TW200722732A - Semi-enclosed observation space for electron microscopy - Google Patents

Semi-enclosed observation space for electron microscopy

Info

Publication number
TW200722732A
TW200722732A TW094143727A TW94143727A TW200722732A TW 200722732 A TW200722732 A TW 200722732A TW 094143727 A TW094143727 A TW 094143727A TW 94143727 A TW94143727 A TW 94143727A TW 200722732 A TW200722732 A TW 200722732A
Authority
TW
Taiwan
Prior art keywords
hole
chamber
space
electron microscopy
air pocket
Prior art date
Application number
TW094143727A
Other languages
English (en)
Other versions
TWI296708B (zh
Inventor
Chih-Yu Chao
Wen-Jiunn Hsieh
Original Assignee
Li Bing Huan
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Li Bing Huan filed Critical Li Bing Huan
Priority to TW094143727A priority Critical patent/TW200722732A/zh
Priority to JP2006000103A priority patent/JP4262722B2/ja
Priority to US11/453,810 priority patent/US7388211B2/en
Publication of TW200722732A publication Critical patent/TW200722732A/zh
Application granted granted Critical
Publication of TWI296708B publication Critical patent/TWI296708B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/18—Vacuum control means
    • H01J2237/188—Differential pressure
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2002—Controlling environment of sample
    • H01J2237/2003—Environmental cells
    • H01J2237/2004—Biological samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/262—Non-scanning techniques

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)
TW094143727A 2005-12-09 2005-12-09 Semi-enclosed observation space for electron microscopy TW200722732A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
TW094143727A TW200722732A (en) 2005-12-09 2005-12-09 Semi-enclosed observation space for electron microscopy
JP2006000103A JP4262722B2 (ja) 2005-12-09 2006-01-04 電子顕微鏡の半密閉式観測環境形成装置
US11/453,810 US7388211B2 (en) 2005-12-09 2006-06-16 Semi-closed observational environment for electron microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW094143727A TW200722732A (en) 2005-12-09 2005-12-09 Semi-enclosed observation space for electron microscopy

Publications (2)

Publication Number Publication Date
TW200722732A true TW200722732A (en) 2007-06-16
TWI296708B TWI296708B (zh) 2008-05-11

Family

ID=38192522

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094143727A TW200722732A (en) 2005-12-09 2005-12-09 Semi-enclosed observation space for electron microscopy

Country Status (3)

Country Link
US (1) US7388211B2 (zh)
JP (1) JP4262722B2 (zh)
TW (1) TW200722732A (zh)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI277734B (en) * 2005-10-26 2007-04-01 Li Bing Huan Method for observing living bodies using an electron microscopy
TWI275118B (en) * 2005-12-09 2007-03-01 Li Bing Huan Sample box of electron microscope for observing a general sample/live cell
TWI276139B (en) * 2005-12-09 2007-03-11 Li Bing Huan Closed observation environment for electron microscope
TW200802490A (en) * 2006-06-12 2008-01-01 Contrel Technology Co Ltd Environment for observing liquid/gas and combined with sample room of electron microscope
GB2455121A (en) * 2007-11-29 2009-06-03 Univ Sheffield Hallam Particle beam apparatus with means for reducing contamination in the particle beam column
JP2009152087A (ja) * 2007-12-21 2009-07-09 Jeol Ltd 透過電子顕微鏡
US11786036B2 (en) 2008-06-27 2023-10-17 Ssw Advanced Technologies, Llc Spill containing refrigerator shelf assembly
US8286561B2 (en) 2008-06-27 2012-10-16 Ssw Holding Company, Inc. Spill containing refrigerator shelf assembly
CA2739920C (en) 2008-10-07 2017-12-12 Ross Technology Corporation Spill-resistant surfaces having hydrophobic and oleophobic borders
MX394785B (es) 2009-11-04 2025-03-24 Ssw Advanced Tech Llc Superficies de equipos de coccion que tienen una estructura para la contencion de derrames y metodos de fabricarlas.
DE112012001306B4 (de) * 2011-04-28 2022-03-24 Hitachi High-Tech Corporation Probenhaltevorrichtung, Elektronenmikroskop und Probenhalterung
DE102011085428A1 (de) 2011-10-28 2013-05-02 Schott Ag Einlegeboden
EP2631929A1 (en) * 2012-02-27 2013-08-28 FEI Company A holder assembly for cooperating with an environmental cell and an electron microscope
TWI546841B (zh) 2014-12-10 2016-08-21 財團法人工業技術研究院 具有載台的電子顯微鏡

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6174377B1 (en) * 1997-03-03 2001-01-16 Genus, Inc. Processing chamber for atomic layer deposition processes
US6143079A (en) * 1998-11-19 2000-11-07 Asm America, Inc. Compact process chamber for improved process uniformity
US20020015855A1 (en) * 2000-06-16 2002-02-07 Talex Sajoto System and method for depositing high dielectric constant materials and compatible conductive materials
US6582522B2 (en) * 2000-07-21 2003-06-24 Applied Materials, Inc. Emissivity-change-free pumping plate kit in a single wafer chamber
CN1643179B (zh) * 2002-01-17 2010-05-26 松德沃技术公司 Ald装置和方法
US20040040664A1 (en) * 2002-06-03 2004-03-04 Yang Jang Gyoo Cathode pedestal for a plasma etch reactor
US20040025791A1 (en) * 2002-08-09 2004-02-12 Applied Materials, Inc. Etch chamber with dual frequency biasing sources and a single frequency plasma generating source
US7972467B2 (en) * 2003-04-17 2011-07-05 Applied Materials Inc. Apparatus and method to confine plasma and reduce flow resistance in a plasma reactor
TW200639901A (en) * 2005-05-09 2006-11-16 Li Bing Huan Device for operating gas in vacuum or low-pressure environment and for observation of the operation
TWI274824B (en) * 2005-05-09 2007-03-01 Li Bing Huan Method of operating and viewing of liquid in a vacuum or low pressure environment and an apparatus for the same
KR100661986B1 (ko) * 2005-05-09 2006-12-27 리 빙-환 진공 또는 저압 환경에서의 기체 조작 및 이의 관찰을 위한장치
TWI274823B (en) * 2005-05-09 2007-03-01 Li Bing Huan Method of operating and viewing of high pressure chamber in a vacuum or low pressure environment and the apparatus thereof
US7425712B2 (en) * 2005-09-01 2008-09-16 Contrel Technology Co., Ltd. Method of operating liquid in the vacuum or low-pressure environment and observing the operation and device for the operation and observation
TWI275118B (en) * 2005-12-09 2007-03-01 Li Bing Huan Sample box of electron microscope for observing a general sample/live cell
JP2007163447A (ja) * 2005-12-09 2007-06-28 Lee Bing Huan 電子顕微鏡用の超薄液体制御板
TWI276139B (en) * 2005-12-09 2007-03-11 Li Bing Huan Closed observation environment for electron microscope
TW200802490A (en) * 2006-06-12 2008-01-01 Contrel Technology Co Ltd Environment for observing liquid/gas and combined with sample room of electron microscope

Also Published As

Publication number Publication date
JP2007165269A (ja) 2007-06-28
TWI296708B (zh) 2008-05-11
US20070145288A1 (en) 2007-06-28
US7388211B2 (en) 2008-06-17
JP4262722B2 (ja) 2009-05-13

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees