロカ株式会社 画像処理装置及び記憶媒体
JP3636097B2 (ja) * 2001-06-05 2005-04-06 三菱電機株式会社 無線通信装置及びその受信タイミング推定方法
US6597205B2 (en) 2001-12-21 2003-07-22 Honeywell International Inc. High accuracy method for determining the frequency of a pulse input signal over a wide frequency range
US7130368B1 (en) 2002-09-19 2006-10-31 Nortel Network Limited Clock recovery using a direct smoothing process
US20060155491A1 (en) * 2003-07-11 2006-07-13 Peter Bode Frequency determination

Also Published As

Publication number Publication date
JP2008516253A (ja) 2008-05-15
US20090030629A1 (en) 2009-01-29
WO2006040699A1 (en) 2006-04-20
EP1802984A1 (en) 2007-07-04
CN101040190A (zh) 2007-09-19
US7987061B2 (en) 2011-07-26
CN101040190B (zh) 2012-02-29

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